G01B11/12

TIP CALIBRATION IN AN ADDITIVE MANUFACTURING SYSTEM
20230202112 · 2023-06-29 ·

A method for calibrating a 3D printer includes the steps of providing information obtained in a factory calibration indicating a center of an inner diameter of a tip orifice in a metal extrusion nozzle and a center of a tip surface for the nozzle and inductively sensing the nozzle with an eddy current sensor when secured to a print head on a gantry or robotic arm of the 3D printer to identify a sensed location of the center of the tip surface of the nozzle. The method includes determining a location of the center of the inner diameter of the tip orifice on the nozzle on the print head and utilizing the provided information to locate the center of the inner diameter of the tip orifice.

SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD

An object is to provide a technique capable of measuring a shape of an object while maintaining accuracy even when positional accuracy of a mechanism configured to move a probe is insufficient. A measurement control device 210 controls a movement mechanism 500 to move a measurement probe 160 to a target position of a target to be measured, calculates an error between an actual position of the measurement probe 160 detected by the measurement probe 160 and the target position, corrects the error by moving the measurement probe 160 by the movement mechanism 500 based on the calculated error, and then causes the measurement probe 160 to perform a distance measurement.

Optical measuring probe and method for optically measuring inner diameters

An optical measuring probe for measuring inner and/or outer diameters of objects, uses a first optical element for focusing or collimating an optical beam onto a surface of an object. A second optical element for splitting the optical beam into a first measuring beam and a second measuring beam is provided in the optical measuring probe in such a way that the second measuring beam is guided out of the measuring probe in a direction opposite the direction of the first measuring beam and that the first measuring beam forms a first scan point and the second measuring beam forms a second scan point. Also described is a corresponding method for measuring diameters using the optical measuring probe. The optical measuring probe and the associated method make it possible to optically measure inner and outer diameters of measuring probes objects in a simple manner.

Optical measuring probe and method for optically measuring inner diameters

An optical measuring probe for measuring inner and/or outer diameters of objects, uses a first optical element for focusing or collimating an optical beam onto a surface of an object. A second optical element for splitting the optical beam into a first measuring beam and a second measuring beam is provided in the optical measuring probe in such a way that the second measuring beam is guided out of the measuring probe in a direction opposite the direction of the first measuring beam and that the first measuring beam forms a first scan point and the second measuring beam forms a second scan point. Also described is a corresponding method for measuring diameters using the optical measuring probe. The optical measuring probe and the associated method make it possible to optically measure inner and outer diameters of measuring probes objects in a simple manner.

Porosity Measurement Of Semiconductor Structures
20170315044 · 2017-11-02 ·

Methods and systems for performing optical measurements of the porosity of geometric structures filled with a fill material by a capillary condensation process are presented herein. Measurements are performed while the structure under measurement is treated with a flow of purge gas that includes a controlled amount of vaporized fill material. A portion of the fill material condenses and fills openings in the structural features such as pores of a planar film, spaces between structural features, small volumes such as notches, trenches, slits, contact holes, etc. In one aspect, the desired degree of saturation of vaporized material in the gaseous flow is determined based on the maximum feature size to be filled. In another aspect, measurement data is collected when a structure is unfilled and when the structure is filled. The collected data is combined in a multi-target model based measurement to estimate values of porosity and critical dimensions.

Porosity Measurement Of Semiconductor Structures
20170315044 · 2017-11-02 ·

Methods and systems for performing optical measurements of the porosity of geometric structures filled with a fill material by a capillary condensation process are presented herein. Measurements are performed while the structure under measurement is treated with a flow of purge gas that includes a controlled amount of vaporized fill material. A portion of the fill material condenses and fills openings in the structural features such as pores of a planar film, spaces between structural features, small volumes such as notches, trenches, slits, contact holes, etc. In one aspect, the desired degree of saturation of vaporized material in the gaseous flow is determined based on the maximum feature size to be filled. In another aspect, measurement data is collected when a structure is unfilled and when the structure is filled. The collected data is combined in a multi-target model based measurement to estimate values of porosity and critical dimensions.

METHOD OF INSPECTING PIPE JOINTS FOR USE IN A SUBSEA PIPELINE

A method of inspecting a pipe joint for use in a subsea pipeline and a method of manufacturing a pipe joint for use in a subsea pipeline employing said inspection method are disclosed, the inspection method comprising the steps of: receiving a pipe joint; measuring the ovality of the pipe joint to obtain ovality data; determining that the ovality data does not exceed a predetermined maximum pipe joint ovality value; and carrying out external pressure collapse tests on a ring cut from one end of the received pipe joint, resulting in data representative of the hydrostatic collapse pressure of said pipe joint for use in confirming that the pipe joint is suitable for its intended use.

Drift and measurement tools and methods

A drifting and measurement tool is disclosed. The tool includes a first portion configured to mount on a first end of a tubular segment, and a second portion configured to mount on a second end of the tubular segment. The first portion has a rotatable component configured to rotate about a longitudinal axis of the tubular segment. The rotatable component includes a laser device configured to emit light toward the second portion and receive reflected light.

METHOD AND SYSTEM FOR MAP-FREE INSPECTION OF SEMICONDUCTOR DEVICES

A system and method for defect detection in a hole array on a substrate is disclosed herein. In one embodiment, a method for defect detection in a hole array on a substrate, includes: scanning a substrate surface using at least one optical detector, generating at least one image of the substrate surface; and analyzing the at least one image to detect defects in the hole array on the substrate surface based on a set of predetermined criteria.

Device for measuring the internal profile of a hollow shaft
09797757 · 2017-10-24 · ·

A sensor is placed on a plate lowered into the hollow of the shaft and guided by taut wires between a lower attachment device and an upper motorized winder. The deformations, responsible for measurement errors and caused either by static deformations, produced by the weight or poor construction of the apparatus, or by vibrations, are to a large extent eliminated.