A calibration system is provided including an aperture layer, a lens layer, an optical filter, a pixel layer and a regulator. The aperture layer defines a calibration aperture. The lens layer includes a calibration lens substantially axially aligned with the calibration aperture. The optical filter is adjacent the lens layer opposite the aperture layer. The pixel layer is adjacent the optical filter opposite the lens layer and includes a calibration pixel substantially axially aligned with the calibration lens. The calibration pixel detects light power of an illumination source that outputs a band of wavelengths of light as a function of a parameter. The regulator modifies the parameter of the illumination source based on a light power detected by the calibration pixel.

A calibration system is provided including an aperture layer, a lens layer, an optical filter, a pixel layer and a regulator. The aperture layer defines a calibration aperture. The lens layer includes a calibration lens substantially axially aligned with the calibration aperture. The optical filter is adjacent the lens layer opposite the aperture layer. The pixel layer is adjacent the optical filter opposite the lens layer and includes a calibration pixel substantially axially aligned with the calibration lens. The calibration pixel detects light power of an illumination source that outputs a band of wavelengths of light as a function of a parameter. The regulator modifies the parameter of the illumination source based on a light power detected by the calibration pixel.

This optical system includes: a device (106) for generating a plane light wave, called a collimated light wave (OL.sub.col); and a device (114) for deviating the collimated light wave so as to provide a light wave, called a test light wave (OL.sub.test), the deviating device (114) having an adjustable focal length.

This optical system includes: a device (106) for generating a plane light wave, called a collimated light wave (OL.sub.col); and a device (114) for deviating the collimated light wave so as to provide a light wave, called a test light wave (OL.sub.test), the deviating device (114) having an adjustable focal length.

A method of estimating non-linearity in a response of an optical detector comprises emitting optical radiation at different intensities. The method includes, at each intensity: amplitude modulating the emitted optical radiation at a modulating frequency to produce amplitude modulated optical radiation; detecting the amplitude modulated optical radiation with the optical detector to produce a detected waveform; and generating a Fourier transform of the detected waveform that includes a fundamental frequency equal to the modulating frequency and harmonics thereof. The method further includes estimating the non-linearity in the response of the optical detector based on a change in an amplitude of a second harmonic of the fundamental frequency relative to an amplitude of the fundamental frequency across the Fourier transforms corresponding to the different intensities.

Operational parameters of a single-photon detector are determined with a continuous wave laser source. At a fixed trigger, a dark count probability and a series of count probabilities at different optical powers are determined. A particular optical power is selected by using a wide-range variable attenuator to attenuate the optical power of the continuous wave laser. The dark count probability and the count probabilities are determined for different trigger rates. The operational parameters include efficiency, afterpulsing constant, and detrap time. The operational parameters are computed by fitting the computed dark count probabilities and count probabilities to a user-defined relationship.

Operational parameters of a single-photon detector are determined with a continuous wave laser source. At a fixed trigger, a dark count probability and a series of count probabilities at different optical powers are determined. A particular optical power is selected by using a wide-range variable attenuator to attenuate the optical power of the continuous wave laser. The dark count probability and the count probabilities are determined for different trigger rates. The operational parameters include efficiency, afterpulsing constant, and detrap time. The operational parameters are computed by fitting the computed dark count probabilities and count probabilities to a user-defined relationship.

A broadband calibrator assembly is provided and includes a medium/long wave infrared (MW/LW IR) assembly and multiple ultraviolet (UV)/visible and near IR (VNIR)/short wave IR (SWIR) assemblies.

A broadband calibrator assembly is provided and includes a medium/long wave infrared (MW/LW IR) assembly and multiple ultraviolet (UV)/visible and near IR (VNIR)/short wave IR (SWIR) assemblies.

A stroboscope with an integral optical reflective sensor, which can be removable or fixed, contains a light emitting source, a light sensitive receiver, a pulse conditioning circuit, a stroboscope circuit, a blanking circuit, and a stroboscope light source. The light emitting source projects a light beam to a reflective target. The reflected light beam from the reflective target is detected by the light sensitive receiver. The pulse conditioning circuit generates a set of electrical pulses coincident with the reflected light beam which are sent to the stroboscope circuit. Depending on the signal received by the stroboscope circuit, the stroboscope light source is triggered. The blanking circuit prevents false triggering of the stroboscope light source by introducing a time delay. The time delay is applied when the stroboscope light source is switched on and for a finite time after the stroboscope light source is switch off.