In certain embodiments methods of identifying T cell receptors that respond to specific target cell antigens are provided, where the methods comprise providing a substrate bearing a plurality of target cells (e.g., mammalian cells); contacting the target cells on the substrate with CD8+ T cells; and using label-free optical imaging to identify an increase in mass of a T-cell and/or a decrease in mass of a target cell, where an increase in mass of a T cell and/or a decrease in mass of a target cell is an indicator that said T cell bears a T cell receptor activated by antigens presented on said target cell.

In accordance with the aspects of the present disclosure, a method and apparatus is disclosed for three-dimensional imaging interferometric microscopy (IIM), which can use at least two wavelengths to image a three-dimensional object. The apparatus can include a first, a second, and a third optical system. The first optical system is disposed to provide a substantially coherent illumination to the 3D object, wherein the illumination is characterized by a plurality of wavelengths. The second optical system includes an optical image recording device and one or more additional optical components characterized by a numerical aperture NA. The third optical system provides interferometric reintroduction of a portion of the coherent illumination as a reference beam into the second optical system. An image recording device records each sub-image formed as a result of interference between the illumination that is scattered by the 3D object and the reference beam.

A conversion unit converts a first electrical signal to a first distance value indicating a distance from an interferometer to a measurement target. An inclination value calculation unit calculates an inclination value based on the first distance value. A first distance value correction unit corrects the first distance value based on the inclination value. A second distance value correction unit calculates a second distance value indicating a distance from the optical interference range sensor to the measurement target based on the first distance value that has been corrected by the first distance value correction unit. If the number of times that the first electrical signal is detected is smaller than a second threshold, the first distance value correction unit corrects the first distance value based on an inclination value that precedes the inclination value associated with the first distance value in a storage unit.

A method and a system for determining relative position of an element of an optical system of an assembly for processing or measuring an object along a measurement line, involve generating a measurement beam and a reference beam of low coherence optical radiation. The measurement and reference beams, alternately or in combination, have a main beam and a multiplexed additional beam. The measurement beam, led toward the element of the optical system, and back-reflected, is superimposed on the reference beam in a region of common incidence of an interferometric optical sensor arrangement. Position or frequency of a main interference fringe pattern and an additional interference fringe pattern is detected.

Interferometer system including a first detector for receiving a first measurement beam travelling to a reference surface; a second detector for receiving a second measurement beam travelling to the target surface; a reference variable delay path and/or measurement variable delay path and a delay path controller for adapting a delay length. A reference spectral coherence pulse occurs at the first detector, at a reference coherence arrangement and a measurement spectral coherence pulse at the second detector at a measurement coherence arrangement. A control unit receives a reference coherence signal from the first detector, and a measurement coherence signal from the second detector, and determines a zero-position of the target surface based on the reference coherence signal and the measurement coherence signal, and based on the reference coherence arrangement and the measurement coherence arrangement and/or a delay path difference between the reference coherence arrangement and the measurement coherence arrangement.

A line-field swept-source optical coherence tomography (OCT) system features a cat's-eye tunable laser that is free-space coupled to an interferometer. The laser employs a single angled facet (SAF) edge-emitting gain chip producing a beam with multiple spatial modes. By preserving these higher-order modes through free-space couplingavoiding single-mode fiberthe system generates a line with a more uniform, top-hat intensity profile when projected onto a sample, such as a patient's retina. This profile mitigates the Gaussian power roll-off typically associated with single spatial mode beams, ensuring adequate signal-to-noise ratio across the line while adhering to optical safety limits. The laser cavity includes a thin-film interference bandpass filter mounted on an angle control actuator, allowing for wavelength sweeping by tilt-tuning the filter. The system integrates a line-scan sensor and is designed for manufacturability, offering improved imaging quality for ophthalmic diagnostics and other applications requiring high-resolution, cross-sectional imaging.

A line-field swept-source optical coherence tomography (OCT) system features a cat's-eye tunable laser that is free-space coupled to an interferometer. The laser employs a single angled facet (SAF) edge-emitting gain chip producing a beam with multiple spatial modes. By preserving these higher-order modes through free-space couplingavoiding single-mode fiberthe system generates a line with a more uniform, top-hat intensity profile when projected onto a sample, such as a patient's retina. This profile mitigates the Gaussian power roll-off typically associated with single spatial mode beams, ensuring adequate signal-to-noise ratio across the line while adhering to optical safety limits. The laser cavity includes a thin-film interference bandpass filter mounted on an angle control actuator, allowing for wavelength sweeping by tilt-tuning the filter. The system integrates a line-scan sensor and is designed for manufacturability, offering improved imaging quality for ophthalmic diagnostics and other applications requiring high-resolution, cross-sectional imaging.

Provided are a detection system, compensation method and computer-readable recording medium applicable to semiconductor surface morphology to provide feature information corresponding to spectral signals to a neural network model and provide feature information corresponding to spectral signals, a detected height, and an actual height actually measured to another neural network model. The combinational neural network models thus trained and built can generate a compensation value for a to-correct height corresponding to a to-correct spectral signal having variability. The compensation value provides required compensation for height information to not only enhance the precision of the detection of semiconductor surface morphology but also enhance the reliability of the detection system.

A measurement device includes: a first movable body including a reflector; a second movable body including a light emission point, a light entry point, and an optical system; a driving mechanism that adjusts a position of the second movable body; a controller that controls the driving mechanism; and at least one optical fiber. Light emitted from the light emission point is emitted onto the reflector via the optical system, and reflected light that is the light reflected from the reflector enters the light entry point. The controller causes the driving mechanism to adjust the position of the second movable body, based on an intensity of the reflected light that has entered the light entry point. The light emission point or the light entry point is an end of the at least one optical fiber.

A non-contact optical metrology system to measure simultaneously the relative piston and the relative inclination in two axes between two low curvature reflective surfaces using partially coherent light interferometry. The system creates an interference pattern with partially coherent light from the linear phase change induced by a double prism system or equivalent, which allows the measurement of the relative piston and the inclination in two axes between the reflective surfaces. The relative piston between the mirrors is measured from the position of the interference pattern, the relative inclination in one axis from the distance between the fringes, and the relative inclination in the other axis from the inclination of the fringes. Relative piston measurements and relative inclination measurements in two axes are decoupled and can be extracted with simple morphological operations, without the need for marginal processing algorithms.