G01B11/026

SYSTEM AND METHOD FOR DETERMINING RADIUS OF A WHEEL OF A MOBILE MACHINE
20230009379 · 2023-01-12 ·

A distance sensor is used for automatically determining the size of a wheel on a mobile machine. The distance sensor is mounted to detect distance information relating to a distance between the sensor and an outer circumferential surface of the wheel. The distance information is received by a controller configured to determine the radius of the wheel based at least in part on the distance information. The controller may compare the measured radius with data for a range of standard wheel sizes and determine which standard wheel size is fitted. The measured wheel radius and/or the determined standard wheel size can used as an input for a control system on the machine which requires wheel size data, such as an axle height adjustment system.

Device and method for measuring fretting displacement in power cycle of press-pack IGBT

Disclosed are a device and a method for measuring a fretting displacement in a power cycling of a press-pack insulated gate bipolar transistor (IGBT). The IGBT includes: a bracket; slide bars slidably mounted on the bracket and are arranged at least four along a circumferential direction of the bracket; sensors respectively slidably installed on the bracket and the slide bars; and a power cycling experiment device arranged inside the bracket.

Measuring device for determining a distance between a laser processing head and a workpiece, laser processing system including the same and method for determining a distance between a laser processing head and a workpiece
11549798 · 2023-01-10 · ·

A measuring device determines a distance between a processing head for a laser processing system configured to process a workpiece with a laser beam and the workpiece. The measuring device includes an optical coherence tomograph to measure a distance between the processing head and workpiece. In the optical coherence tomograph, measuring light generated by a measuring light source and reflected by the workpiece interferes with measuring light reflected in a reference arm with two or more reference stages. The stages include a first reference stage configured such that the measuring light reflected therein travels a first optical path length, and a second reference stage configured such that the measuring light reflected therein travels a second optical path length different from the first length, wherein the measuring light reflected by the workpiece interferes with reflected measuring light of the first reference stage and reflected measuring light of the second reference stage.

AUTHENTICATION ALIGNMENT SYSTEM
20230214085 · 2023-07-06 · ·

A feedback apparatus for a user identification system of a vehicle includes an indicator device configured to selectively activate a status icon and a plurality of directional segments disposed around the status icon. A controller is in communication with a scanning device configured to authenticate an object depicted in image data representing a field of view. The controller is configured to identify an alignment direction of the object within the field of view and activate one or more of the directional segments in response to the alignment direction. Additionally, the controller is configured to activate the status icon in response to the alignment direction indicating that the object is aligned in the field of view.

Self-mixing interference device for sensing applications

Disclosed herein are self-mixing interferometry (SMI) sensors, such as may include vertical cavity surface emitting laser (VCSEL) diodes and resonance cavity photodetectors (RCPDs). Structures for the VCSEL diodes and RCPDs are disclosed. In some embodiments, a VCSEL diode and an RCPD are laterally adjacent and formed from a common set of semiconductor layers epitaxially formed on a common substrate. In some embodiments, a first and a second VCSEL diode are laterally adjacent and formed from a common set of semiconductor layers epitaxially formed on a common substrate, and an RCPD is formed on the second VCSEL diode. In some embodiments, a VCSEL diode may include two quantum well layers, with a tunnel junction layer between them. In some embodiments, an RCPD may be vertically integrated with a VCSEL diode.

Optoelectronic modules and methods for operating the same

Optoelectronic modules operable to measure proximity independent of object surface reflectivity and, in some implementations, operable to measure characteristics (such as surface reflectivity or absorptivity) of stationary or moving objects are disclosed. The optoelectronic modules are operable to determine, for example, pulse rate, peripheral blood circulation, and/or blood oxygen levels of moving objects, such as the appendage of a user, in some instances. The optoelectronic modules can be used to measure peripheral blood circulation, for example, when a user of the optoelectronic module is engaged in physical activity, such as walking, running or cycling.

System and method for measuring three-dimensional coordinates

A three-dimensional (3D) measurement system, a method of measuring 3D coordinates, and a method of generating dense 3D data is provided. The method of measuring 3D coordinates includes using a first 3D measurement device and a second 3D measurement device in a cooperative manner is provided. The method includes acquiring a first set of 3D coordinates with the first 3D measurement device. The first set of 3D coordinates are transferred to the second 3D measurement device. A second set of 3D coordinates is acquired with the second 3D measurement device. The second set of 3D coordinates are registered to the first set of 3D coordinates in real-time while the second 3D measurement device is acquiring the second set of 3D coordinates.

System and method of defining a path and scanning an environment

A system and method for measuring three-dimensional (3D) coordinate values of an environment is provided. The method including moving a 2D scanner through the environment. A 2D map of the environment is generated using the 2D scanner. A path is defined through the environment using the 2D scanner. 3D scan locations along the path are defined using the 2D scanner. The 2D scanner is operably coupled to a mobile base unit. The mobile base unit is moved along the path based at least in part on the 2D map and the defined path. 3D coordinate values are measured at the 3D scan locations with a 3D scanner, the 3D scanner being coupled to the mobile base unit.

Mounting bracket and self-propelled robot

Embodiments of the present disclosure disclose a mounting bracket and a self-propelled robot. The mounting bracket includes a housing, a rotating shaft and a magnetic positioning assembly. The housing is provided with an inner cavity. The rotating shaft is configured to rotate about an axis in the inner cavity. The magnetic positioning assembly includes a first magnetic element and a second magnetic element which are respectively arranged on the housing and the rotating shaft. The laser distance sensor is attached to the rotating shaft and configured to rotate about the axis. The mounting bracket is configured to prevent the rotating shaft from deviating from the axis by generating a force between the first magnetic element and the second magnetic element in a radial direction of the rotating shaft.

Self-mixing interferometry-based absolute distance measurement with distance reference
11692809 · 2023-07-04 · ·

A device includes a first component, a second component having a reconfigurable distance from the first component, an optical element, an SMI sensor, and a processor. The optical element has a fixed relationship with respect to the first component, and has a known optical thickness between a first surface and a second surface of the optical element. The SMI sensor has a fixed relationship with respect to the second component, and has an electromagnetic radiation emission axis that intersects the first and second surfaces of the optical element. The processor is configured to identify disturbances in an SMI signal generated by the SMI sensor, relate the disturbances to the known optical thickness of the optical element, and to determine a distance between the first and second components using the SMI signal and the relationship of the disturbances to the known optical thickness of the optical element.