Patent classifications
G01B11/005
System and method to derive and apply computer numerical control global offsets during part measurement on coordinate measuring machine
A method to derive and apply computer numerical control global offsets includes: measuring features of a machined part using a coordinate measuring machine (CMM); programming a first processor within the CMM to receive the dimensions of the features and to output computer numerical control (CNC) offsets; and forwarding the CNC offsets from the CMM to a CNC machining system to correct operation of the CNC machining system.
Self Calibration Formal Inspection System and Method of using it to Inspect Article
A self-calibrating inspection system includes an inspection device adapted to visually inspect or measure an article placed on a carrier, and a motion actuator moving the inspection device along a predetermined motion trajectory relative to the carrier and the article placed thereon. A correction member of the system is fixedly positioned with respect to the carrier. A distance sensor is fixedly positioned relative to the inspection device and adapted to sense a first spacing between the distance sensor and the correction member during the movement of the inspection device by the motion actuator. A controller communicates with the motion actuator and the distance sensor for determining a deviation between an actual motion trajectory of the inspection device moved by the motion actuator and the predetermined motion trajectory based on the first spacing, and to control the motion actuator based on the deviation to move the inspection device along a path substantially consistent with the predetermined motion trajectory.
System and method for analysis of measurement data acquired from multiple workpieces
A method for evaluating measurement data from a measurement of a plurality of workpieces includes obtaining a set of measurement data. Each workpiece has an associated set of measurement data. The set of measurement data corresponds to measurement points of the workpieces. The set of measurement data has, for each measurement point of the workpieces, at least one measured coordinate and/or, for each measured coordinate, a divergence from a comparison coordinate. The method includes determining a measure of the correlation of the measured coordinates and/or of the divergences is determined for a plurality of the sets of measurement data, in each case in relation to a pair of measurement points that consists of two measurement points of the workpieces.
Mobile system and method of scanning an environment
A system and method for measuring three-dimensional (3D) coordinate values of an environment is provided. The system includes a movable base unit a first scanner and a second scanner. One or more processors performing a method that includes causing the first scanner to determine first plurality of coordinate values in a first frame of reference based on an emitted first beam of light and a received first reflected light. The second scanner determines a second plurality of 3D coordinate values in a second frame of reference as the base unit is moved from a first position to a second position. The determining of the first coordinate values and the second plurality of 3D coordinate values being performed simultaneously. The second plurality of 3D coordinate values are registered in a common frame of reference based on the first plurality of coordinate values.
NON-INVASIVE ALIGNMENT METHOD AND SYSTEM FOR IMAGER-ILLUMINATOR OPTICAL MEASUREMENT MACHINES
A backlight optical alignment system comprises an illumination system having an illumination pupil and an illuminator configured to generate an output, wherein the illumination system includes a rotationally symmetric illumination distribution having an illumination axis, an imaging system having an imaging sensor comprising at least one detector element, an imaging pupil, and an acceptance cone in object space of the imaging system having an optical axis, wherein at least a portion of the imaging pupil is filled by the illumination system output when a portion of the illumination distribution overlaps with the acceptance cone, and a first substrate disposed in object space between the illumination system and the imaging system, wherein the solid substrate is adjustable to generate a change in signal intensity from the imaging sensor when the illumination axis of the illumination distribution is misaligned with the optical axis of the acceptance cone.
Rotary table module and coordinate measuring machine with rotary table module and method for operating the same
A coordinate measuring machine and a method for operating a coordinate measuring machine, and a rotary table module for a coordinate measuring machine with a rotary table for receiving a workpiece and a rotary table block are provided. The rotary table is supported on a rotary table side rotatably about a rotary table axis. The rotary table block has, opposite the rotary table side of the rotary table block, a bottom side with which the rotary table module can be supported on a measurement table of the coordinate measuring machine. The rotary table block has a further supporting side with which the rotary table block is supportable on the measurement table of the coordinate measuring machine and which differs from the bottom side in its alignment. The rotary table module includes a pose capturing device for the determination of whether the rotary table block is supported on the bottom side.
LASER TRACKER-BASED SURVEYING SYSTEM WITH INERTIAL MEASUREMENT UNIT
The invention relates to a laser tracker-based surveying system having a measurement aid which comprises an inertial measurement unit (IMU). The surveying system is designed to determine coordinates of points of a surface which are sampled by means of the measurement aid.
Measuring apparatus
It is an object of the present invention to provide a measuring apparatus capable of easily restoring the tracking state when the tracking state of the target is interrupted. One aspect of the present invention is a measuring apparatus that emits a light beam toward a target, captures and tracks the target, and measures the three-dimensional coordinates of the target. The measuring apparatus includes: a light source for emitting light beam; an angle control unit for controlling the emission angle of the light beam emitted from the light source so as to track the moving target; an imaging unit for capturing the target or the vicinity of the target, and a recognition unit for recognizing the target or the specific portion including the target from an image captured by the imaging unit. The angle control unit controls the emission angle of the light beam so as to emit light beam toward the target or the specific portion including the target recognized by the recognition unit when the tracking of the target is released.
Measurement probe
A measurement probe of the present disclosure that scans a surface of a measurement object to measure a three-dimensional shape or the like of the surface of the measurement object includes a first movable portion having a stylus, a second movable portion that is connected to the first movable portion to be movable in a Z direction, a third movable portion that is connected to the second movable portion to be movable in the Z direction, a first position measurer that measures a first position of the first movable portion in the Z direction, a second position measurer that measures a second position of the second movable portion in the Z direction, and a third position measurer that measures a third position of the third movable portion in the Z direction. A first relative position is calculated based on the first position and the second position. A second relative position is calculated based on the first position and the third position. The first relative position of the second movable portion with respect to the first movable portion in the Z direction and the second relative position of the third movable portion with respect to the first movable portion in the Z direction are maintained constant.
Workpiece holder for utilization in metrology system for measuring workpiece in different orientations
A workpiece holder is configured to hold a workpiece and is utilized in a metrology system which includes a sensing configuration for obtaining 3-dimensional surface data for the workpiece. The workpiece holder includes at least three reference features (e.g., spherical reference features extending from sides) that are configured to be sensed by the sensing configuration when the workpiece holder is in different orientations (e.g., as rotated 180 degrees between first and second orientations for presenting front and back sides of the workpiece towards the sensing configuration). A determination of 3-dimensional positions of the reference features for each orientation enables a combining (e.g., in a common coordinate system) of 3-dimensional surface data that is acquired for the workpiece in each orientation. Interchangeable workpiece holding portions may be provided that fit within the workpiece holder for holding workpieces with different characteristics (e.g., having different sizes and/or shapes).