Component errors prevent linear photonic circuits from being scaled to large sizes. These errors can be compensated by programming the components in an order corresponding to nulling operations on a target matrix X through Givens rotations X.fwdarw.T.sup.†X, X.fwdarw.XT.sup.†. Nulling is implemented on hardware through measurements with feedback, in a way that builds up the target matrix even in the presence of hardware errors. This programming works with unknown errors and without internal sources or detectors in the circuit. Modifying the photonic circuit architecture can reduce the effect of errors still further, in some cases even rendering the hardware asymptotically perfect in the large-size limit. These modifications include adding a third directional coupler or crossing after each Mach-Zehnder interferometer in the circuit and a photonic implementation of the generalized FFT fractal. The configured photonic circuit can be used for machine learning, quantum photonics, prototyping, optical switching/multicast networks, microwave photonics, or signal processing.

Described herein are methods, systems, and non-transitory computer-readable media to non-destructively acquire three-dimensional profiles of cellular microbiological samples growing on the surface of a solid growth medium. Acquisitions can be performed by an optical microscope that includes a vertical scanning interferometer. The three-dimensional profiles can enable measurement of sample parameters of microcolonies, which can be made of microbial colony forming units. The methods and systems enable early and rapid detection and quantification of microbes.

A displacement detection device is capable of stably and accurately detecting an amount of displacement. A polarization maintaining fiber has a length not to be equal to a length obtained by dividing, a product of an integral multiple of twice a length of a resonator times a refractive index of the resonator and a beat length obtained from a difference between propagation constants of two polarization modes, by a wavelength of the light source, is selected from a range including a length equal to the above length. The polarization maintaining fiber includes multiple polarization maintaining fibers fitted to each other by removable connectors.

The present disclosure provides an external parameter calibration method for robot sensors as well as an apparatus, robot and storage medium with the same. The method includes: obtaining first sensor data and second sensor data obtained through a first sensor and a second sensor of the robot by collecting position information of a calibration reference object and converting to a same coordinate system to obtain corresponding first converted sensor data and second converted sensor data, thereby determining a first coordinate and a second coordinate of a reference point of the calibration reference object; using the first coordinate and the second coordinate are as a set of coordinate data; repeating the above-mentioned steps to obtain N sets of the coordinate data to calculate the external parameter between the first sensor and the second sensor in response to a relative positional relationship between the robot and the calibration reference object being changed.

A computer program product for numerically correcting an endpoint position of a Coordinate Measuring Machine (CMM) implemented on a computing unit, receiving as input temporally resolved information from a set of sensors attached to or integrated into the CMM, and to a method for numerically correcting an endpoint position of a CMM, wherein errors between a targeted endpoint position and an actual endpoint position reached during a measurement process are numerically compensated through the use of the computer program product.

A focusing device comprises a base unit and a mirror unit which is translatable relative to the base unit parallel to an optical axis of the focusing device. The mirror unit is configured to receive incident light along the optical axis in a first direction and to reflect the incident light parallel with the optical axis in said first direction. The mirror unit comprises at least four mirrors, at least one of the mirrors being curved.

A system includes a first optical unit that emits light to a measurement target object and receives first interference light incident from the measurement target object, a second optical unit that emits the light to a reference object configured to have a constant optical path length with respect to a temperature fluctuation and receives second interference light incident from the reference object, a spectroscope connected to the first optical unit and the second optical unit and receives the first interference light and the second interference light to be incident, and a control unit connected to the spectroscope, and the control unit calculates a fluctuation rate of a measurement optical path length with respect to a reference optical path length under a predetermined temperature environment on the basis of the optical path length of the reference object calculated on the basis of the second interference light incident on the spectroscope under the predetermined temperature environment, and the reference optical path length of the reference object acquired in advance, and corrects, on the basis of the fluctuation rate, the optical path length of the measurement target object calculated on the basis of the first interference light incident on the spectroscope under the predetermined temperature environment.

A measurement apparatus for interferometric shape measurement of a test object surface. A test optical unit produces from measurement radiation a test wave for irradiating the surface. A reference element with an optically effective surface interacts with a reference wave also produced from the measurement radiation. An interferogram is produced by superimposing the test wave after interaction with the test object's surface. A holding device holds the reference element and moves the reference element relative to the reference wave in at least two rigid body degrees of freedom so that a peripheral point of the reference element's optically effective surface shifts by at least 0.1% of a diameter of the optically effective surface. The at least two degrees of freedom include a translational degree, directed transversely to a propagation direction of the reference wave and a rotational degree, whose rotational axis aligns substantially parallel to the reference wave's propagation direction.

An optical speckle receiver for receiving a speckle signal from a sample, the optical speckle receiver comprising an optical detector and an aperture and/or lens array. The aperture and array respectively comprise a plurality of apertures or lenses and is located between the sample and the optical detector such that the received speckle pattern is obtained from multiple discrete sample locations.

The technology disclosed in this patent document can be used to implement an optical coherent tomography (OCT) system that combines a control of the probe light to the target sample with different optical aberration patterns in optically probing the target sample and an OCT imaging processing to enhance the OCT imaging quality by combining image signals from in-phase contributions from the probing with different optical aberration patterns while suppressing randomly phased contributions from scattering by the target sample.