An apparatus for adhering a filament to a surface can include a body having a filament inlet port, at least a first filament outlet port spaced apart from the filament inlet port, and at least a first filament travel path extending between the filament inlet port and the first filament outlet port. A reservoir chamber can form a portion of the first filament travel path between the filament inlet port and the first filament outlet port and can contain a viscous adhesive material. Imparting relative axial movement between the body and a first filament can urge the first filament along the first filament travel path and through the reservoir chamber so that the first filament is coated with the viscous adhesive material when exiting via the first filament outlet port, for adhesion to the surface.

The invention relates to a cultivation system comprising a cultivation container, in particular a hand-held cultivation container, preferably in the form of a shake flask, for holding a culture medium, the cultivation container having a neck and an opening extending through the neck, and a container attachment that can be placed on the neck of the cultivation container so as to close the opening of the cultivation container, in particular in a sterile manner, the container attachment having an inner side and an outer side, the inner side facing the interior of the cultivation container and the outer side facing the exterior of the cultivation container when the container attachment is placed on the neck of the cultivation container, wherein the container attachment comprises at least one sensor unit or a port for installing a sensor unit, the sensor unit being at least partially arranged or arrangeable on the inner side of the container attachment, to provide for parameter measurement in the interior of the cultivation container, and/or wherein the container attachment comprises at least one dispensing unit or a port for installing a dispensing unit, the dispensing unit being at least partially arranged or arrangeable on the inner side of the container attachment, to enable liquid to be dispensed into the interior of the cultivation container.

An optical displacement sensing system is provided. With configuration of an optical sensor disposed on a displacement platform and in cooperation with a broadband light source and an optical spectrum analyzer, when the displacement platform moves, the waveguide grating of the optical sensor is resonated and the reflected light provided with a resonance wavelength is formed. The waveguide grating has the plurality of grating periods, and when the displacement platform moves to a different position to make the broadband light source correspond to a different grating period, the position can correspond to the different resonance wavelength. Therefore, according to the aforementioned configuration, the position is determined according to the different resonance wavelength, instead of using an optical encoder; furthermore, the micrometer-scale or nanometer-scale displacement detection is achieved.

The present invention relates to a method of fabricating a nanowire connected to an optical fiber, the method comprising the steps of: a) filling a micropipette with a material solution to form a nanowire; b) coaxially aligning the micropipette with the optical fiber at one end of the optical fiber such that a longitudinal axis of the optical fiber and a longitudinal axis of the micropipette are aligned in a line; c) forming a meniscus of the material solution to form the nanowire in the coaxially aligned state; and d) fabricating the nanowire by evaporating a solvent from the material solution to form the nanowire while lifting the micropipette in a state in which the meniscus is formed, in a direction away from the optical fiber. The method further comprises a step of a step of controlling a shape of the distal end of the nanowire by irradiating a laser to the nanowire fabricated.

Disclosed herein is an optical cable comprising a support; flexible protective tubes helically wound around the support, each flexible protective tube comprising an optical fiber comprising an optical core; a cladding disposed on the core; and a primary coating external to the cladding; and a deformable material surrounding the optical fiber; an outer jacket surrounding the flexible protective tubes; wherein each optical fiber is about 0.5% to about 1.5% longer than its respective flexible protective tube; wherein an allowable strain on the optical cable with substantially zero stress on the optical fibers is determined by equations (1) and (2) below: $\begin{array}{c}\mathrm{.Math.}=\underset{\_}{\sqrt{{{\pi }^2\left(D+\frac{d}{2}\right)}^2+p^2}}\underset{}{\sqrt{{{\pi }^2(D-\frac{d}{2}}^{}}}\end{array}$

A method for determining a location of a proppant in a subterranean formation includes obtaining a first set of data in a wellbore using a downhole tool. The proppant is pumped into the wellbore after the first set of data is obtained. The proppant is pumped while or after the subterranean formation is fractured. A second set of data is obtained in the wellbore using the downhole tool after the proppant is pumped into the wellbore. The first set of data and the second set of data include a gravitational field measurement. The first and second sets of data are compared, and in response to the comparison, the location of the proppant in the subterranean formation is determined.

A system is provided with a measurement system having a light source, a light sensor, and a controller coupled to the light source and the light sensor. The controller is configured to determine a clearance between a rotor and a casing at least partially based on an interruption of light transmitted from the light source to the light sensor.

A test system includes a semiconductor die and an integrated optical/electrical probe card. Electrical, optical, and optoelectronic devices reside in the semiconductor die. Electrical pads in the semiconductor die connect to the electrical and optoelectronic devices. Grating couplers in the semiconductor die connect to the optical device and optoelectronic devices. The electrical pads and grating couplers are interspersed in substantially a single line in the semiconductor die. The integrated optical/electrical probe card interfaces with the electrical pads by electrical needles, and concurrently interfaces with the grating couplers by optical fibers.

Examples of an integrated active fiber optic temperature measuring device are disclosed. The integrated temperature measuring device comprises a fiber optic probe and an optoelectronic circuitry integrated into a single device which is then individually calibrated. The fiber optic probe has a fiber bundle with an active material at the tip of the probe. The optoelectronic circuitry is connected to the fiber optic probe. The optoelectronic circuitry includes a light source configured to provide an excitation light to the active material, a detector to detect the emitted light, a processing unit configured to determine a temperature based on a change in an emission intensity at a single wavelength range or the change in intensity ratio of two or more wavelength ranges, a lifetime decay, or a shift in emission wavelength peak of the emitted light, and a calibration means configured to calibrate the integrated active fiber optic temperature sensor.

Embodiments disclosed herein include a substrate support having a sensor assembly, and processing chamber having the same. In one embodiment, a substrate support has a puck. The puck has a workpiece support surface and a gas hole exiting the workpiece support surface. A sensor assembly is disposed in the gas hole and configured to detect a metric indicative of a deflection of a workpiece disposed on the workpiece support surface, wherein the sensor assembly is configured to allow gas to flow past the sensor assembly when positioned in the gas hole.