In a method of manufacturing surface-emitting lasers, a substrate having a major surface including a plurality of areas each provided with a plurality of surface-emitting lasers is prepared. A first laser beam emitted when a direct-current voltage is applied to each of an n number of surface-emitting lasers among the plurality of surface-emitting lasers is measured, n being an integer of 2 or greater. A second laser beam emitted when an alternating-current voltage is applied to each of an m number of surface-emitting lasers among the plurality of surface-emitting lasers is measured, m being a natural number smaller than n. Whether the n number of surface-emitting lasers are each conforming or defective is determined from a result of the measurement of the first laser beam. Whether the m number of surface-emitting lasers are each conforming or defective is determined from a result of the measurement of the second laser beam.

A system for determining the profile of a laser beam includes a detector having a thermochromic liquid crystal film (TLCF) in thermal communication with a heat spreader and a thermoelectric cooler. The liquid crystal film has a thermochromic response such that heating of the film by a received laser beam creates a detectable color response at the film. The system also includes an image sensor and a controller configured to output an operating current for the TEC and receive images from the sensor. The system can selectively vary the temperature set point of the TEC to change the steady state temperature of the TLCF to examine the full intensity profile of the received beam even when the temperature response bandwidth of the TLCF is too narrow to display the full beam profile in a single color spot.

A light output monitoring apparatus includes a light receiving unit, an attachment unit, an adapter, and a protective cap, and monitors a power of light output from a light emitting end of a catheter incorporating an optical fiber. The protective cap includes an insertion opening into which a part of the catheter of a predetermined range on the light emitting end side is removably inserted, includes a window portion for transmitting the light output from the light emitting end of the catheter, and is fixed in position by being inserted into a through-hole of the adapter. The adapter is fixed in position by being attached to the attachment unit.

A light source device with a safety mechanism includes a wavelength converting device and a laser light source configured to provide a laser beam. The wavelength converting device includes a substrate facing toward the laser light source, an optical converting layer disposed on the substrate, and a safety examination layer disposed on one side of the optical converting layer. After the laser beam passes through the safety examination layer, the laser beam enters the optical converting layer. The safety examination layer includes a first conductive film arranged along a first direction and a second conductive film arranged along a second direction. The first conductive film and the second conductive film intersect each other.

Methods and apparatuses are disclosed whereby structured illumination microscopy (SIM) is applied to a scanning microscope, such as a confocal laser scanning microscope or sample scanning microscope, in order to improve spatial resolution. Particular aspects of the disclosure relate to the discovery of important advances in the ability to (i) increase light throughput to the sample, thereby increasing the signal/noise ratio and/or decreasing exposure time, as well as (ii) decrease the number of raw images to be processed, thereby decreasing image acquisition time. Both effects give rise to significant improvements in overall performance, to the benefit of users of scanning microscopy.

Embodiments of the present disclosure provide a detection circuit for a laser fault injection attack on a chip and a security chip. The detection circuit includes a first capacitor, a second capacitor, a first switch, a second switch, a photosensitive element, a first NMOS transistor, and a second NMOS transistor. A drain of the first NMOS transistor is configured to output a first voltage signal, and a drain of the second NMOS transistor is configured to output a second voltage signal. The first voltage signal and the second voltage signal are configured to indicate that the chip is attacked by laser fault injection, thereby realizing detection of the laser fault injection attack, and ensuring the robustness and security of the chips.

An optical energy detector and a method for detecting a broad range of optical energy are disclosed. The detector comprising a superconducting nanowire filament on a substrate, an electrical current pulse source, a laser pulse source, a first pickup probe, and a second pickup probe for measuring the voltage across the filament. The filament is maintained below a supercomputing critical temperature. The filament is biased with an electrical current pulses slight below the critical current of the filament which creates nonequilibrium state. The filament is excited by the laser pulses, and as a result, a voltage appears after a delay time. The voltage is measured for determining the amount of the optical energy. A reference curve of the voltage and the corresponding delay time can be used for calibrating any light source.

An image rendering apparatus includes a light source unit, a detecting unit, an optical scanner, a light source driving unit, and an adjusting unit. The light source driving unit is configured to control the light source unit in such a way that a rendered image is generated by the scan of the optical scanner inside a scan area scanned by the optical scanner and that a characteristic laser beam is emitted at a position and in a pattern corresponding to a rendered content of the rendered image. The rendered image includes an indicator related to a speed of a vehicle. The light source driving unit is configured to control the light source unit to emit the characteristics detecting laser beam in such a way that a scale for the indicator related to the speed of the vehicle is rendered.

An apparatus comprises a light source configured to generate light, and a modulator coupled to the light source and configured to modulate the light above a predetermined frequency. A slider is configured for heat-assisted magnetic recording and to receive the modulated light. A resistive sensor is integral to the slider and subject to heating by absorption of electromagnetic radiation and conduction of heat. Measuring circuitry is coupled to the resistive sensor and configured to measure a response of the resistive sensor due to absorbed electromagnetic radiation and not from the heat conduction. The measuring circuitry may further be configured to determine output optical power of the light source using the measured resistive sensor response.

The present invention provides a substrate treating apparatus including: support unit is configured to support and rotate a substrate in a treatment space; a liquid supply unit is configured to supply a liquid to the substrate supported by the support unit; a laser unit including a laser irradiation unit which irradiates laser light to the substrate supported by the support unit; a home port providing a standby position in which the laser unit waits; and a moving unit for moving the laser unit between a process position in which the laser light is irradiated to the substrate and the standby position, in which the home port detects a characteristic of the laser light from the laser light irradiated by the laser unit.