G01J1/44

PHOTOELECTRIC CONVERSION DEVICE
20220412797 · 2022-12-29 ·

A device includes a conversion unit, a generation unit configured to generate a pulse signal based on a signal from the conversion unit, a counter circuit configured to count the generated pulse signal, and a time measurement circuit configured to measure a time wherein one of a count value counted by the counter circuit or a time measurement value measured by the time measurement circuit is selectively output.

Limitation of noise on light detectors using an aperture

The present disclosure relates to limitation of noise on light detectors using an aperture. One example embodiment includes a system. The system includes a lens disposed relative to a scene and configured to focus light from the scene onto a focal plane. The system also includes an aperture defined within an opaque material disposed at the focal plane of the lens. The aperture has a cross-sectional area. In addition, the system includes an array of light detectors disposed on a side of the focal plane opposite the lens and configured to intercept and detect diverging light focused by the lens and transmitted through the aperture. A cross-sectional area of the array of light detectors that intercepts the diverging light is greater than the cross-sectional area of the aperture.

Limitation of noise on light detectors using an aperture

The present disclosure relates to limitation of noise on light detectors using an aperture. One example embodiment includes a system. The system includes a lens disposed relative to a scene and configured to focus light from the scene onto a focal plane. The system also includes an aperture defined within an opaque material disposed at the focal plane of the lens. The aperture has a cross-sectional area. In addition, the system includes an array of light detectors disposed on a side of the focal plane opposite the lens and configured to intercept and detect diverging light focused by the lens and transmitted through the aperture. A cross-sectional area of the array of light detectors that intercepts the diverging light is greater than the cross-sectional area of the aperture.

Light sensor assembly in a vacuum environment

An in-vacuum light sensor system, including a light sensor assembly comprising a photocathode configured for converting an impinging photon to a photoelectron, a semiconductor diode configured for multiplying the photoelectron impinging thereon, and a housing including vacuum-compatible materials configured for being placed in a vacuum chamber. The housing is configured for housing the photocathode and the semiconductor diode and for propagation of the photoelectron from the photocathode to the semiconductor diode. An electrical biasing subassembly is configured for electrically biasing at least the photocathode and the semiconductor diode, and the vacuum chamber is configured for positioning the light sensor apparatus therein.

Light sensor assembly in a vacuum environment

An in-vacuum light sensor system, including a light sensor assembly comprising a photocathode configured for converting an impinging photon to a photoelectron, a semiconductor diode configured for multiplying the photoelectron impinging thereon, and a housing including vacuum-compatible materials configured for being placed in a vacuum chamber. The housing is configured for housing the photocathode and the semiconductor diode and for propagation of the photoelectron from the photocathode to the semiconductor diode. An electrical biasing subassembly is configured for electrically biasing at least the photocathode and the semiconductor diode, and the vacuum chamber is configured for positioning the light sensor apparatus therein.

FLICKER MEASUREMENT DEVICE AND MEASUREMENT METHOD
20220406270 · 2022-12-22 ·

Provided with: a detecting means to detect a possible light intensity changing frequency of a measuring object; a frequency determining means to determine a light intensity changing frequency with reference to the possible light intensity changing frequency; a resolution determining means to determine a frequency resolution for flicker measuring with reference to the determined light intensity changing frequency; and a flicker measuring means to conduct flicker measuring with the determined frequency resolution. The resolution determining means determines the frequency resolution to be an integral submultiple of the light intensity changing frequency determined by the frequency determining means.

SELF-CHECK PROTOCOL FOR USE BY EAR-WEARABLE ELECTRONIC DEVICES

An ear-wearable electronic device includes one or more processors configured to detect presence of first and second hearing devices in a charging case, and to initiate a self-check protocol by at least one of the first and second hearing devices. The self-check protocol comprises wirelessly coupling the first and second hearing devices, selectively activating at least one electronic component of the first hearing device, and assessing performance of the second hearing device using an output or a response of the at least one electronic component of the first hearing device. The self-check protocol also comprises selectively activating at least one electronic component of the second hearing device, assessing performance of the first hearing device using an output or a response of the at least one electronic component of the second device, and storing results of the performance assessment in a memory.

Solid-state image sensor and electronic device

To control an excess bias to an appropriate value in a light detection device. A solid-state image sensor includes a photodiode, a resistor, and a control circuit. In this solid-state image sensor, the photodiode photoelectrically converts incident light and outputs a photocurrent. Furthermore, in the solid-state image sensor, the resistor is connected to a cathode of the photodiode. Furthermore, in the solid-state image sensor, the control circuit supplies a lower potential to an anode of the photodiode as a potential of the cathode of when the photocurrent flows through the resistor is higher.

Solid-state image sensor and electronic device

To control an excess bias to an appropriate value in a light detection device. A solid-state image sensor includes a photodiode, a resistor, and a control circuit. In this solid-state image sensor, the photodiode photoelectrically converts incident light and outputs a photocurrent. Furthermore, in the solid-state image sensor, the resistor is connected to a cathode of the photodiode. Furthermore, in the solid-state image sensor, the control circuit supplies a lower potential to an anode of the photodiode as a potential of the cathode of when the photocurrent flows through the resistor is higher.

Linear regulation of SPAD shutoff voltage

Described herein is an electronic device, including a pixel and a turn-off circuit. The pixel includes a single photon avalanche diode (SPAD) having a cathode coupled to a high voltage node and an anode selectively coupled to ground through an enable circuit, and a clamp diode having an anode coupled to the anode of the SPAD and a cathode coupled to a turn-off voltage node. The turn-off circuit includes a sense circuit coupled between the turn-off voltage node and ground and configured to generate a feedback voltage, and a regulation circuit configured to sink current from the turn-off voltage node to ground based upon the feedback voltage such that a voltage at the turn-off voltage node maintains generally constant.