G01B7/345

SURFACE TREATMENT PROCESSING METHOD AND SURFACE TREATMENT PROCESSING DEVICE

A first inspection step nondestructively inspects a surface side state of a treatment target to be subjected to shot processing of shooting shot media at the treatment target and evaluates that the treatment target is failed when an inspection result deviates from a first allowable range predetermined. A condition setting step sets a shot processing condition in response to the inspection result of the first inspection step for the treatment target evaluated as not failed in the first inspection step. A shot processing step performs shot processing of shooting shot media at the treatment target evaluated as not failed in the first inspection step in the shot processing condition set in the condition setting step. A second inspection step after the shot processing step nondestructively inspects a surface side state of the treatment target.

SENSOR ROLLER
20190128756 · 2019-05-02 ·

A sensor roller for determining planarity errors and/or for determining the tension of a strip tangentially engaging the roller has a roller body rotatable about an axis, having an outer surface, and formed with a plurality of radially outwardly open recesses axially spaced on the surface. Rigid sensor bodies each in a respective one of the recess each have an outer surface generally flush with the outer surface of the roller body. Each sensor body forms with a side surface of the respective recess a peripheral circumferentially fully extending gap. Respective force-measuring sensors in the recesses are each braced between a respective one of the sensor bodies and the roller body radially inward of the respective sensor body. An annular weld seam of welding compound is formed in each of the gaps

3D FLOATING SUPPORT SYSTEM AND RELATED GEOMETRY-DETECTING MACHINE OF SLENDER ARTICLES
20190120616 · 2019-04-25 · ·

A support system of a slender article in a geometry-detecting machine includes a plurality of vertical constraint points (1) with which the slender article is in contact, wherein the vertical constraint points (1) are coupled in pairs by interconnection arms (4) in turn including a constraint joint (3, 5) provided with a universal joint mechanism which leaves, to the arms (4), two rotational degrees of freedom (32, 34) along two orthogonal axes passing in the proximity of the longitudinal axis of the article, the constraint joints (3, 5) possibly being themselves similarly coupled in pairs until converging, in a multiple-layer sequence, towards a single constraint point.

SHAPE-DETECTING MACHINE FOR SLENDER ARTICLES
20190120615 · 2019-04-25 ·

A geometry-detecting machine for a slender body includes a fixed reference frame (30, 31) provided with at least one pair of constraint points (1) for the slender body and sensor element (28) for the spatial detection of the geometry of the slender body, wherein the constraint points are in the shape of vertical constraints points (1, 3, 5) coupled in pairs by interconnecting element (4, 34) in turn making up vertical constraint points to be coupled in pairs on multiple levels and wherein the interconnection element are pivoting arms, such to allow the slender body to meander freely in order to guarantee for the slender body an attitude as natural as possible.

Verifying end effector flatness using electrical continuity

Methods, kits, systems, and apparatuses, for measuring and/or verifying end effector flatness using electrical continuity are provided.

Fiber waviness detection method and apparatus for conductive composite materials

A pair of electrodes is connected to a test specimen in order to apply an electric current to the test specimen in the direction of a conductive fiber of each conductive fiber woven fabric of a plurality of prepregs as targets for verification of the presence or absence of waviness, among a plurality of prepregs constituting the test specimen composed of a conductive composite material, and then a magnetic field sensor is relatively scanned over the test specimen, while applying an electric current between the pair of electrodes, to determine a portion of the test specimen where a magnetic field variation is detected by the scanning of the magnetic field sensor as a portion where waviness of the conductive fibers of the conductive fiber woven fabric of the plurality of prepregs as targets for verification of the presence or absence of waviness is present. Thus, it is possible to grasp, for example, the condition of fibers of the conductive composite material in the test specimen as a whole.

IMPROVED CONTACTLESS DETECTION OF VIBRATIONS IN METAL BELTS
20240384977 · 2024-11-21 ·

A measuring assembly with a mechanical excitation device that excites the metal belt of a transport device at an excitation frequency (fA) to produce mechanical vibrations. Analog measurement signals (MA) characterizing the amplitude (A) of the excited mechanical vibrations are detected for corresponding regions of the metal belt using sensor elements. The measurement signals (MA) are digitized with digitization devices and the digitized measurement signals or signals derived therefrom are transmitted from the digitization devices to an evaluation device arranged outside of the measuring assembly as transmitted signals (MA). The sensor elements comprise eddy current sensors. The eddy current sensors, which directly adjoin one another when viewed in the width direction are operated using different operating frequencies (f1, f2, f3). When the sensor elements are viewed as a whole, a plurality of sensor elements are operated using the same operating frequency (f1, f2, f3).

VERIFYING END EFFECTOR FLATNESS USING ELECTRICAL CONTINUITY

Methods, kits, systems, and apparatuses, for measuring and/or verifying end effector flatness using electrical continuity are provided.

METHOD FOR MODELING WAFER SHAPE, AND METHOD FOR MANUFACTURING WAFER
20260057163 · 2026-02-26 · ·

A method for modeling a wafer profile by a function is provided in which the function is used for calculating a displacement z in a thickness direction of a wafer and is a sum of plural functions. The first function g(r) has a distance r from the center of the wafer as a variable. The second function Arh(N) indicates multiplying a sine or cosine function h(N), with a first angle with reference to a predetermined position in a circumferential direction of the wafer as a variable and an integer N as a constant, by a coefficient A with the distance r. The third function Bri(M(-)) indicates multiplying a sine or cosine function i(M(-)), with the first angle as a variable, a second angle with reference to the predetermined position as a constant, and an integer M as a constant, by a coefficient B and the distance r.