Reference and test waves are directed in a common path mode in a fiber tip diffraction interferometer. A first fiber can be used to generate the reference wave and a second fiber can be used to generate the test wave. Each fiber can include a single mode fiber tip that defines a wedge at an end without a coating on end surface or a tapered fiber tip. The fiber tip diffraction interferometer can include an aplanatic pupil imaging lens or system disposed to receive both the test wave and the reference wave and a sensor configured to receive both the test wave and the reference wave.

A system and a method determines a traveling time for a light pulse between a light pulse source and a pixel of a light sensor array based on a “Find Frequent Items in a Data Steam” technique. In one embodiment, raw timestamp data output from a pixel as a data stream may be temporarily stored, processed twice and then discarded to provide an exact determination of a traveling time estimate. In another embodiment, the raw timestamp data is processed once and discarded to provide an approximate determination of a traveling time estimate. The traveling time estimate may be updated during processing and the most-frequently occurring timestamp is available when processing the data stream is complete. There is no need to keep the raw data in a memory, thereby reducing the memory requirement associated with determining the traveling time of a light pulse.

A height detection apparatus successively changes the brightness of white light from a first level to a second level in accordance with a position of a Z stage and captures an image of interference light while moving a two-beam interference objective lens relative to a paste film in an optical axis direction, detects, as a focus position, a position of the Z stage where the intensity of interference light is highest in a period during which the brightness of white light is set to the first or second level, for each pixel of the captured image, and obtains the height of the paste film based on a detection result.

A method and a device for characterizing the surface shape of an optical element. In the method, in at least one interferogram measurement carried out by an interferometric test arrangement, a test wave reflected at the optical element is caused to be superimposed with a reference wave not reflected at the optical element. In this case, the figure of the optical element is determined on the basis of at least two interferogram measurements using electromagnetic radiation having in each case linear input polarization or in each case circular input polarization, wherein the input polarizations for the two interferogram measurements differ from one another.

The present application relates to an atom interferometry method. The atom interferometry method releases atoms from an atom source into an interferometer region. Pulses of light are then directed at the atoms to place the atoms in different quantum states and to recombine the quantum states such that the recombined quantum states interfere with each other when the quantum states are overlapped spatially. The recombined quantum states creates a spatial fringe pattern with a phase. The spatial fringe pattern and the phase of the spatial fringe pattern are detected when the quantum states are overlapped spatially. The overlapped spatial fringe pattern is then used to measure physical quantities such as local gravity, the gravitational constant, the fine structure constant, the ratio of Planck's constant to the atomic mass, rotation of the atom interferometer, acceleration of the atom interferometer, and the like.

The present application relates to an atom interferometry method. The atom interferometry method releases atoms from an atom source into an interferometer region. Pulses of light are then directed at the atoms to place the atoms in different quantum states and to recombine the quantum states such that the recombined quantum states interfere with each other when the quantum states are overlapped spatially. The recombined quantum states creates a spatial fringe pattern with a phase. The spatial fringe pattern and the phase of the spatial fringe pattern are detected when the quantum states are overlapped spatially. The overlapped spatial fringe pattern is then used to measure physical quantities such as local gravity, the gravitational constant, the fine structure constant, the ratio of Planck's constant to the atomic mass, rotation of the atom interferometer, acceleration of the atom interferometer, and the like.

Various optical systems equipped with diode laser light sources are discussed in the present application. One example system includes a diode laser light source for providing a beam of radiation. The diode laser has a spectral output bandwidth when driven under equilibrium conditions. The system further includes a driver circuit to apply a pulse of drive current to the diode laser. The pulse causes a variation in the output wavelength of the diode laser during the pulse such that the spectral output bandwidth is at least two times larger the spectral output bandwidth under the equilibrium conditions.

A digital measuring device implemented on a photonic integrated circuit, the digital measuring device including a tunable laser source implemented on the photonic integrated circuit configured to sweep over a frequency range to provide multi-wavelength light, a first waveguide structure implemented on the photonic integrated circuit configured to direct a first portion of light from the laser source at a moving object and receive light reflected from the moving object, a second waveguide structure implemented on the photonic integrated circuit configured to combine a second portion of light from the laser source with the light reflected from the moving object to produce a measurement beam, and a first detector implemented on the photonic integrated circuit configured to detect intensity values of the measurement beam to measure a distance between the digital measuring device and the moving object.

A digital measuring device implemented on a photonic integrated circuit, the digital measuring device including a tunable laser source implemented on the photonic integrated circuit configured to sweep over a frequency range to provide multi-wavelength light, a first waveguide structure implemented on the photonic integrated circuit configured to direct a first portion of light from the laser source at a moving object and receive light reflected from the moving object, a second waveguide structure implemented on the photonic integrated circuit configured to combine a second portion of light from the laser source with the light reflected from the moving object to produce a measurement beam, and a first detector implemented on the photonic integrated circuit configured to detect intensity values of the measurement beam to measure a distance between the digital measuring device and the moving object.

A method of providing optical coherence tomography (OCT) imaging may comprise using an on-chip frequency comb source interfaced with an OCT system by a circulator as an imaging source and reconstructing OCT images from resulting spectral data from target tissue illuminated by the imaging source.