An optical amplifier includes a laminated body including two electrode layers and an active layer disposed therebetween. The laminated body includes a waveguide which guides light in an in-plane direction of the active layer. The light which is incident on the laminated body is amplified and emitted from an end surface in the in-plane direction through the waveguide. At least one of the two electrode layers has an electrode group including at least two electrodes which are disposed separately from each other in a waveguide direction of the waveguide. An amplification factor of the incident light is changeable in accordance with a wavelength of the incident light by independently supplying current to different regions in the active layer using the at least two electrodes. Accordingly, the ASE light including light having an unrequired wavelength may be reduced while sufficient light output intensity is obtained in a required wavelength.

Various methods, systems and apparatus are provided for imaging and sensing using interferometry. In one example, a system includes an interferometer; a light source that can provide light to the interferometer at multiple wavelengths (.sub.i); and optical path delay (OPD) modifying optics that can enhance contrast in an interferometer output associated with a sample. The light can be directed to the sample by optics of the interferometer. The interferometer output can be captured by a detector (e.g., a camera) at each of the multiple wavelengths (.sub.i). In another example, an apparatus includes an add-on unit containing OPD that can enhance contrast in an interferometer output associated with a sample illuminated by light at a defined wavelength (.sub.i). A detector can be attached to the add-on unit to record the interferometer output at the defined wavelength (.sub.i).

A device for managing light pulses for measuring the reaction of a sample exposed to a first light pulse, the measurement being performed by analysis of a signal emitted by the sample subjected to a second light pulse, shifted with respect to the first pulse by a determined interval of time, the device including two optical detectors for detecting the pulses of two light beams emitted by two pulsed laser sources, respectively, each beam emitting pulses with respective repetition frequencies that are different, arbitrary and stable over a determined period in the direction of the sample; the detectors being connected to a computer for determining the interval of time between two pulses coming from the first and the second beam, respectively, and constituting the first and second pulses; the computer being connected to an analyzer for measuring the reaction of the sample having as input parameter the interval of time between the two pulses, where the computer uses an algorithm making use of the stability of the repetition frequencies for determining the interval of time.

One or more devices, systems, methods and storage mediums for performing optical coherence tomography (OCT) while reducing and/or eliminating crosstalk noise are provided. Examples of such applications include imaging, evaluating and diagnosing biological objects, such as, but not limited to, for Gastro-intestinal, cardio and/or ophthalmic applications, and being obtained via one or more optical instruments, such as, but not limited to, optical probes, catheters, capsules and needles (e.g., a biopsy needle). Preferably, the OCT devices, systems methods and storage mediums include or involve a method, such as, but not limited to, a complex conjugate method or a shift method, for handling the crosstalk noise in a way to mitigate or eliminate the noise from an image field of view. For example, a reference reflection or reference arm may be positioned or re-positioned in the image field of view at different locations depending on the crosstalk noise mitigation method being employed.

A blade tip measurement system includes a case and a blade that rotates within the case, the blade having an outer blade tip surface that has a clearance distance from an inner surface of the case. A light source emits light along an optical path that is directed toward the outer blade tip surface by a lens, and the outer blade tip surface reflects the light back along the optical path. An optical interferometer generates an interference pattern using the reflected light, and a photoreceiver receives the interference pattern. A complex logic device determines the clearance distance of the blade tip surface from the inner surface of the case based on the interference pattern. The interferometer may be a Fabry-Perot optical interferometer formed using a window positioned between the lens and the blade tip surface, or a Michelson interferometer formed using a reference optical path. The system may alternatively include an optical time of flight measurement of the blade tip clearance. The system further may include an abradable substrate having an optical fiber array of optical fibers at different depths, whereby the blade tip clearance is determinable based on which of the optical fibers are abraded as the blade tip rotates.

A blade tip measurement system includes a case and a blade that rotates within the case, the blade having an outer blade tip surface that has a clearance distance from an inner surface of the case. A light source emits light along an optical path that is directed toward the outer blade tip surface by a lens, and the outer blade tip surface reflects the light back along the optical path. An optical interferometer generates an interference pattern using the reflected light, and a photoreceiver receives the interference pattern. A complex logic device determines the clearance distance of the blade tip surface from the inner surface of the case based on the interference pattern. The interferometer may be a Fabry-Perot optical interferometer formed using a window positioned between the lens and the blade tip surface, or a Michelson interferometer formed using a reference optical path. The system may alternatively include an optical time of flight measurement of the blade tip clearance. The system further may include an abradable substrate having an optical fiber array of optical fibers at different depths, whereby the blade tip clearance is determinable based on which of the optical fibers are abraded as the blade tip rotates.

A method for identifying three entangled photons includes generating a set of first, second, and third entangled photons correlated in time and interfering the first and second entangled photons based on a difference between a first optical path from an output of an optical source that generates the first entangled photon to a first optical input to an interferometric beam splitter and a second optical path from an output of the optical source that generates the second entangled photon to a second input of the interferometric beam splitter. A first electrical signal is generated in response to detection of a first photon generated by the interfering of the first and second entangled photons. A second electrical signal is generated in response to detection of a second photon generated by the interfering of the first and second entangled photons. A third electrical signal is generated in response to detection of the third entangled photon. The first photon coincidence is determined from the first, second and their electrical signals, thereby identifying three entangled photons.

A method for identifying three entangled photons includes generating a set of first, second, and third entangled photons correlated in time and interfering the first and second entangled photons based on a difference between a first optical path from an output of an optical source that generates the first entangled photon to a first optical input to an interferometric beam splitter and a second optical path from an output of the optical source that generates the second entangled photon to a second input of the interferometric beam splitter. A first electrical signal is generated in response to detection of a first photon generated by the interfering of the first and second entangled photons. A second electrical signal is generated in response to detection of a second photon generated by the interfering of the first and second entangled photons. A third electrical signal is generated in response to detection of the third entangled photon. The first photon coincidence is determined from the first, second and their electrical signals, thereby identifying three entangled photons.

The present disclosure provides a multi-frequency hybrid heterodyne laser tracker system based on a single light source. According to the laser tracking system proposed in the present disclosure, multi-frequency laser is obtained by conducting multi-acousto-optic frequency shift on a dual-longitudinal-mode laser unit, and an absolute ranging precision gauge is constructed by using a dual-longitudinal-mode interval of a light source. With the frequency shift difference of a multi-acousto-optic frequency shifter, an absolute ranging roughness gauge is constructed, and the relative displacement measurement of dual-frequency light interference is achieved. Meanwhile, by utilizing the reflection of multiple reflectors and light splitting and combining of polarization prisms, synchronous measurement of multi-wavelength absolute distance, relative displacement and PSD position is achieved, resolving the problem that an existing laser tracker uses multiple light sources, which leads to difference in measurement datum, and consequently to the difficultly in traceback.

Systems, methods and apparatuses are used for monitoring material processing using imaging signal density calculated for an imaging beam directed to a workpiece or processing region, for example, during inline coherent imaging (ICI). The imaging signal density may be used, for example, to monitor laser and e-beam welding processes such as full or partial penetration welding. In some examples, the imaging signal density is indicative of weld penetration as a result of reflections from a keyhole floor and/or from a subsurface structure beneath the keyhole. The monitoring may include, for example, automated pass/fail or quality assessment of the welding or material processing or parts produced thereby. The imaging signal density may also be used to control the welding or material processing, for example, using imaging signal density data as feedback. The imaging signal density may be used alone or together with other measurements or metrics, such as distance or depth measurements.