There are included a probe that can be arranged in an imaging field of view, a horizontal drive section for causing the probe to contact a side surface of a workpiece on a stage, a display section for displaying a model image, a contact position designation section for receiving designation of contact target position information in the model image, a characteristic amount information setting section for setting characteristic amount information, a measurement setting information storage section for storing a plurality of pieces of contact target position information and the characteristic amount information, and a measurement control section for identifying a position and an attitude of the workpiece from a workpiece image by using the characteristic amount information, for identifying a plurality of contact target positions on the side surface of the workpiece where the probe should contact, based on the identified position and the identified attitude of the workpiece.

System include an ultrasonic transducer configured to couple to a nondestructive testing (NDT) sample and configured to produce and direct an ultrasonic probe wave at a selected frequency into a subsurface region of the NDT sample, a 3D laser scanning vibrometer configured to direct a detection beam in a scan area on a surface of the NDT sample and to receive a return beam from the scan area, and to detect, based on the return beam, a 3D motion of the surface across a wideband frequency range, and a processor, and a memory configured with instructions that, when executed by the processor, cause the processor to produce sub-surface image data of the NDT sample at multiple harmonics of the selected frequency in the wideband frequency range based on the detected 3D surface motion, wherein the sub-surface image data describes a nonlinear defect response produced in the NDT sample by interaction of the ultrasonic probe wave with the subsurface region.

System include an ultrasonic transducer configured to couple to a nondestructive testing (NDT) sample and configured to produce and direct an ultrasonic probe wave at a selected frequency into a subsurface region of the NDT sample, a 3D laser scanning vibrometer configured to direct a detection beam in a scan area on a surface of the NDT sample and to receive a return beam from the scan area, and to detect, based on the return beam, a 3D motion of the surface across a wideband frequency range, and a processor, and a memory configured with instructions that, when executed by the processor, cause the processor to produce sub-surface image data of the NDT sample at multiple harmonics of the selected frequency in the wideband frequency range based on the detected 3D surface motion, wherein the sub-surface image data describes a nonlinear defect response produced in the NDT sample by interaction of the ultrasonic probe wave with the subsurface region.

The present disclosure relates to structured illumination. The teachings thereof may be embodied in devices for reconstruction of a three-dimensional surface of an object by means of a structured illumination for projection of measurement patterns onto the object. For example, a device may include: a projector unit for diffractive projection of a measurement pattern comprising a plurality of measurement points onto the surface; an acquisition unit for acquiring the measurement pattern from the surface; and a computer unit for reconstruction of the surface from a respective distortion of the measurement pattern. All possible positions of measurement elements are contained in the measurement pattern in repeating groups, in which a respective combination of measurement points represents a respective location in the measurement pattern.

A measurement system includes a measurement device to detect measurement information relating to a position-modifiable component of a printing station during movement thereof. A calculation unit receives the measurement information from the measurement device. The calculation unit determines actual-position data of the position-modifiable component from the measurement data received and compares it with predetermined reference-position data to determine calibration information based on the actual-position data and the reference-position data. An interface permits then permits transfer of this calibration information.

The distance image acquisition apparatus (10) includes a projection unit (12) which projects a first pattern of structured light distributed in a two-dimensional manner with respect to a subject within a distance measurement region, a light modulation unit (22) which spatially modulates the first pattern projected from the projection unit (12), an imaging unit (14) which is provided in parallel with and apart from the projection unit (12) by a baseline length, and captures an image including the first pattern reflected from the subject within the distance measurement region, a pattern extraction unit (20A) which extracts the first pattern spatially modulated by the light modulation unit (22) from the image captured by the imaging unit (14), and a distance image acquisition unit (20B) which acquires a distance image indicating a distance of the subject within the distance measurement region based on the first pattern.

The distance image acquisition apparatus (10) includes a projection unit (12) which projects a first pattern of structured light distributed in a two-dimensional manner with respect to a subject within a distance measurement region, a light modulation unit (22) which spatially modulates the first pattern projected from the projection unit (12), an imaging unit (14) which is provided in parallel with and apart from the projection unit (12) by a baseline length, and captures an image including the first pattern reflected from the subject within the distance measurement region, a pattern extraction unit (20A) which extracts the first pattern spatially modulated by the light modulation unit (22) from the image captured by the imaging unit (14), and a distance image acquisition unit (20B) which acquires a distance image indicating a distance of the subject within the distance measurement region based on the first pattern.

An optoelectronic apparatus includes a heat sink, which is shaped to define a base, a first platform at a first elevation above the base, and a second platform alongside the first platform at a second elevation above the base, which is different from the first elevation. A first monolithic emitter array is mounted on the first platform and is configured to emit first optical beams. A second monolithic emitter array is mounted on the second platform and is configured to emit second optical beams. An optical element is configured to direct both the first and the second optical beams toward a target region.

An illumination apparatus for reducing speckle effect in light reflected off an illumination target includes a laser; a linear diffuser positioned in an optical path between an illumination target and the laser to diffuse collimated laser light in a planar fan of diffused light that spreads in one dimension across at least a portion of the illumination target; and a beam deflector to direct the collimated laser light incident on the beam deflector to sweep across different locations on the linear diffuser within an exposure time for illumination of the illumination target by the diffused light. The different locations span a distance across the linear diffuser that provides sufficient uncorrelated speckle patterns, at an image sensor, in light reflected from an intersection of the planar fan of light with the illumination target to add incoherently when imaged by the image sensor within the exposure time.

A light source for structured light, comprising a plurality of light source elements arranged in an array, wherein the light source elements are configured to be driven in the following two modes:—a calibration mode, wherein only a part of light source elements are adapted to be driven; and—a normal mode, wherein the rest of the light source elements are adapted to be driven.