The invention relates to a method for monitoring a spectroradiometer (4), in particular for measuring light-emitting test objects (1), in which the spectral data of the test objects (1) are captured by means of an optical system, wherein the radiometric, photometric and/or colorimetric quantities of the test objects (1) are ascertained from the spectral data. The problem addressed by the invention is that of specifying a method for monitoring a spectroradiometer (4), where it is not the continuous recalibration of the spectroradiometer (4) but the monitoring of when a calibration is necessary that is paramount. The invention solves this problem by virtue of changes in the wavelength scale, in the light throughput and/or in the spectral sensitivity of the spectroradiometer (4) being detected by way of a reference light source (5), integrated into the optical system, with a defined spectrum. Optionally, at least one detector integrated into the optical system can additionally monitor the stability of the reference light source (5). Moreover, the invention relates to a device for carrying out the method.

Spectrophotometer system configured to characterize and/or measure spectrally (wavelength)-dependent properties of material components (such as molecular, viral, and/or bacterial analytes) associated with or of an object prior to the time when optical fingerprints of such material components start to degrade, and associated methods. System can be enhanced by a capability of selecting specific wavelengths of operation for such system to optimize cost-efficiency of the system.

Described herein is a wavelength reference device comprising a housing defining an internal environment having a known temperature. A broadband optical source is disposed within the housing and configured to emit an optical signal along an optical path. The optical signal has optical power within a wavelength band of interest. An optical etalon is also disposed within the housing and positioned in the optical path to filter the optical signal to define a filtered optical signal that includes one or more reference spectral features having a known wavelength at the known temperature. The device also includes an optical output for outputting the filtered optical signal.

Integrated laser sources emitting multi-wavelengths of light with reduced thermal transients and crosstalk and methods for operating thereof are disclosed. The integrated laser sources can include one or more heaters and a temperature control system to maintain a total thermal load of the gain segment, the heater(s), or both of a given laser to be within a range based on a predetermined target value. The system can include electrical circuitry configured to distribute current to the gain segment, the heater(s), or both. The heater(s) can be located proximate to the gain segment, and the distribution of current can be based on the relative locations. In some examples, the central laser can be heated prior to being activated. In some examples, one or more of the plurality of lasers can operate in a subthreshold operation mode when the laser is not lasing to minimize thermal perturbations to proximate lasers.

A downhole tool has a tool body with an outer diameter equal to a borehole diameter, at least one cavity formed in and opening to an outer surface defining the outer diameter of the tool body, a light source, a filter, and a light detector mounted in the at least one cavity, and a window disposed at the opening of the at least one cavity, wherein the window encloses the cavity.

An apparatus includes imaging optics having an objective lens configured to focus electromagnetic radiation to an intermediate image plane and one or more optical devices configured to generate an optical beam from the electromagnetic radiation. The apparatus also includes at least one imaging sensor configured to capture an image from the optical beam. The apparatus further includes a beam generator configured to generate and transmit an HEL beam through the imaging optics. In addition, the apparatus includes an intermediate alignment target configured to be moveably positioned at the intermediate image plane. The intermediate alignment target includes a first-wavelength target configured to reflect a first spectral band of the HEL beam to a first of the at least one imaging sensor (the first imaging sensor configured to capture a first-wavelength infrared image of the first spectral band) and transmit remaining spectral portions of the HEL beam towards the objective lens.

A vehicular camera includes a lens assembly and a circuit board having a first side and a second side opposite the first side. The circuit board has a first coefficient of thermal expansion (CTE). An imager is disposed at the first side of the circuit board and optically aligned with the lens assembly. A bend-countering element is disposed at the second side of the circuit board. The bend-countering element has a second CTE that is greater than the first CTE of the circuit board. The bend-countering element counters temperature-induced bending of the circuit board. With the camera disposed at the vehicle, temperature-induced bending of the bend-countering element is in an opposite direction from temperature-induced bending of the circuit board.

This relates to systems and methods for measuring a concentration and type of substance in a sample at a sampling interface. The systems can include a light source, optics, one or more modulators, a reference, a detector, and a controller. The systems and methods disclosed can be capable of accounting for drift originating from the light source, one or more optics, and the detector by sharing one or more components between different measurement light paths. Additionally, the systems can be capable of differentiating between different types of drift and eliminating erroneous measurements due to stray light with the placement of one or more modulators between the light source and the sample or reference. Furthermore, the systems can be capable of detecting the substance along various locations and depths within the sample by mapping a detector pixel and a microoptics to the location and depth in the sample.

The present invention concerns an optical measurement system comprising an electrically tunable Peltier element, a detector for detecting radiation from a radiation source in a measurement area, the detector being in thermal connection with the Peltier element, an electrically tunable Fabry-Perot interferometer placed in the path of the radiation prior to the detector, the Fabry-Perot interferometer being in thermal connection with the Peltier element, and control electronics circuitry configured to control the Peltier element, the interferometer, and the detector. The present invention further concerns a method for analyzing the spectrum of an object.

A mirror plate (100) for a Fabry-Perot interferometer (300) includes a substrate (50), which includes silicon (Si), a semi-transparent reflective coating (110) implemented on the substrate (50), a de-coupling structure (DC1) formed on the substrate (50), a first sensor electrode (G1a) formed on top of the de-coupling structure (DC1), and a second sensor electrode (G1b), wherein the de-coupling structure (DC1) includes an electrically insulating layer (60a), and a first stabilizing electrode (G0a), which is located between the first sensor electrode (G1a) and the substrate (50).