A system for determining a characteristic of a laser includes a collection housing receiving a laser beam comprising a first pulse, a second pulse and a time period between the first pulse and the second pulse. A photon counting detector receives photons from the laser beam disposed to generate photon signals from the laser beam and generating a start signal. A fast diode generates a stop signal to provide a time reference of counted photons ns. A controller is coupled to the photon counting detector and the fast diode. The controller counts photons from the photon counting detector occurring during the time period between the first and second pulse and generates a first output signal corresponding to a power during the time period between the first pulse and the second pulse.

An optical measurement device includes an optical sensor which measures an optical waveform of a reference object or a measurement object, a learner which receives a first optical waveform of the reference object from the optical sensor and learns frequency characteristics of the first optical waveform, a filter generator which analyzes the frequency characteristics of the first optical waveform and generates a frequency filter, a frequency modeling unit which receives a second optical waveform of the measurement object from the optical sensor and models frequency characteristics of the second optical waveform, and an optical characteristic detector which calculates an optical characteristic index of the second optical waveform based on an output value of the frequency modeling unit and the frequency filter.

A polarization property image measurement device includes: a first radiation unit that radiates light beams in different polarization conditions onto a target object after subjecting the light beams to intensity modulation at frequencies different from one another; a light receiving unit including first photoelectric conversion units that photoelectrically convert the light beams having been radiated from the first radiation unit and scattered at the target object in correspondence to each of the different polarization conditions, and second photoelectric conversion units that photoelectrically convert visible light from the target object; and a processor that detects signals individually output from the first photoelectric conversion units at the different frequencies and differentiates each signal from other signals so as to determine an origin of the signal as one of the light beams; and creates an image of the target object based upon signals individually output from the second photoelectric conversion units.

A system and method evaluate the efficiency of circadian-effective luminaires. Such circadian-effective luminaires affect the master biological clock in the brain, which regulates the daily timings of behavioral activities and physiological functions. Disruption of circadian rhythms can lead to poor performance and poor health, while consistent exposure to bright days and dim nights is necessary for circadian entrainment, and thus for good sleep and good health. The system and method provide a standard test for assessing the efficiency of luminaires for providing circadian-effective light to building occupants. The system and method measure and quantify luminaire efficiency based on the electrical watts needed, termed SOWatt, to reach a circadian stimulus (CS) criterion of 0.3 at the eyes of a standard observer (SO). The system and method can be applied to ceiling mounted, accent, and table-top luminaires.

A device including a plurality of epitaxial chips is disclosed. An epitaxial chip can have one or more of a light source and a detector, where the detector can be configured to measure the optical properties of the light emitted by a light source. In some examples, one or more epitaxial chips can have one or more optical properties that differ from other epitaxial chips. The epitaxial chips can be dependently operable. For example, the detector located on one epitaxial chip can be configured for measuring the optical properties of light emitted by a light source located on another epitaxial chip by way of one or more optical signals. The collection of epitaxial chips can also allow detection of a plurality of laser outputs, where two or more epitaxial chips can have different material and/or optical properties.

An optical measurement device includes an optical sensor which measures an optical waveform of a reference object or a measurement object, a learner which receives a first optical waveform of the reference object from the optical sensor and learns frequency characteristics of the first optical waveform, a filter generator which analyzes the frequency characteristics of the first optical waveform and generates a frequency filter, a frequency modeling unit which receives a second optical waveform of the measurement object from the optical sensor and models frequency characteristics of the second optical waveform, and an optical characteristic detector which calculates an optical characteristic index of the second optical waveform based on an output value of the frequency modeling unit and the frequency filter.

A system for determining a characteristic of a laser includes a collection housing receiving a laser beam comprising a first pulse, a second pulse and a time period between the first pulse and the second pulse. A photon counting detector receives photons from the laser beam disposed to generate photon signals from the laser beam and generating a start signal. A fast diode generates a stop signal to provide a time reference of counted photons ns. A controller is coupled to the photon counting detector and the fast diode. The controller counts photons from the photon counting detector occurring during the time period between the first and second pulse and generates a first output signal corresponding to a power during the time period between the first pulse and the second pulse.

To calculate a regular-discharge probability of an optical sensor, a light detection system includes an optical sensor, an application voltage generating circuit that applies a drive pulse voltage to the optical sensor, a discharge determining portion that detects the optical sensor's discharge, a discharge probability calculating portion that calculates a discharge probability in a first state in which light from an additional light source having a known light quantity is incident on the optical sensor or the additional light source is turned off, and in a second state in which the additional light source's turning-on/turning-off state is different from the first state with a pulse width of the drive pulse voltage the same as the first state, a sensitivity parameter storing portion that stores sensitivity parameters of the optical sensor, and another discharge probability calculating portion that calculates a discharge probability of the optical sensor's regular discharge.

A thermal processing system for performing thermal processing can include a workpiece support plate configured to support a workpiece and heat source(s) configured to heat the workpiece. The thermal processing system can include window(s) having transparent region(s) that are transparent to electromagnetic radiation within a measurement wavelength range and opaque region(s) that are opaque to electromagnetic radiation within a portion of the measurement wavelength range. A temperature measurement system can include a plurality of infrared emitters configured to emit infrared radiation and a plurality of infrared sensors configured to measure infrared radiation within the measurement wavelength range where the transparent region(s) are at least partially within a field of view the infrared sensors. A controller can be configured to perform operations including obtaining transmittance and reflectance measurements associated with the workpiece and determining, based on the measurements, a temperature of the workpiece less than about 600° C.

A device for generating light pulses for characterization, standardization and/or calibration of photodetectors, preferably within a flow cytometer or microscope. To this end the device comprises emission light sources which are driven with predetermined waveform to emit light pulses. The device is characterized by a feedback mechanism based on the provision of separate, series-connected control light sources whose emission is detected by a feedback detector. The device may include one or more emission groups of circularly arranged, multi-color emission light sources. To provide different intensity levels, the emission light sources or emission groups can be coupled into a light guide with different efficiencies. Uses of the device and systems or kits including the device is also provided.