Inspection devices and methods for inspecting an adhesive pattern on a substrate are disclosed. The inspection device includes at least one sensor having a heat sensor head for detecting a pattern of the adhesive bead, and a controller. Reference data representing a desired adhesive pattern is initially provided to a controller. A predetermined tolerance range for the desired adhesive pattern is also provided to the controller. An adhesive bead is discharged onto a substrate from a nozzle. A pattern of the discharged adhesive bead is then detected by the sensor when the substrate moves. Signals representing the detected pattern are received from the sensor at the controller. Finally, the signals representing the detected adhesive pattern are compared to the tolerance range of the desired adhesive pattern.

Inspection devices and methods for inspecting an adhesive pattern on a substrate are disclosed. The inspection device includes at least one sensor having a heat sensor head for detecting a pattern of the adhesive bead, and a controller. Reference data representing a desired adhesive pattern is initially provided to a controller. A predetermined tolerance range for the desired adhesive pattern is also provided to the controller. An adhesive bead is discharged onto a substrate from a nozzle. A pattern of the discharged adhesive bead is then detected by the sensor when the substrate moves. Signals representing the detected pattern are received from the sensor at the controller. Finally, the signals representing the detected adhesive pattern are compared to the tolerance range of the desired adhesive pattern.

An optical displacement sensing system is provided. With configuration of an optical sensor disposed on a displacement platform and in cooperation with a broadband light source and an optical spectrum analyzer, when the displacement platform moves, the waveguide grating of the optical sensor is resonated and the reflected light provided with a resonance wavelength is formed. The waveguide grating has the plurality of grating periods, and when the displacement platform moves to a different position to make the broadband light source correspond to a different grating period, the position can correspond to the different resonance wavelength. Therefore, according to the aforementioned configuration, the position is determined according to the different resonance wavelength, instead of using an optical encoder; furthermore, the micrometer-scale or nanometer-scale displacement detection is achieved.

This application discloses a lithiation device for applying a lithium film on an electrode plate. The lithiation device includes: a rolling mechanism including a first roller and a second roller, the two rollers configured to roll the electrode plate and the lithium film to apply the lithium film on the electrode plate; an adjustment mechanism connected to the rolling mechanism and configured to adjust a gap and/or a rolling force between the first roller and the second roller; a first monitoring mechanism configured to monitor a length of the electrode plate after the electrode plate passes through the rolling mechanism; and a controller configured to control the adjustment mechanism based on a comparison result of the length monitored by the first monitoring mechanism and a target length so that the length of the electrode plate after the electrode plate passes through the rolling mechanism approximates to the target length.

The purpose of the present invention is to provide a height measurement device with which, even when the height of a sample surface varies considerably, it is possible, with a relatively simple configuration, to perform height measurement with high accuracy at various heights. In order to achieve the abovementioned purpose, proposed is an optical height measurement device characterized by being provided with: a stage for retaining a sample; a stage driving unit for adjusting the stage at different heights; a projection optical system for projecting light onto the sample; a detection optical system for receiving light reflected from the sample; and a processing unit for measuring the height of the sample on the basis of a signal outputted from the detection optical system, wherein the projection optical system is provided with a light source that emits light, and an optical path dividing element for branching the optical path of the light emitted from the light source, and the detection optical system is provided with a sensor for receiving light reflected from the sample, and an element for adjusting the light path of the light reflected from the sample in the direction of the sensor prior to reception of the light by the sensor.

A measurement system includes an imaging device, a memory device, an interface and circuitry. The imaging device is configured to obtain a device image a conveyor belt system. The image device is configured to obtain a reference image of a reference point or reference measurement. The reference image can also be the device image. The memory device is configured to store the device image. The interface is configured to facilitate selection of points for a device/part to be measured. The circuitry comprises one or more processors configured to determine a reference measurement for the reference dimension based on the reference image via the interface; determine one or more device measurements based on the device image and the reference measurement; and calculate a plurality of device parameters based on the determined one or more device measurements. User input via a touch sensitive screen comprising a glass insulator coated with indium tin oxide (ITO) and the one or more processors can be configured to select the one or more device points based on change in capacitance at one or more locations of the touch sensitive screen.

Introduced here is a system for optically tracking displacement with high precision across one or more axes. To track displacement of an object, images that are generated by a plurality of optical sensors can be compared against one another. For example, images that are generated by a first optical sensor can be compared against images that are generated by a second optical sensor. Because the first and second optical sensors are in a fixed spatial relationship with one another, displacement of the object can be established based on the degree to which a given image generated by the first optical sensor matches another image generated by the second optical sensor.

Introduced here is a system for optically tracking displacement with high precision across one or more axes. To track displacement of an object, images that are generated by a plurality of optical sensors can be compared against one another. For example, images that are generated by a first optical sensor can be compared against images that are generated by a second optical sensor. Because the first and second optical sensors are in a fixed spatial relationship with one another, displacement of the object can be established based on the degree to which a given image generated by the first optical sensor matches another image generated by the second optical sensor.

A camera device for detecting a stream of objects moved relative to the camera device is provided that has an image sensor for recording image data of the objects, a geometry detection sensor for measuring the objects, and a control and evaluation unit that is configured to determine at least one region of interest using measured data of the geometry detection sensor to restrict the evaluation of the image data to the region of interest. In this respect, the image sensor has a configuration unit to enable the reading of only a settable portion of the respectively recorded image data; and the control and evaluation unit is configured only to read a portion of the image data from the image sensor that is determined with reference to the region of interest.

The present invention relates to a method for inspecting a welding quality of an electrode tab-electrode lead welded portion of a pouch-type lithium secondary battery, and the method includes: recognizing welding traces of the welded portion by a vision inspection device; measuring a size of each of the recognized welding traces; and determining whether the welded portion has been weakly welded, excessively welded or normally welded by comparing the measured size with a reference value.