Embodiments of the present invention disclose a target material thickness measuring apparatus including: a support; and a plurality of distance measuring units mounted on the support and arranged in a first direction, the plurality of distance measuring units being configured to respectively measure thicknesses of portions of a target material at a plurality of positions in the first direction. A plurality of thickness values of different portions of the target material along a straight line can be obtained at one time, for example, by performing a single measurement of thicknesses of the portions of the target material at the plurality of positions by means of the plurality of distance measuring units, thereby improving measurement efficiency.

Embodiments of the present invention disclose a target material thickness measuring apparatus including: a support; and a plurality of distance measuring units mounted on the support and arranged in a first direction, the plurality of distance measuring units being configured to respectively measure thicknesses of portions of a target material at a plurality of positions in the first direction. A plurality of thickness values of different portions of the target material along a straight line can be obtained at one time, for example, by performing a single measurement of thicknesses of the portions of the target material at the plurality of positions by means of the plurality of distance measuring units, thereby improving measurement efficiency.

The pipe contour gauge is a device used to determine a diameter of a pipe or other object. The pipe contour gauge is constructed of a contour base from which a plurality of tines is able to move. Each of the plurality of tines is generally parallel with adjacent ones of the plurality of tines. Moreover, each of the plurality of tines is able to move independent of any remaining ones of the plurality of tines. Each of the plurality of tines is able to move up or down with respect to the contour base. The plurality of tines is adapted to interface with a surface of an object in order to form a profile that is compared with a chart outlining different diameters. The chart that outlines different diameters is used to decipher a size of a pipe or cylindrically-shaped object.

The pipe contour gauge is a device used to determine a diameter of a pipe or other object. The pipe contour gauge is constructed of a contour base from which a plurality of tines is able to move. Each of the plurality of tines is generally parallel with adjacent ones of the plurality of tines. Moreover, each of the plurality of tines is able to move independent of any remaining ones of the plurality of tines. Each of the plurality of tines is able to move up or down with respect to the contour base. The plurality of tines is adapted to interface with a surface of an object in order to form a profile that is compared with a chart outlining different diameters. The chart that outlines different diameters is used to decipher a size of a pipe or cylindrically-shaped object.

A first aspect of the invention provides an apparatus to indicate an amplitude of an uneven measurement surface. The apparatus may include a frame slidingly supporting a set of pins, each pin including a high point stop and a low point stop; a low point isolator member moveable relative to the frame, the low point isolator member indicating a lowest point of the uneven measurement surface by a respective low point stop of a first; a high point isolator member moveable relative to the frame, the high point isolator member indicating a highest point of the uneven measurement surface by a respective high point stop of a second pin; a low point displacement sensor for identifying a low point displacement; a high point displacement sensor for identifying a high point displacement; and a calculator for calculating a difference between the low point displacement and the high point displacement.

A first aspect of the invention provides an apparatus to indicate an amplitude of an uneven measurement surface. The apparatus may include a frame slidingly supporting a set of pins, each pin including a high point stop and a low point stop; a low point isolator member moveable relative to the frame, the low point isolator member indicating a lowest point of the uneven measurement surface by a respective low point stop of a first; a high point isolator member moveable relative to the frame, the high point isolator member indicating a highest point of the uneven measurement surface by a respective high point stop of a second pin; a low point displacement sensor for identifying a low point displacement; a high point displacement sensor for identifying a high point displacement; and a calculator for calculating a difference between the low point displacement and the high point displacement.

A plate flatness measurement device, including a support frame including a center area, the center area including a through-hole in a center of the center area, and a peripheral area surrounding the center area, the peripheral area having a plate with protrusions on a bottom surface of the plate mounted to the peripheral area; and a sensor module in the support frame, the sensor module at least partially protruding above the support frame to contact the protrusions.

A plate flatness measurement device, including a support frame including a center area, the center area including a through-hole in a center of the center area, and a peripheral area surrounding the center area, the peripheral area having a plate with protrusions on a bottom surface of the plate mounted to the peripheral area; and a sensor module in the support frame, the sensor module at least partially protruding above the support frame to contact the protrusions.

A method of capturing haptic content of an object, where the capturing involves a plurality of communication devices includes recognizing haptic content captured by a first communication device and properties associated with the captured haptic content and recognizing properties associated with a second communication device, and determining, at least partly based on the acquired properties, whether or not the second communication device is to participate in the capturing of the haptic content. Haptic content captured by the second communication device is then recognized by the haptic device, and a combination of the haptic content captured by the first communication device with the haptic content captured by the second communication device, can then be initiated. A haptic device and a system, capable of executing the method suggested above are also described.

A machine tool holding workpieces has measuring probes disposed on spindles. The spindles move in common relative to the workpieces until a termination criterion is reached for the common displacement movement. During the common displacement movement, a position of a measuring probe relative to a respective workpiece is detected where the measuring probe makes contact with the respective workpiece or loses contact with the respective workpiece, allowing geometric statements about the respective workpiece to be derived. The measuring probes are kept at a rest position relative to their respective spindle during the common displacement movement, as long as the respective measuring probe does not yet make contact with the respective workpiece. Following contact with the respective workpiece, a deflection from a rest position is detected. The termination criterion is satisfied as soon as the deflection of at least one of the measuring probes reaches a maximum deflection.