Patent classifications
G01B11/27
SYSTEMS AND METHODS FOR ABSOLUTE SAMPLE POSITIONING
A sample mapping system includes a sample chuck including absolute reference marks, an imaging metrology tool to capture sets of alignment images at locations associated with sample marks on a sample on the sample chuck, and a controller. A particular set of alignment images at a particular location may include at least one alignment image associated with a particular sample mark and at least one alignment image associated with a particular portion of the absolute reference marks within a field of view of the imaging metrology tool visible through the sample. The controller may determine absolute coordinates of the sample marks based on the sets of alignment images. Determining the absolute coordinates of the particular sample mark may include determining the absolute coordinates of the particular sample mark based on a position of the particular sample mark relative to the particular portion of the absolute reference marks.
Systems, devices, and methods for aligning a lens in a laser projector
Systems, devices, and methods to perform alignment in a projector are described. Laser light emitted is directed to at least one lens, which directs the laser light to a diffractive optical element (DOE), which produces a diffracted light. A sensor measures a property of the diffracted light, and a position of at least one lens adjusted to improve a quality of the diffracted light. The lens is fixed in position to the improvement in the quality of diffracted light achieving a defined threshold. The characteristic may include brightness.
LEAD FRAME, SEMICONDUCTOR DEVICE AND EXAMINATION METHOD
A lead frame includes a die pad that includes a mounting surface for a semiconductor chip, and a film-like member that is arranged on the mounting surface of the die pad. The die pad includes a through hole that is formed in an area that includes an outer periphery of the film-like member.
SOLAR ARRAY RACK ALIGNMENT TOOL
An alignment tool for use with a solar panel support rack, configured to allow for the easy and rapid positioning of the support rack into proper alignment to receive solar panels.
SOLAR ARRAY RACK ALIGNMENT TOOL
An alignment tool for use with a solar panel support rack, configured to allow for the easy and rapid positioning of the support rack into proper alignment to receive solar panels.
DEVICE AND METHOD FOR LASER ALIGNMENT
There is provided a laser alignment device (10) for use between a laser device (5) and a planar surface of an object e.g. wall (20) at which a laser beam (30) is to aim at right angles. The laser alignment device (10) includes a back member (12) for use against or parallel to the wall surface, which includes a back indicia (22). Also included is a front member (14) having a front indicia (16) on an imaginary plane shared with the back indicia (22) and perpendicular to the back member (12). The front indicia (16) is positioned for access by the laser beam (30) to reach the back indicia (22) when the laser beam (30) is aligned to aim at the wall surface at right angles.
DEVICE AND METHOD FOR LASER ALIGNMENT
There is provided a laser alignment device (10) for use between a laser device (5) and a planar surface of an object e.g. wall (20) at which a laser beam (30) is to aim at right angles. The laser alignment device (10) includes a back member (12) for use against or parallel to the wall surface, which includes a back indicia (22). Also included is a front member (14) having a front indicia (16) on an imaginary plane shared with the back indicia (22) and perpendicular to the back member (12). The front indicia (16) is positioned for access by the laser beam (30) to reach the back indicia (22) when the laser beam (30) is aligned to aim at the wall surface at right angles.
Method and apparatus for use in wafer processing
In an embodiment an apparatus includes a receptacle configured to receive a wafer, a light port configured to emit light from a source of light so as to shine the light on an edge of the wafer, wherein the light port is an opening located on a surface of the receptacle and a light sensitive element configured to receive light that passed the edge of the wafer and to form a detection signal based on the received light, wherein the light port is located underneath the wafer.
Method and device for aligning a calibration device
A method for aligning a calibration device for calibrating a vehicle environmental sensor of a vehicle, and a device for carrying out such a method. The method includes: measuring a temporal curve of at least one measurement point using the camera, determining the geometrical driving axis from the temporal curve of the at least one measurement point, measuring a first and a second lateral distance value of the vehicle using the distance sensors at a measurement time, determining a center of a vehicle axle at the measurement time on the basis of the ascertained lateral distance values, correlating the geometrical driving axis to the center of the vehicle axle at the measurement time and determining an axially centric geometrical driving axis, and aligning the calibration device in correspondence to the ascertained axially centric geometrical driving axis.
Method and device for aligning a calibration device
A method for aligning a calibration device for calibrating a vehicle environmental sensor of a vehicle, and a device for carrying out such a method. The method includes: measuring a temporal curve of at least one measurement point using the camera, determining the geometrical driving axis from the temporal curve of the at least one measurement point, measuring a first and a second lateral distance value of the vehicle using the distance sensors at a measurement time, determining a center of a vehicle axle at the measurement time on the basis of the ascertained lateral distance values, correlating the geometrical driving axis to the center of the vehicle axle at the measurement time and determining an axially centric geometrical driving axis, and aligning the calibration device in correspondence to the ascertained axially centric geometrical driving axis.