G01B15/045

Image generating apparatus, imaging system including image generating apparatus and operating method of imaging system

Provided is an operating method of an imaging system, the operating method including illuminating, by a light illuminator, light onto a subject from a light source, acquiring, by an optical detector, a two-dimensional projection image on the subject, generating a first projection matrix between three-dimensional coordinates of the subject and two-dimensional coordinates of the projection image, generating a three-dimensional first volume image on the subject on the basis of the first projection matrix and the projection image, generating a two-dimensional digitally reconstructed radiograph (DRR) on the subject from the first volume image, matching the projection image and the DRR, and updating the first projection matrix on the basis of a matched result to generate a second projection matrix, and generating a three-dimensional second volume image on the subject on the basis of the second projection matrix and the projection image.

ASSISTED CORROSION AND EROSION RECOGNITION

Systems, methods, and computer readable medium are provided for determining a wall loss measurement associated with corrosion and/or erosion present within an insulated pipe. A inspection image is acquired for a pipe wall of an insulated pipe at a first location and used to determine an inspection thickness of the pipe wall at the first location. An amount of wall loss measurement can be determined based on a difference of a nominal thickness for the pipe wall at the first location and the determined inspection thickness. The wall loss measurement can characterize an amount of wall material lost due to corrosion and/or erosion present in the pipe wall at the first location. The wall loss measurement can be output for further processing and/or display.

COMPUTER-IMPLEMENTED METHOD FOR DETERMINING A LOCAL DEVIATION OF A GEOMETRY OF AN OBJECT FROM A TARGET GEOMETRY OF THE OBJECT
20210118164 · 2021-04-22 ·

Described is determining a local deviation of a geometry of an object from a target geometry of the object on the basis of a digital representation of the object that comprises image information items that each specify a value of a measurand for the object at a defined position of the object. This includes determining the object representation, determining a distance field from the image information items of the object representation that comprises distance values for a specific point of the distance field that specifies the shortest distance of the point from a closest material boundary of the geometry of the object, determining the target geometry of the object, and determining the local deviation of the geometry of the object from the target geometry of the object at a test point on a material boundary predefined by the target geometry.

Method for measuring amount of applied coating
10982956 · 2021-04-20 · ·

The method includes: a first profile generation step of generating a first profile of irregularities in a measurement range set on the substrate sheet (2), based on first measurement information acquired at a location upstream of the coating machine (30) and indicating a shape of irregularities of the substrate sheet (2); a second profile generation step of generating a second profile of irregularities in the measurement range, based on second measurement information acquired at a location downstream of the coating machine (30) and indicating the shape of the irregularities of the substrate sheet (2); and a coating amount calculation step of calculating the amount of the applied coating from a difference between the first measurement information and the second measurement information, based on a positional relationship in which the shape of the first profile of irregularities and the shape of the second profile of irregularities are matched to each other.

A Method and System for Determining the Location of Artefacts and/or Inclusions in a Gemstone, Mineral, or Sample Thereof

A method and system for determining a location of artefacts and/or inclusions in a gemstone, mineral or sample thereof, the method comprising the steps of: surface mapping a gemstone, mineral or sample thereof to determine surface geometry associated with at least a portion of a surface of the gemstone, mineral or sample thereof; sub-surface mapping the gemstone, mineral or sample thereof using an optical beam that is directed at the surface along an optical beam path, wherein the optical beam is generated by an optical source using an optical tomography process; determining a surface normal at the surface at an intersection point between the optical beam path and the determined surface geometry; determining relative positioning between the surface normal and the optical beam path; and determining the location of artefacts and/or inclusions in the gemstone, mineral or sample thereof based on the sub-surface mapping step and the determined relative positioning.

System and Method to Adjust A Kinetics Model of Surface Reactions During Plasma Processing

A system is disclosed, in accordance with one or more embodiments of the present disclosure. The system includes a metrology tool configured to acquire one or more measurements of a portion of a sample. The system includes a controller including one or more processors configured to execute program instructions causing the one or more processors to: generate a surface kinetics model output based on a surface kinetics model; determine an expected response of the surface kinetics model output to excitation by polarized light; compare the determined expected response to the one or more measurements; generate one or more metrics based on the comparison between the determined expected response and the one or more measurements of the sample; adjust one or more parameters of the surface kinetics model to generate an adjusted surface kinetics model; and apply the adjusted surface kinetics model to simulate on-sample performance during plasma processing.

CALIBRATION METHOD OF X-RAY MEASURING DEVICE

A calibration method of an X-ray measuring device includes: a front-stage feature position calculation step of parallelly moving spheres disposed in N places a plurality of times, and identifying centroid positions ImPos(1 to Q)_Dis(1 to M)_Sphr_(1 to N) of projected images of the spheres in the N places; an individual matrix calculation step of calculating an individual projection matrix PPj (j=1 to Q) for each of the spheres; an individual position calculation step of calculating moving positions Xb of the spheres on the basis of the individual projection matrix PPj (j=1 to Q); a coordinate integration step of calculating specific relative position intervals X(1 to N) of the spheres; a rear-stage feature position calculation step; a transformation matrix calculation step of calculating a projective transformation matrix Hk (k=1 to Q); a rotation detection step; a position calculation step; and a center position calculation step.

Dual scan method for detecting a fibre misalignment in an elongated structure

The present disclosure relates to a method for detecting a fibre misalignment in an elongated structure, such as a wind turbine blade component. The elongated structure has a length along a longitudinal direction and comprises a plurality of stacked reinforcing fibre layers. The plurality of fibre layers comprises fibres having an orientation aligned, unidirectionally, substantially in the longitudinal direction. The method comprises scanning a surface of the elongated structure for identifying one or more surface irregularities, selecting one or more regions of interest comprising said one or more surface irregularities, examining said region of interest using penetrating radiation, and determining a position and/or size of the fibre misalignment based on said examining step.

Method and device for determining the geometry of structures by means of computer tomography
10900777 · 2021-01-26 · ·

A method for determining the geometry of a structure on an object at least by using a computer tomography sensor system comprising at least a radiation source, a mechanical axis of rotation, and a detector, preferably a planar detector, wherein surface measurement points are generated by the computer tomography sensor system, for example in the region of material transitions. In order to select the surface measurement points to be used for the determination of a geometry feature by using any target geometry, in particular without the availability of a CAD model being necessary, according to the invention, in order to determine the geometry features, surface measurement points are used which are associated with the geometry features to be determined on the basis of specifiable rules and the geometry features are determined from the associated surface measurement points.

DETERMINING THE THICKNESS PROFILE OF WORK PRODUCTS

A processing system (10) and a corresponding method are provided for processing work products (WP), including food items, to locate and quantify voids, undercuts and similar anomalies in the work products. The work products are conveyed past an X-ray scanner (14) by a conveyance device (12). Data from the X-ray scanning is transmitted to control system (18). Simultaneously with the X-ray scanning of the work product, the work product is optically scanned at the same location on the work product where X-ray scanning is occurring. The data from the optical scanner is also transmitted to the control system. Such data is analyzed to develop or generate the thickness profile of the work product. From the differences in the thickness profiles generated from the X-ray scanning data versus the optical scanning data, the location of voids, undercuts and similar anomalies can be determined by the control system. This information is used by the processing system (10) to process the work product as desired, including adjusting for the locations and sizes of voids, undercuts and similar anomalies present in the work product.