Patent classifications
G01B11/27
ADAPTER FOR ELECTRICAL BOX
Disclosed are adapters for switches and outlets that allow switches and outlets to be moved laterally within the electrical box to accommodate wall features that are located adjacent to the electrical box.
ADAPTER FOR ELECTRICAL BOX
Disclosed are adapters for switches and outlets that allow switches and outlets to be moved laterally within the electrical box to accommodate wall features that are located adjacent to the electrical box.
STRUCTURE FOR ALIGNMENT MEASUREMENT MARK AND METHOD FOR ALIGNMENT MEASUREMENT
The application provides a structure for an alignment measurement mark and a method for an alignment measurement, and includes a first overlay mark and a second overlay mark. The second overlay mark includes a pattern structure to be measured. A layer where the first overlay mark is located is adjacent to a layer where the second overlay mark is located. An orthographic projection of the first overlay mark onto the layer where the second overlay mark is located is located at an inner side of the second overlay mark, or an orthographic projection of the first overlay mark onto the layer where the second overlay mark is located is located at a periphery of the second overlay mark.
Field calibration of stereo cameras with a projector
Calibration in the field is described for stereo and other depth camera configurations using a projector One example includes imaging the first and the second feature in a first camera of the camera system wherein the distance from the first camera to the projector is known, imaging the first and the second feature in a second camera of the camera system, wherein the distance from the second camera to the projector is known, determining a first disparity between the first camera and the second camera to the first feature, determining a second disparity between the first camera and the second camera to the second feature, and determining an epipolar alignment error of the first camera using the first and the second disparities.
Laser processing apparatus and optical adjustment method
A laser processing apparatus emits processing light, measurement light, processing guide light, and measurement guide light with which a surface of a workpiece is irradiated. Respective wavelengths of the processing guide light and the measurement guide light are set to wavelengths at which a deviation amount between an irradiation position of the processing guide light and an irradiation position of the measurement guide light due to a chromatic aberration of magnification of a lens, and a deviation amount between an irradiation position of the processing light and an irradiation position of the measurement light due to the chromatic aberration of magnification of the lens are equal to each other. Therefore, positioning of spot positions of a plurality of laser lights having different output differences can be realized with high accuracy and high speed.
Vehicle wheel alignment measurement system camera and ADAS calibration support structure
A system and method for aligning a floor target relative to a vehicle, the floor target including a calibration pattern for observation by a vehicle safety system sensor during calibration. The system includes at least one optical projection system consisting of at least one optical projector having an orientable projection axis. The optical projection system is operatively controlled by a processor to orient said projection axis towards a selected location on the floor surface relative to the vehicle, and to activate the optical projected to illuminate a point, a line, or a boundary, against which the floor target is aligned.
Illuminated vehicle sensor calibration target
An illuminated sensor target includes a light source. Actuating the light source illuminates the sensor target. The illuminated sensor target is recognized by one or more sensors of a vehicle during a calibration process, and is used to calibrate the one or more sensors of the vehicle during the calibration process. The illuminated sensor target is illuminated during at least part of the calibration process, which may involve rotation of the vehicle about a turntable, with the illuminated sensor target positioned within a range of the turntable along with other sensors targets, which may also be illuminated.
Metrology method, computer product and system
A method including determining a type of structural asymmetry of the target from measured values of the target, and performing a simulation of optical measurement of the target to determine a value of an asymmetry parameter associated with the asymmetry type. A method including performing a simulation of optical measurement of a target to determine a value of an asymmetry parameter associated with a type of structural asymmetry of the target determined from measured values of the target, and analyzing a sensitivity of the asymmetry parameter to change in a target formation parameter associated with the target. A method including determining a structural asymmetry parameter of a target using a measured parameter of radiation diffracted by the target, and determining a property of a measurement beam of the target based on the structural asymmetry parameter that is least sensitive to change in a target formation parameter associated with the target.
Metrology method, computer product and system
A method including determining a type of structural asymmetry of the target from measured values of the target, and performing a simulation of optical measurement of the target to determine a value of an asymmetry parameter associated with the asymmetry type. A method including performing a simulation of optical measurement of a target to determine a value of an asymmetry parameter associated with a type of structural asymmetry of the target determined from measured values of the target, and analyzing a sensitivity of the asymmetry parameter to change in a target formation parameter associated with the target. A method including determining a structural asymmetry parameter of a target using a measured parameter of radiation diffracted by the target, and determining a property of a measurement beam of the target based on the structural asymmetry parameter that is least sensitive to change in a target formation parameter associated with the target.
Apparatus and method for coaxtailly aligning two rotatable shafts
An apparatus and method for aligning two coaxially coupled rotatable shafts. A servo operated multi axis positioning device is movable along a longitudinal axis parallel to the axis of the shafts, and movable vertically to position a laser range (LRF) adjacent to the two shafts, which measures the distance between the LRF and a spot on the shafts. A controller having a processor and memory communicates with the positioning device and the LRF to collect data at two axial positions on each shaft. At each position the LRF measures the distance to the shaft and stores the measurement and location data. The LRF is vertically repositioned and the measurement and storing steps are repeated over a scan distance sufficient to provide enough data to determine the location of the shaft center. The processor then calculates and compares the shafts centerlines and determines the necessary adjustments needed to move the shafts into coaxial alignment.