G01B9/02015

Physical unclonable function from an integrated photonic interferometer

Systems and methods of producing unclonable devices are disclosed. Robust optical physical unclonable function devices use disordered photonic integrated circuits. Optical physical unclonable functions based on speckle patterns, chaos, or strong disorder are so far notoriously sensitive to probing and/or environmental variations. A presently disclosed optical physical unclonable function is designed for robustness against fluctuations in optical angular/spatial alignment, polarization, and temperature using an integrated quasicrystal interferometer which sensitively probes disorder. All modes are engineered to exhibit approximately the same confinement factor in the predominant thermo-optic medium (e.g., silicon) and for constraining the transverse spatial-mode and polarization degrees of freedom. Silicon photonic quasicrystal interferometry is used for secure hardware applications.

Physical unclonable function from an integrated photonic interferometer

Systems and methods of producing unclonable devices are disclosed. Robust optical physical unclonable function devices use disordered photonic integrated circuits. Optical physical unclonable functions based on speckle patterns, chaos, or strong disorder are so far notoriously sensitive to probing and/or environmental variations. A presently disclosed optical physical unclonable function is designed for robustness against fluctuations in optical angular/spatial alignment, polarization, and temperature using an integrated quasicrystal interferometer which sensitively probes disorder. All modes are engineered to exhibit approximately the same confinement factor in the predominant thermo-optic medium (e.g., silicon) and for constraining the transverse spatial-mode and polarization degrees of freedom. Silicon photonic quasicrystal interferometry is used for secure hardware applications.

Three-dimensional measurement device

A three-dimensional measurement device includes: an optical system including an optical device that splits an incident light, irradiates a measurement object with a measurement light, irradiates a reference plane with a reference light, and combines at least part of the reflected measurement light with at least part of the reflected reference light to emit a combined light; a first light emitter that emits a first light that has a first wavelength; a second light emitter that emits a second light that has a second wavelength; a first imaging device that takes an image of an output light output from the optical device in which the first light enters; a second imaging device that takes an image of an output light output from the optical device in which the second light enters; and a control device that executes three-dimensional measurement of the measurement object.

Three-dimensional measurement device

A three-dimensional measurement device includes: an optical system including an optical device that splits an incident light, irradiates a measurement object with a measurement light, irradiates a reference plane with a reference light, and combines at least part of the reflected measurement light with at least part of the reflected reference light to emit a combined light; a first light emitter that emits a first light that has a first wavelength; a second light emitter that emits a second light that has a second wavelength; a first imaging device that takes an image of an output light output from the optical device in which the first light enters; a second imaging device that takes an image of an output light output from the optical device in which the second light enters; and a control device that executes three-dimensional measurement of the measurement object.

DUAL-MODE OPTICAL COHERENCE TOMOGRAPHY AND OPTICAL COHERENCE MICROSCOPY IMAGING SYSTEMS AND METHODS
20250237857 · 2025-07-24 ·

A low-coherence interferometry imaging system for imaging translucent samples, wherein the system includes an optical coherence microscopy (OCM) mode and an optical coherence tomography (OCT) mode, and wherein the system can selectively employ either mode without requiring re-positioning of a sample under test. The system provides for the selective disposition of the OCM mode or the OCT mode in an optical path intermediate a scanning system and an imaging objective.

CONTROL METHOD AND SYSTEM OF LITHIUM NIOBATE BASED MACH-ZEHNDER INTERFEROMETER MODULATOR
20250244632 · 2025-07-31 ·

A control method and a control system of a lithium niobate based Mach-Zehnder interferometer modulator are disclosed. The system includes a laser, a Mach-Zehnder interferometer, a photoelectric detection module and an analog circuit bias control module. The method includes: converting, by the photoelectric detection module, two optical signals into two photocurrent signals after obtaining the two optical signals generated by the Mach-Zehnder interferometer; comparing the two photocurrent signals by a judgement unit to obtain a comparison voltage; in response to the comparison voltage being zero, keeping a bias voltage constant by a bias control unit; and in response to the comparison voltage not being zero, adjusting the bias voltage by a bias control unit according to the comparison voltage until the comparison voltage is zero.

Sine-cosine optical frequency detection devices for photonics integrated circuits and applications in lidar and other distributed optical sensing
12372628 · 2025-07-29 ·

The disclosed technology can be implemented in photonics integrated circuit (PIC) to provide an optical frequency detection device for measuring an optical frequency of light using two Mach-Zehnder interferometer where the delay imbalance in the first interferometer is configured to be one quarter wavelength longer than that of the second interferometer to produce an additional phase difference between the two arms. The two outputs of each interferometer are then detected by two photodetectors to produce two complementary interference signals. The difference between the two complementary interference signals of the first interferometer is a sine function of the optical frequency while the difference between the two complementary interference signals of the second interferometer is proportional to a cosine function of the optical frequency. Using the sine/cosine interpretation algorithm commonly used for the rotation encoders/decoders, any increments in optical frequency can be readily obtained.

Sine-cosine optical frequency detection devices for photonics integrated circuits and applications in lidar and other distributed optical sensing
12372628 · 2025-07-29 ·

The disclosed technology can be implemented in photonics integrated circuit (PIC) to provide an optical frequency detection device for measuring an optical frequency of light using two Mach-Zehnder interferometer where the delay imbalance in the first interferometer is configured to be one quarter wavelength longer than that of the second interferometer to produce an additional phase difference between the two arms. The two outputs of each interferometer are then detected by two photodetectors to produce two complementary interference signals. The difference between the two complementary interference signals of the first interferometer is a sine function of the optical frequency while the difference between the two complementary interference signals of the second interferometer is proportional to a cosine function of the optical frequency. Using the sine/cosine interpretation algorithm commonly used for the rotation encoders/decoders, any increments in optical frequency can be readily obtained.

SELF-MIXING INTERFEROMETRY OPTO-ACOUSTIC TRANSDUCER AND METHOD OF OPERATING A SELF-MIXING INTERFEROMETRY
20250251234 · 2025-08-07 ·

A self-mixing interferometry opto-acoustic transducer comprises a laser configured to perform two-sided emission through a first emission surface and a second emission surface, and to undergo self-mixing interference in a laser cavity of the laser, a diaphragm spaced away from the first emission surface of the laser, a photosensitive element arranged at or spaced away from the second emission surface of the laser, and structures arranged on the first emission surface or on a reflecting surface of the diaphragm facing the first emission surface. A first optical path is formed between the first emission surface and the reflecting surface, the first optical path including the structures, and a second optical path is formed between the first emission surface and the diaphragm, the second optical path including voids between the structures.

LOW COHERENCE INTERFEROMETER IMAGING SYSTEM

A low coherence interferometer imaging system includes an imaging engine generating a reference beam and an object beam, a first beam splitting element, reference ends, a sample end, and optical imaging modules arranged at the sample end. The first beam splitting element is disposed on an optical path of the reference beam and generates sub-reference beams after the reference beam passes through the first beam splitting element. The reflected sub-reference beams and the reflected object beam form interference signals through the imaging engine. The imaging engine generates images after analyzing the interference signals. One optical imaging module is first arranged at the sample end; the remaining optical imaging modules are sequentially arranged at the sample end in an optical-path series manner so that the images exhibit distinct imaging fields of view before and after the optical imaging module is arranged and when arrangement parameters of the imaging engine remain unchanged.