Patent classifications
G01B11/026
Bandpass filter comprising first and second reflective members each having a plurality of cholesteric liquid crystal layers and sensor having the same
Provided are a bandpass filter having a high light transmittance in a transmission band and a wide wavelength range showing a high transmittance in the transmission band, and a sensor. The bandpass filter is a bandpass filter including a reflective member A and a reflective member B, in which a difference between a reflection center wavelength of the reflective member A and a reflection center wavelength of the reflective member B is larger than a sum of a half width at half maximum of a reflection band of the reflective member A and a half width at half maximum of a reflection band of the reflective member B; the reflective member A has a first cholesteric liquid crystal layer and a second cholesteric liquid crystal layer, and birefringence Δn1 of the first cholesteric liquid crystal layer is larger than birefringence Δn2 of the second cholesteric liquid crystal layer; and the reflective member B has a third cholesteric liquid crystal layer and a fourth cholesteric liquid crystal layer, and birefringence Δn3 of the third cholesteric liquid crystal layer is larger than birefringence Δn4 of the fourth cholesteric liquid crystal layer.
DISTANCE MEASUREMENT DEVICE, METHOD OF CONTROLLING DISTANCE MEASUREMENT DEVICE, AND ELECTRONIC APPARATUS
A distance measurement device according to the present disclosure includes: a light detection unit that receives light from a subject; a depth calculation section that calculates depth information of the subject on the basis of an output of the light detection unit; and an artifact removal section that divides an image into respective segments on the basis of the depth information and validates a segment of the respective segments in which a number of pixels exceeds a predetermined threshold and invalidates a segment in which the number of pixels is less than or equal to the predetermined threshold.
OBJECT RECOGNITION SYSTEM, SIGNAL PROCESSING METHOD OF OBJECT RECOGNITION SYSTEM, AND ELECTRONIC APPARATUS
An object recognition system of the present disclosure includes: a light source section that irradiates a subject with dot light having a predetermined pattern; an event detection sensor that receives the dot light having the predetermined pattern reflected by the subject and detects, as an event, that a change in luminance of a pixel exceeds a predetermined threshold; and a signal processor that performs, in a case where a plurality of successive pixels in a pixel array section of the event detection sensor detects occurrence of an event in a certain period, processing of removing the event as noise, the plurality of successive pixels being equal to or greater than a predetermined number of pixels.
Method for determining correct scanning distance using augmented reality and machine learning models
A smart device is provided with an application program for displaying a video feed received from the smart device's camera. The application can determine the coordinates for an intersection point, which is a point on the ground where the smart device is pointing at. The application can display a target on the visual representation of the intersection point. Based on whether the smart device is at an appropriate distance from the intersection point, the user interface can superimpose an indicator on the video feed received from the camera. This can inform the user whether the smart device is at an optimal scan distance from the intersection point (or an object) so that the object can be identified by a machine learning model.
Camera and method for detecting image data
A camera for detecting an object in a detection zone is provided that has an image sensor for recording image data, a reception optics having a focus adjustment unit for setting a focal position, a distance sensor for measuring a distance value from the object, and a control and evaluation unit connected to the distance sensor and the focus adjustment unit to set a focal position in dependence on the distance value, and to determine a distance value with the distance sensor via a variable measurement duration that is predefined in dependence on a provisional distance value such that a measurement error of the distance value and thus, on a recording of image data of the object, a focus deviation of the set focal position from an ideal focal position remains small enough for a required image sharpness of the image data.
Measurement system
A system and method for measuring. The system has at least one rail with a downstream end and an upstream end. There is a deflector at a downstream end which is used in conjunction with a measurement laser which is coupled to a shuttle. The shuttle is moveable relative to the rail. The shuttle also has a sight for zeroing in on the item to be measured.
External illumination with reduced detectability
Disclosed herein are techniques for providing an illumination system that emits illumination into an environment while also enabling that system to be undetectable to certain types of external light detection systems. The system includes a single photon avalanche diode (SPAD) low light (LL) detection device and a light emitting device. The light emitting device provides illumination having a wavelength of at least 950 nanometers (nm). An intensity of the illumination is set to a level that causes the illumination to be undetectable from a determined distance away based on the roll off rate of the light. While the light emitting device is providing the illumination, the SPAD LL detection device generates an image of an environment in which the illumination is being provided.
Method and device for inspection of a geometry, the device comprising image capturing and shape scanning means
Method for inspecting a geometry (10) having a surface (11), which method uses an inspection device (100) having a digital image capturing means (120) and a shape scanning means (130), comprising the steps of
a) orienting the inspection device (100) in a first orientation;
b) depicting the surface (11) to produce a first image;
c) measuring a shape of a first geometry part to produce a first shape;
d) moving the inspection device (100) to a second orientation;
e) depicting the surface (11) to produce a second image;
f) measuring a second part of said geometry (10) to produce a second shape;
g) using digital image processing based on said first and second images, determining a geometric orientation difference between said first and second orientations;
h) determining a geometric relation between the first and second shapes; and
i) producing a data representation of said geometry based on said first shape, said second shape and said geometric relation.
The invention also relates to a device.
SYSTEM AND METHODS FOR DEPTH GENERATION USING STRUCTURED LIGHT PATTERNS
An example apparatus includes: a controller configured to: generate a symbol pattern as a result of placing symbols based on epipolar lines; instruct an SLM to project the symbol pattern; obtain an image of a reflection of the symbol pattern; determine a first location of a symbol in the image; determine a second location of the symbol in the image; and determine a depth of the symbol as based on the first location, the second location, and an essential matrix.
DISTANCE MEASURING METHOD AND DEVICE AS WELL AS LASER LITHOTRIPSY DEVICE
A measuring method for optically determining a distance (z) of a surface located in a medium from an end of an optical waveguide is described and has the following steps: emitting electromagnetic measuring radiation of a first wavelength (λ1) and of a second wavelength (λ2) from the end of the waveguide towards the surface, wherein the medium more strongly absorbs the electromagnetic measuring radiation of the second wavelength (λ2) than the electromagnetic measuring radiation of the first wavelength (λ1); measuring a first reflection signal (I.sub.1) of the electromagnetic measuring radiation of the first wavelength (λ1) reflected from the surface, and measuring a second reflection signal (I.sub.2) of the electromagnetic measuring radiation of the second wavelength (λ2) reflected from the surface, and determining the distance (z) from a ratio (I.sub.2:I.sub.1) of the second and the first reflection signal. Furthermore, a measuring device and a laser lithotripsy device are described.