A thermal regulation system includes an inertial measurement unit (IMU), one or more temperature adjusting devices in thermal communication with the IMU, and configured to adjust a temperature of the IMU from an initial temperature to a predetermined temperature, a filler provided in a space between the IMU and at least one temperature adjusting device of the one or more temperature adjusting devices, and a shared substrate configured to bear a weight of the IMU and the one or more temperature adjusting devices. The shared substrate includes a metallic board.

The disclosure relates to a method and a device for determining an ambient pressure that prevails around a control unit. The control unit includes a housing, which has an opening, and a membrane having a particular permeability, which covers the opening. A pressure sensor is arranged inside the housing. The method includes: recording a pressure measurement value with the pressure sensor, the pressure measurement value being characteristic of an internal pressure inside the housing; determining a correction value, which includes a constant and a variable; and determining the ambient pressure by way of the pressure measurement value that has been determined and the correction value that has been determined.

Disclosed is a sensor assembly comprising: a first mounting device for mounting the sensor assembly to a first fixation part; a second mounting device for mounting the sensor assembly to a second fixation part, the second fixation part being displaceable relative to the first fixation part; and a sensor device arranged in a sensor cavity for provision of a sensor signal, the sensor device comprising a first attachment part attached to the first mounting device, a second attachment part attached to the second mounting device, and a sensing part, the sensing part being arranged between the first attachment part and the second attachment part.

A system may include a sensor configured to output a sensor signal indicative of a distance between the sensor and a mechanical member associated with the sensor, a measurement circuit communicatively coupled to the sensor and configured to determine a physical force interaction with the mechanical member based on the sensor signal, and a compensator configured to monitor the sensor signal and to apply a compensation factor to the sensor signal to compensate for changes to properties of the sensor based on at least one of changes in a distance between the sensor and the mechanical member and changes in a temperature associated with the sensor.

Angular position sensor system comprising: a cylindrical magnet rotatable about a rotation axis; and an angular position sensor device comprising: a substrate comprising a plurality of magnetic sensitive elements configured for measuring a first magnetic field component in a first direction and a second magnetic field component in a second direction perpendicular to the first direction; and a processing circuit configured for calculating the angular position; the sensor device being oriented such that the first direction is oriented in a circumferential direction, and the second direction is either parallel or orthogonal to the rotation axis; the sensor device being located at a predefined position where a magnitude of a third magnetic field component orthogonal to the first and second magnetic field component is negligible over the 360° angular range.

An example device includes a first gradiometer that includes a first set of sensing elements aligned along a first axis, a second gradiometer that includes a second set of sensing elements aligned along a second axis, and a controller. The first set of sensing elements and the second set of sensing elements may be configured to sense a set of magnetic field components that are perpendicular to the rotational axis, wherein the first axis is in a first plane and the second axis is in a second plane, and the first plane and the second plane may be perpendicular to a rotational axis of a rotatable object. The controller may obtain, via the first gradiometer and the second gradiometer, the set of components of the magnetic field. The controller may then determine, based on obtaining the set of components of the magnetic field, the angular position of the rotatable object.

An example device includes a first gradiometer that includes a first set of sensing elements aligned along a first axis, a second gradiometer that includes a second set of sensing elements aligned along a second axis, and a controller. The first set of sensing elements and the second set of sensing elements may be configured to sense a set of magnetic field components that are perpendicular to the rotational axis, wherein the first axis is in a first plane and the second axis is in a second plane, and the first plane and the second plane may be perpendicular to a rotational axis of a rotatable object. The controller may obtain, via the first gradiometer and the second gradiometer, the set of components of the magnetic field. The controller may then determine, based on obtaining the set of components of the magnetic field, the angular position of the rotatable object.

A sensor system includes a first sensor, a second sensor, and a control in electrical communication with the first and second sensors. The controller includes a memory for storing data configured to store an offset profile for the at least one output of the first sensor. The offset profile includes a plurality of offset values, which is calculated using measured outputs of the first sensor determined while a position of a conductive material is maintained and a temperature of surrounding atmosphere is varied.

A system includes a first optical sensor sensitive to both a parameter of interest, Parameter1, and at least one confounding parameter, Parameter2 and a second optical sensor sensitive only to the confounding parameter. Measurement circuitry measures M.sub.1 in response to light scattered by the first optical sensor, where M.sub.1=value of Parameter1+K*value of Parameter2. The measurement circuitry also measures M.sub.2 in response to light scattered by the second optical sensor, where M.sub.2=value of Parameter2. Compensation circuitry determines a compensation factor, K, for the confounding parameter based on measurements of M.sub.1 and M.sub.2 taken over multiple load/unload cycles or over one or more thermal cycles. The compensation factor is used to determine the parameter of interest.

A system includes a first optical sensor sensitive to both a parameter of interest, Parameter1, and at least one confounding parameter, Parameter2 and a second optical sensor sensitive only to the confounding parameter. Measurement circuitry measures M.sub.1 in response to light scattered by the first optical sensor, where M.sub.1=value of Parameter1+K*value of Parameter2. The measurement circuitry also measures M.sub.2 in response to light scattered by the second optical sensor, where M.sub.2=value of Parameter2. Compensation circuitry determines a compensation factor, K, for the confounding parameter based on measurements of M.sub.1 and M.sub.2 taken over multiple load/unload cycles or over one or more thermal cycles. The compensation factor is used to determine the parameter of interest.