Patent classifications
G01B21/24
DOOR ATTACHMENT METHOD, AND DOOR MOVING DEVICE AND SAGGING MEASUREMENT DEVICE USED THEREFOR
A door attachment method assembles a door with a high degree of accuracy. Embodiments include a primary fastening step of bolting hinges to attachment surfaces of a vehicle body; a door panel position measurement step of measuring a relative position of a door panel in an opening when a door is brought into a cantilevered state and the hinges are fastened; a loosening step of loosening the fastening; a door position correction step of moving the door within the attachment surfaces based on a measurement result in the door panel position measurement step; and a secondary fastening step of re-fastening the hinges to the attachment surfaces. Throughout the primary fastening step, the door panel position measurement step, the loosening step, the door position correction step, and the secondary fastening step, a state where clamps respectively grip the hinges to cause the hinges to abut the attachment surfaces is maintained.
DOOR ATTACHMENT METHOD, AND DOOR MOVING DEVICE AND SAGGING MEASUREMENT DEVICE USED THEREFOR
A door attachment method assembles a door with a high degree of accuracy. Embodiments include a primary fastening step of bolting hinges to attachment surfaces of a vehicle body; a door panel position measurement step of measuring a relative position of a door panel in an opening when a door is brought into a cantilevered state and the hinges are fastened; a loosening step of loosening the fastening; a door position correction step of moving the door within the attachment surfaces based on a measurement result in the door panel position measurement step; and a secondary fastening step of re-fastening the hinges to the attachment surfaces. Throughout the primary fastening step, the door panel position measurement step, the loosening step, the door position correction step, and the secondary fastening step, a state where clamps respectively grip the hinges to cause the hinges to abut the attachment surfaces is maintained.
ENHANCED SENSOR ALIGNMENT
Devices, systems, and methods are provided for enhanced sensor alignment. A device may determine a first array of displacement sensors proximate to a first test structure. The device may determine a second array of displacement sensors proximate to a second test structure. The device may apply a test condition to the first array, the second array, the first test structure, and the second test structure. The device may collect a first output from applying the test condition to the first test structure. The device may collect a second output from applying the test condition to the second test structure. The device may generate a first deviation vector associated with the first output. The device may generate a second deviation vector associated with the second output. The device may determine a first design status of the first structure based on the first deviation vector. The device may determine a second design status of the second structure based on the second deviation vector.
SAMPLE CONTAINER SPRING CHECK APPARATUS
An apparatus for measuring an angle between a longitudinal axis of a sample container inserted into an opening of a sample container carrier and a reference ray, the apparatus comprising a first accelerometer being fixable to the sample container and being adapted to generate a number of first accelerometer signals being dependent on the orientation of the sample container, and a calculation unit being coupled to the first accelerometer and being adapted to calculate the angle depending on the number of first accelerometer signals.
SAMPLE CONTAINER SPRING CHECK APPARATUS
An apparatus for measuring an angle between a longitudinal axis of a sample container inserted into an opening of a sample container carrier and a reference ray, the apparatus comprising a first accelerometer being fixable to the sample container and being adapted to generate a number of first accelerometer signals being dependent on the orientation of the sample container, and a calculation unit being coupled to the first accelerometer and being adapted to calculate the angle depending on the number of first accelerometer signals.
Active beam joint brace
The Active Beam Joint Brace (ABJB) is an improvement or a compliment to the current technology of protecting steel beam structured buildings such as tuned mass dampers near the top floors of sky scrapers and large shock absorbers to reduce sway due to high winds and earthquakes. The ABJB can be also used in any type of structure i.e. bridges. It is positioned near the joint of two of the beams and therefore does not interfere with the placement of doors and windows. There are two embodiments of the ABJB: 1. A basic ABJB 2. A smart ABJB The basic ABJB reacts to any distortion of the protected beam joint and applies a counter force to the two beams in than joint. The smart ABJB is also able to forecast some of the remaining wave forces in an earthquakes duration (from the first wave forms) and proactively apply counter forces (i.e. a Rayleigh Wave). It may also adjust the frequency, magnitude and direction in combination with the other ABJB's in the structure based on the properties of the external force on the structure. Additional sensors, such as strain gauges, wind speed sensors, wind direction sensors and accelerometers can be used to gather more data about any distortion of the beam structure which can then be utilized with an intelligent algorithm to forecast and proactively resist the beam structure from distorting due to external forces.
Active beam joint brace
The Active Beam Joint Brace (ABJB) is an improvement or a compliment to the current technology of protecting steel beam structured buildings such as tuned mass dampers near the top floors of sky scrapers and large shock absorbers to reduce sway due to high winds and earthquakes. The ABJB can be also used in any type of structure i.e. bridges. It is positioned near the joint of two of the beams and therefore does not interfere with the placement of doors and windows. There are two embodiments of the ABJB: 1. A basic ABJB 2. A smart ABJB The basic ABJB reacts to any distortion of the protected beam joint and applies a counter force to the two beams in than joint. The smart ABJB is also able to forecast some of the remaining wave forces in an earthquakes duration (from the first wave forms) and proactively apply counter forces (i.e. a Rayleigh Wave). It may also adjust the frequency, magnitude and direction in combination with the other ABJB's in the structure based on the properties of the external force on the structure. Additional sensors, such as strain gauges, wind speed sensors, wind direction sensors and accelerometers can be used to gather more data about any distortion of the beam structure which can then be utilized with an intelligent algorithm to forecast and proactively resist the beam structure from distorting due to external forces.
Reflectometer to monitor substrate movement
Various embodiments include a reflectometer and a reflectometry system for monitoring movements of a substrate, such as a silicon wafer. In one embodiment, a reflectometry system monitors and controls conditions associated with a substrate disposed within a process chamber. The process chamber includes a substrate-holding device having an actuator mechanism to control movement of the substrate with respect to the substrate-holding device. The reflectometry system includes a light source configured to emit a beam of light directed at the substrate, collection optics configured to receive light reflected from the substrate by the beam of light directed at the substrate and output a signal related to one or more conditions associated with the substrate, and a processor configured to process the signal and direct the actuator mechanism to control the movement of the substrate with respect to the substrate-holding device based on the signal. Other devices and methods are disclosed.
Reflectometer to monitor substrate movement
Various embodiments include a reflectometer and a reflectometry system for monitoring movements of a substrate, such as a silicon wafer. In one embodiment, a reflectometry system monitors and controls conditions associated with a substrate disposed within a process chamber. The process chamber includes a substrate-holding device having an actuator mechanism to control movement of the substrate with respect to the substrate-holding device. The reflectometry system includes a light source configured to emit a beam of light directed at the substrate, collection optics configured to receive light reflected from the substrate by the beam of light directed at the substrate and output a signal related to one or more conditions associated with the substrate, and a processor configured to process the signal and direct the actuator mechanism to control the movement of the substrate with respect to the substrate-holding device based on the signal. Other devices and methods are disclosed.
METHOD FOR DETECTING A BLADE MISALIGNMENT OF A ROTOR BLADE OF A ROTOR OF A WIND TURBINE
Provided is a method for detecting at least one blade misalignment of a rotor blade of a rotor of a wind turbine having multiple rotor blades adjustable in their blade angle. The blade misalignment describes a blade angle deviation of a detected blade angle of the rotor blade from a reference blade angle. The wind turbine includes a gondola having the rotor and an azimuth adjustment device in order to adjust the gondola in an azimuth alignment having an azimuth angle, and to adjust the azimuth alignment. The azimuth angle is tracked using the azimuth adjustment device to a predeterminable azimuth setpoint angle, and the blade misalignment is detected as a function of an azimuth movement of the gondola. Provided herein is detection of aerodynamic imbalances with reduced costs.