Patent classifications
G01B2210/44
SENSOR DEVICE
The invention relates to a sensor device for examining the coating of a disc as part of a coating process. The sensor device comprises a first optical sensor system for determining the layer thickness of the coating applied to the disc, and comprises a rotation apparatus. The invention is characterized in that the first optical sensor system is designed to simultaneously identify at least one first position-based measured value and one second position-based measured value, the first and the second position-based measured value describing the distance between the sensor systems and the surface of the disc. As a result of this, the sensor system is configured such that the first position-based measured value of a coated region of the disc and the second position-based measured value of an uncoated region of the disc are identified. Furthermore, the first optical sensor system comprises at least one linear guide, which extends from the central region to the edge. In addition, a control and analysis apparatus is provided for calculating the layer thickness of the disc at the position of the first position-based measured value with the aid of the first and the second position-based measured value. Furthermore, the invention relates to a coating for a disc, comprising inspecting the coating for determining the layer thickness of the coating applied to the disc.
LENS REFRACTIVE INDEX DETECTION DEVICE AND METHOD
A lens refractive index detection device is disclosed which has a light source module, a lens center physical thickness detection module and a lens center optical thickness detection module. The light source module includes a first light source component and a second light source component for outputting a collimated light beam, a first light combining component, and a focusing component. The lens center physical thickness detection module includes a first imaging component and a second imaging component. The lens center optical thickness detection module includes a first photodetection component and a second photodetection component, a beam splitting component, a partial reflection mirror, and a movable reflection mirror. The lens refractive index detection device enables simple operation, fast and non-destructive on-line detection, and is also applicable to lenses with irregular surfaces, such as aspherical lenses, cylindrical lenses, and finished lenses. A lens refractive index detection method is also provided.
System and Method for Enhancing Data Processing Throughput Using Less Effective Pixel While Maintaining Wafer Warp Coverage
An inspection system is disclosed. In one embodiment, the inspection system includes an interferometer sub-system configured to acquire an interferogram of a sample. The inspection system may further include a controller communicatively coupled to the interferometer sub-system. The controller is configured to: receive the interferogram from the interferometer sub-system; generate a phase map of the sample based on the received interferogram, wherein the phase map includes a plurality of pixels; select a sub-set of pixels of the plurality of pixels of the phase map to be used for phase unwrapping procedures; perform one or more phase unwrapping procedures on the sub-set of pixels of the phase map to generate an unwrapped phase map; and generate a surface height map of the sample based on the unwrapped phase map.
Non-contact sheet material thickness measurement system
A non-contact thickness measurement system includes a first optical displacement sensor in a first scanner head and a second optical displacement sensor in a second scanner head on opposite sides of a sheet material. The displacement sensors measure a plurality of distances to a first line in a first direction along the top of the material and plurality of distances to a second line in a second direction along a bottom of the material. An x,y position sensor determines x,y position data. A z-position sensor measures a sensor-to-sensor distance. A computing device determines a projected intersection point of the first and second lines, and using the projected intersection point selects a first distance from the distances from first displacement sensor and a second distance from the distances from the second displacement sensor, and for calculating a sheet material thickness using the first distance, second distance, and the sensor-to-sensor distance.
NON-CONTACT SHEET MATERIAL THICKNESS MEASUREMENT SYSTEM
A non-contact thickness measurement system includes a first optical displacement sensor in a first scanner head and a second optical displacement sensor in a second scanner head on opposite sides of a sheet material. The displacement sensors measure a plurality of distances to a first line in a first direction along the top of the material and plurality of distances to a second line in a second direction along a bottom of the material. An x,y position sensor determines x,y position data. A z-position sensor measures a sensor-to-sensor distance. A computing device determines a projected intersection point of the first and second lines, and using the projected intersection point selects a first distance from the distances from first displacement sensor and a second distance from the distances from the second displacement sensor, and for calculating a sheet material thickness using the first distance, second distance, and the sensor-to-sensor distance.
APPARATUS AND METHODS FOR THICKNESS AND VELOCITY MEASUREMENT OF FLAT MOVING MATERIALS USING HIGH FREQUENCY RADAR TECHNOLOGIES
An apparatus and associated methods for measuring thickness and velocity of flat moving materials utilizing high frequency radar technologies. Two identical radar-based systems for measuring absolute distances between the source of the radar-generated electromagnetic wave and each surface of a flat sheet material is used to determine the thickness of that material as a relative distance. A pair of high frequency radars situated at different locations used to measure the delay time between the occurrences of fingerprint-like unevenness on the moving flat sheet of material to determine the linear velocity of the moving material sheet.
Device for the contactless three-dimensional inspection of a mechanical component with toothing
An inspection device for contactless three-dimensional inspection of a circular, mechanical component with toothing having a main axis of rotation. The device is configured to scan the teeth by at least one first pair of laser measurement modules and rotationally drive the component about the main axis relative to the laser measurement modules. The device then rebuilds a virtual three-dimensional representation of the component using data coming from said scanning and performs a dimensional inspection using the three-dimensional representation. Each pair of modules includes a first module oriented towards a first face of a tooth and a second module oriented towards a second face of a tooth. The modules are oriented relative to the component so that during a rotation of the component, the laser measurement modules scan the first and second faces of each tooth throughout their thickness and depth.
Measurement system and method of manufacturing shaft with hole
A measurement system includes a measuring instrument, a measurement control device, and a ranging device. The measuring instrument includes a base that is to be fixed to a tool shaft of a machining apparatus, a first rod and a second rod that are connected to the base, and a first measuring head and a second measuring head that are fixed to the respective rods and irradiate an object to be measured with measurement light. The measurement control device acquires a distance I between the first measuring head and an inner peripheral surface of the hole of the object to be measured, and a distance O between the second measuring head and an outer peripheral surface of the object from the ranging device, and calculates the thickness of the object on the basis of the distance I, the distance O, and a distance between the first and second measuring heads.
System and method for determining tow parameters
A system for determining one or more characteristics of a carbon fiber tow. The system including a first laser profilometer, a second laser profilometer, and a controller. The first laser profilometer is located on a first side of the carbon fiber tow. The second laser profilometer is located on a second side of the carbon fiber tow. The controller is configured to receive, from the first profilometer, a first profile of the first side of the carbon fiber tow, and receive, from the second profilometer, a second profile of the second side of the carbon fiber tow. The controller is further configured to determine at least one characteristic selected from a group consisting of a tow width of the carbon fiber tow, a tow fuzz of the carbon fiber tow, a tow thickness of the carbon fiber tow, and a tow angle of the carbon fiber tow, the at least one characteristic based on the first profile and the second profile. The controller further configured to output the at least one characteristic of the carbon fiber tow.
Solder printing inspection device
A solder printing inspection device that inspects a printing state of solder paste printed on a substrate having a through hole into which a lead terminal of an insertion component is inserted, the solder printing inspection device including: a non-printing face side illuminator that irradiates an inspection range on a non-printing face side with a predetermined light, wherein the non-printing face side is opposite to a printing face side, out of a surface and a rear face of the substrate; a non-printing face side camera that takes an image of the inspection range on the non-printing face side of the substrate irradiated with the predetermined light; and a controller that executes inspection with regard to the solder paste in the inspection range, based on image data with regard to the inspection range on the non-printing face side of the substrate taken by the non-printing face side camera.