An optical interrogation system, e.g., an OFDR-based system, measures local changes, of index of refraction of a sensing light guide subjected to a time-varying disturbance. Interferometric measurement signals detected for a length of the sensing light guide are transformed into the spectral domain. A time varying signal is determined from the transformed interferometric measurement data set. A compensating signal is determined from the time varying signal which is used to compensate the interferometric measurement data set for the time-varying disturbance. Further robustness is achieved using averaging and strain compensation. The compensation technique may be applied along the length of the light guide.

An optical measuring probe for measuring inner and/or outer diameters of objects, uses a first optical element for focusing or collimating an optical beam onto a surface of an object. A second optical element for splitting the optical beam into a first measuring beam and a second measuring beam is provided in the optical measuring probe in such a way that the second measuring beam is guided out of the measuring probe in a direction opposite the direction of the first measuring beam and that the first measuring beam forms a first scan point and the second measuring beam forms a second scan point. Also described is a corresponding method for measuring diameters using the optical measuring probe. The optical measuring probe and the associated method make it possible to optically measure inner and outer diameters of measuring probes objects in a simple manner.

Disclosed are several technical approaches of using low coherence interferometry techniques to create an autofocus apparatus for optical microscopy. These approaches allow automatic focusing on thin structures that are positioned closely to reflective surfaces and behind refractive material like a cover slip, and automated adjustment of focus position into the sample region without disturbance from reflection off adjacent surfaces. The measurement offset induced by refraction of material that covers the sample is compensated for. Proposed are techniques of an instrument that allows the automatic interchange of imaging objectives in a low coherence interferometry autofocus system, which is of major interest in combination with TDI (time delay integration) imaging, confocal and two-photon fluorescence microscopy.

A signal control module integrated to a low coherence interferometry including a one-dimensional (1D) array image sensor is provided. The signal control module includes an image acquisition controller and a signal controller. The image acquisition controller sends a 1D image acquisition control signal. The signal controller sends a two-dimensional (2D) image acquisition control signal, wherein the 1D and 2D image acquisition control signals are synchronized with each other. The 1D array image sensor captures 1D image information of an object-to-be-tested at different positions along a direction according to the 1D and 2D image acquisition control signals. The 1D image information constitutes 2D image information. Furthermore, a low coherence interferometry is provided.

A signal control module integrated to a low coherence interferometry including a one-dimensional (1D) array image sensor is provided. The signal control module includes an image acquisition controller and a signal controller. The image acquisition controller sends a 1D image acquisition control signal. The signal controller sends a two-dimensional (2D) image acquisition control signal, wherein the 1D and 2D image acquisition control signals are synchronized with each other. The 1D array image sensor captures 1D image information of an object-to-be-tested at different positions along a direction according to the 1D and 2D image acquisition control signals. The 1D image information constitutes 2D image information. Furthermore, a low coherence interferometry is provided.

A displacement detection apparatus capable of stably and accurately detecting the amount of displacement. The length of a polarization maintaining fiber for transmitting the light from a light source to a displacement detector is set not to be equal to a length obtained by dividing, by the wavelength of the light source, a product of an even integral multiple of a length, which is obtained by multiplying twice the length of a resonator by the refractive index of the resonator, and a beat length obtained by a difference between the propagation constants of two polarization modes. Alternatively, the length of the polarization maintaining fiber is set to be larger than a length, which is obtained by dividing, by the wavelength of the light source, a product of a coherence length and a beat length obtained from a difference between the propagation constants of two polarization modes.

An apparatus comprising means for: causing illumination of different areas of a sample with an optical frequency imaging beam at different positions at different times, wherein adjacent positions are configured to cause the corresponding areas to at least partially overlap;receiving signals indicative of back-scattering of the optical frequency imaging beam from the sample at the different times; and processing the received signals to obtain an image of the sample, wherein processing the received signals compensates for phase variations between the different positions at the different times using a matched filter derived from a scattering model of the sample.

Distance to a target is sensed using a common path interferometer, wherein a first fraction of light from a light source is collected after reflection by a partially reflective element together with reflection from a target of a second fraction of light from the light source that has been transmitted by the partially reflective element. The collected light is split in two parts, both containing a part of the first fraction and part of the reflection from the target. The parts are fed through a first and second optical branch path to an input side of a three-way optical coupler respectively. Light from at three terminals on a second side of the N way coupler is fed to respective light intensity detectors. Information representing an excess distance traveled by the first fraction from detection signals determined by the least three light intensity detectors.

Apparatus and method for detecting wavefront aberration of an objective lens, comprising a wavefront detection system, a planar mirror, and a planar mirror adjusting mechanism; the objective lens is placed between planar mirror and wavefront detection system; planar mirror is positioned at focal point of the objective lens. A test wavefront emitted by wavefront detection system passes through the objective lens, gets reflected by the planar mirror, and t passes through the objective lens again; the wavefront detection system receives and detects the test wavefront to derive a phase distribution thereof; an angle of the planar mirror tilts at is adjusted to obtain different return wavefronts; a polynomial for expressing wavefront aberration is selected, and expressions corresponding to all the return wavefronts are calculated; result of fitting the wavefront aberration of the objective lens when expressed by the selected polynomial is derived through fitting with the polynomial.

Apparatus and method for detecting wavefront aberration of an objective lens, comprising a wavefront detection system, a planar mirror, and a planar mirror adjusting mechanism; the objective lens is placed between planar mirror and wavefront detection system; planar mirror is positioned at focal point of the objective lens. A test wavefront emitted by wavefront detection system passes through the objective lens, gets reflected by the planar mirror, and t passes through the objective lens again; the wavefront detection system receives and detects the test wavefront to derive a phase distribution thereof; an angle of the planar mirror tilts at is adjusted to obtain different return wavefronts; a polynomial for expressing wavefront aberration is selected, and expressions corresponding to all the return wavefronts are calculated; result of fitting the wavefront aberration of the objective lens when expressed by the selected polynomial is derived through fitting with the polynomial.