Embodiments of the present disclosure relate to optical devices for augmented, virtual, and/or mixed reality applications. In one or more embodiments, an optical device metrology system is configured to measure a plurality of see-through metrics for optical devices.

Disclosed herein are methods, systems, and devices for providing optimized simultaneous illumination for human vision and machine based navigation vision on a semi-autonomous vehicle. In one embodiment, a system includes a first control output configured to provide first illumination control information including first active cycle times for a first illumination source. The first illumination source is configured to provide a first frequency band of illumination for machine vision navigation of the semi-autonomous vehicle. The system further includes a second control output configured to provide second illumination control information including second active cycle times for a second illumination source. The second illumination source is configured to provide a second frequency band of illumination for a human driver of the semi-autonomous vehicle. The system further includes a first monitor input configured to receive ambient illumination information from a camera system.

A display device includes: a substrate; a display element layer disposed on the substrate, where the display element layer includes a light emitting element which emits light; a polarizing film disposed on the display element layer, where the polarizing film includes a first polarizer having a first absorption axis extending to a first direction and a first transmission axis extending to a second direction orthogonal to the first direction; and a first layer disposed on one surface of the polarizing film, where the first layer has a first phase difference. Light emitted from the display element layer has a polarizing axis, and an angle between the polarizing axis and one of the first absorption axis and the first transmission axis is in a range of about 25 degrees to about 65 degrees.

The present application provides an ambient light sensor and an electronic device, which may improve detection accuracy and detection performance of the ambient light sensor. The ambient light sensor includes: a light filtering unit array including a plurality of light filtering units, the plurality of light filtering units including a color light filtering unit, a white light filtering unit and a transparent light filtering unit, the white light filtering unit being configured to pass a visible light signal and block an infrared light signal, and the transparent light filtering unit being configured to pass the visible light signal and the infrared light signal; a pixel unit array including a plurality of pixel units, the plurality of pixel units being configured to receive a light signal after the ambient light passes through the plurality of light filtering units for an ambient light detection.

A matching method of light source parameters includes the following. First light source parameter data of a first exposure machine and second light source parameter data of a second exposure machine corresponding to the first light source parameter data are collected. Whether a second light intensity distribution included in the second light source parameter data meets a first light intensity distribution included in the first light source parameter data is determined. If the second light intensity distribution meets the first light intensity distribution, a simulated exposure process is performed by using the first light source parameter data and the second light source parameter data. Second simulated exposure data obtained by using the second light source parameter data is compared with first simulated exposure data obtained by using the first light source parameter data to determine whether the second simulated exposure data meets the first simulated exposure data.

The invention provides for a system for in vivo real time measurement of NADH recovery kinetics, comprising: 1) a specific pulse sequence to non-destructively, yet effectively, photobleach NADH for measurement of NADH recovery kinetics; 2) illumination light parameters to acquire NADH fluorescence before and after photobleaching, without causing fluorescence bleaching artifacts, for measurement of NADH recovery kinetics; and 3) configurations for devices capable of photobleaching NADH by at least 10% within tissues for effective measurement of NADH recovery kinetics in tissues within a living subject or excised tissues and organs.

A method (400) for analyzing output of lighting units (10) in a lighting system (100) includes the steps of: (i) simulating (430), based on data from a photometric database (310), the output of a lighting unit; (ii) receiving and storing (420), from a database (330) of historical information, historical observed data about the output of the lighting unit; (iii) receiving (450) observed data (36) about the output of the lighting unit; (iv) generating (440) a model of the lighting system based at least in part on the simulated output of the lighting unit and the historical observed data about the output of the lighting unit, wherein the model comprises localization information for the lighting unit; and (v) comparing (470) the received observed data about the output of the lighting unit to the generated model, wherein a fault is detected if the observed data varies from the generated model by a predetermined amount.

A method characterizes a scanning light source configured to emit illumination propagating in any one of a plurality of directions spanning an angular range. The method includes (i) detecting, with a camera, illumination propagating at each of the plurality of directions; (ii) storing image data corresponding to a response of the camera to the detected illumination. The method also includes (iii) processing the image data to characterize at least one of the angular range, pointing accuracy, pointing jitter, a divergence of the illumination, a uniformity of the illumination, and a fidelity of a scanning pattern, formed by the scanning light source, to a predetermined pattern.

A metrology apparatus (302) includes a higher harmonic generation (HHG) radiation source for generating (310) EUV radiation. Operation of the HHG source is monitored using a wavefront sensor (420) which comprises an aperture array (424, 702) and an image sensor (426). A grating (706) disperses the radiation passing through each aperture so that the image detector captures positions and intensities of higher diffraction orders for different spectral components and different locations across the beam. In this way, the wavefront sensor can be arranged to measure a wavefront tilt for multiple harmonics at each location in said array. In one embodiment, the apertures are divided into two subsets (A) and (B), the gratings (706) of each subset having a different direction of dispersion. The spectrally resolved wavefront information (430) is used in feedback control (432) to stabilize operation of the HGG source, and/or to improve accuracy of metrology results.

A time of flight sensor system having a time of flight sensor layer is disclosed. The system includes a covering window layer spaced apart from the time of flight sensor layer, with an exit window and an entrance window, an emitting element in the time of flight sensor layer that transmits an emission signal, a receiving element in the time of flight sensor layer that receives a reception signal, one or more opaque walls, and light baffles incorporated into the one or more opaque walls. The one or more opaque walls extend at least a portion of the distance from the time of flight sensor layer to the covering window layer. The one or more opaque walls reduce the reflection backscatter of emission signals and reception signals. The light baffles in the one or more opaque walls reduce backscatter of emission signals and reception signals.