Transdermal optical sensing systems and methods of use are described. The systems include a main body, an internal reflection element arranged within the main body, with an internal reflection element surface exposed for contact with an epidermis, an optical source configured to project light into the internal reflection element, an optical detector arranged to detect reflected light that reflects internally within the internal reflection element from the internal reflection element surface, a controller configured to measure the light at the optical detector to determine the presence of one or more compounds within the epidermis, and a retention member attached to the main body, the retention member configured to wrap about a wrist of a patient.

A device for detection of a substance by Raman spectroscopy comprises a holder (40) with an area (41) adapted for receiving a sample of the substance and a vibration engine (42). The vibration engine (42) is configured to move the holder (40) in a three-dimensional motion when the area (41) with the substance is arranged in front of a focusing lens (FL) of the spectrometer to provide a large actual sampling area and hence to achieve a strong signal at detection. The device comprises a SERS surface (30) arranged at the area (41) of the holder (40) for adsorption of the sample of the substance. A method for detection of a substance by use of the device is also presented.

A spectrometer system comprises a housing provided with a window, an illumination source, a spectrometer and a standard for internal recalibration being disposed in said housing. Specific absorption bands of a filling gas present in the housing are identified in a reference spectrum, which was recorded using the standard, wherein a wavelength characterizing the relevant identified specific absorption band is measured in each case such that measured values are obtained for the wavelengths of the absorption bands. A test spectrum is recorded by the spectrometer using the standard. The specific absorption bands of the filling gas are identified in the test spectrum, wherein a wavelength characterizing the relevant identified specific absorption band is measured in each case such that measured values are obtained for the wavelengths of the specific absorption bands.

Disclosed is a spectroscopic device, system, and method for measuring the concentration of one or more molecular species of interest in a gas, liquid or solid sample, where the device may be portable, may be commercially manufactured, and/or may be adapted to existing systems and/or integrated with new systems to provide optical gas sensing for such systems. The disclosed devices, systems, and methods can be particularly useful in monitoring the purity of, e.g., a certain gas species, including determining whether a gas mixture contains certain gas species above a set concentration limit.

An optical measurement device may include a light source; an emission optic configured to direct a first portion of light generated by the light source to a measurement target; a collection optic configured to receive light from the measurement target; an optical conduit configured to direct a second portion of light generated by the light source to a spectral reference; the spectral reference; a sensor; and a filter. A first portion of the filter may be provided between the collection optic and a first portion of the sensor. A second portion of the filter may be provided between the spectral reference and a second portion of the sensor.

The disclosed embodiments include thin film multivariate optical element and detector combinations, thin film optical detectors, and downhole optical computing systems. In one embodiment, a thin film multivariate optical element and detector combination includes at least one layer of multivariate optical element having patterns that manipulate at least one spectrum of optical signals. The thin film multivariate optical element and detector combination also includes at least one layer of detector film that converts optical signals into electrical signals. The thin film optical detector further includes a substrate. The at least one layer of multivariate optical element and the at least one layer of detector film are deposited on the substrate.

Novel monolithic reflective spatial heterodyne spectrometers (SHS) interferometer systems are presented. Monolithic systems in accordance with the invention have a single supporting structure wherein input optics, output optics, a flat mirror, a roof mirror, and a symmetric grating are affixed. Embodiments of the invention contain only fixed parts, and the optics do not move in relation to the supporting structure. Embodiments of the present invention enables smaller, lighter, and more robust reflective SHS systems as compared to conventional interferometry. Additionally, embodiments of the present invention require less time and skill for construction and maintenance, and is a better economic option. Additional embodiments can include multiple interferometer systems in a single supporting structure.

An apparatus for providing an improved coupling link with integrated beam blocking and a bearing assembly using an axial preloading technique is disclosed. The apparatus may include a coupling link comprising a first end, a second end, and a middle section. The middle section may be connectable to a beam blocking element. The first end may include a first bearing assembly and may be connectable to a motor drive arm. The second end may include a second bearing assembly and may be connectable to an optical-mechanical element. In some examples, the apparatus may be used in various optical measurement and testing applications and environments. In some examples, the improved coupling link may also utilize an axial preloading technique to minimize excessive movement in bearings assemblies.

A plasma processing apparatus is provided. A plasma processing apparatus includes a chamber, in which a plasma process is performed, a chuck disposed inside the chamber and provided with a wafer, a gas feeder disposed on the chuck and for providing process gas to the inside of the chamber, an OES port extending in a vertical direction along a sidewall of the chamber, and for receiving each of a first light emitted from plasma at a first position and a second light emitted from plasma at a second position closer to the gas feeder than the first position, an OES sensor for sensing the first light to measure first plasma data, and sensing the second light to measure second plasma data, and a control unit for controlling the plasma process using the first and second plasma data.

The present invention relates to a spectrometer for spectral analysis of electromagnetic radiation. The spectrometer comprises an entry slit for entry of the electromagnetic radiation to be analysed and an imaging grating for diffraction of the electromagnetic radiation which has entered. The spectrometer additionally comprises a detector extending at least in one direction to detect the diffracted electromagnetic radiation, and also a support plate in which the entry slit is located. The spectrometer further comprises a housing which is mounted on the support plate, covers the detector and the entry slit and supports the imaging grating. According to the invention the spectrometer further comprises at least three floating bearings for floating mounting of the housing on the support plate, the floating bearings each enabling a displacement between the housing and the support plate on a directional axis and being distributed about a central axis of the housing.