A device for imaging light, or a source of the light, includes a window for receiving incident light from the source, at least one metasurface, and at least one wedge prism. The metasurface and the wedge prism form a Risley pair and are displaced independently of each other. Each of the metasurface and the wedge prism are operative to deflect the incident light at an angle that is different from an angle of light incident upon them. Each metasurface includes a plurality of sub-wavelength structures that are operative to interact with the incident light received from the window. The device also includes a lens system that is operative to transmit the incident light received from the at least one metasurface and the at least one wedge prism and focuses it on a focal plane.

The invention relates to an ion surface trap (10) with (a) an electrode pair (12) that comprises a first trap electrode (14.1) and a second trap electrode (14.2) and is configured to form a trap volume for at least one ion (22) when an electrical AC voltage is applied, (b) at least two AC voltage electrodes (16) arranged to close the trap volume and/or generate an electrical field, by means of which an ion position of an ion (22) trapped in the ion surface trap can be modified relative to the ion surface trap (10), and (c) a sensor for detecting photons (20) emitted by at least one ion (22), wherein (d) the sensor is an energy-sensitive measuring superconductor sensor (18) that has a superconductor layer/separating layer/superconductor layer structure and (e) at least the first superconductor layer (24, 28) forms the first trap electrode (14).

A gauge that is configured to detect a time at which radiation enters the gauge. The gauge may include a member that is configured to transition from a first state to a second state upon receipt of the incoming radiation, and may include a light probe that is configured to detect when the member transitions to the second state. The gauge may provide for determining a time of arrival of the radiation at another gauge. For example, the gauge may correlate the time of arrival at the gauge with the another gauge, thereby providing for correlating a response time of a test specimen with actual exposure time of the test specimen to radiation (e.g., an ion beam).