A spectrometer for examining the spectrum of an optical emission source may include: an optical base body, a light entry aperture connected to the optical base body to couple light into the spectrometer, at least one dispersion element to receive the light as a beam of rays and generate a spectrum, and at least one detector for measuring the generated spectrum. A light path may run from the light entry aperture to the detector. A mirror group with at least two mirrors may be provided in a section of the light path between the light entry aperture and the at least one detector, in which the beam does not run parallel, which may compensate for temperature effects. In the mirror group, at least one mirror or the entire mirror group may be moveable relative to the optical base body and may be coupled to a temperature-controlled drive.

A device for measuring a periodic signal includes: a first control unit for generating an electrical input signal (V1) of the period T; a light source for generating an optical input signal directed to an object being measured from the electrical input signal (V1); an optical receiver for detecting and converting the signal reflected from the object being measured, the signal corresponding to the optical input signal altered in terms of phase and amplitude, into an electrical measurement signal (V2); and a plurality of measurement channels connected in parallel between the optical receiver and a second control unit, each measurement channel being connected in series to a switching element, a filter element, and an analog-to-digital converter, wherein the second control unit is suitable for evaluating the measurement signals from the plurality of measurement channels, and in which the electrical measurement signal (V2) is applied to each of the plurality of measurement channels, the first control unit is connected to the plurality of switching elements and is suitable for actuating the switching elements for different time intervals in each case, and the analog-to-digital converters have a maximum sampling rate of less than 2×1/T.

A spectrometry apparatus includes a light incident section on which incident light from an image pickup target is made incident, an image pickup section provided on an optical path of the incident light input from the light incident section, a variable wavelength interference filter configured to transmit light having a predetermined wavelength from the incident light input from the light incident section and capable of changing the wavelength of the light to be transmitted, and a filter-position switching section configured to advance and retract the variable wavelength interference filter to and from an optical path of the incident light.

According to an aspect, there is provided a spectrometer comprising a first and second enclosed volumes. The second enclosed volume is formed by an absorption cell for containing a sample gas. The first enclosed volume of the spectrometer comprises an interferometer with a source of electromagnetic radiation, a first focusing mirror adapted to focus electromagnetic radiation received from the interferometer to the absorption cell, a second focusing mirror adapted to focus electromagnetic radiation received from the absorption cell and a detector adapted to detect electromagnetic radiation focused by the second focusing mirror. Moreover, the spectrometer comprises a main frame plate on which elements in the first enclosed volume are mounted and which is fixed to the absorption cell arranged on an opposing side of the main frame plate.

A gas analysis system with an FTIR spectrometer preferably utilizes a long path gas cell, a narrow band detector, and an optical filter that narrows the detection region. The interferograms are further prevent baseline drift and analyze the resultant spectra.

A method of determining the concentration of a species in a portion of a furnace atmosphere is described. The method comprises the steps of measuring first, second and third intensities of electromagnetic radiation in the furnace at first, second and third wavelengths respectively. The third wavelength is selected to be representative of absorption of electromagnetic radiation by the species. A fourth intensity of electromagnetic radiation is calculated, being an estimate of the intensity of electromagnetic radiation in the furnace at the third wavelength absent any absorbing species in the furnace atmosphere. The third intensity and the fourth intensities are used to determine a parameter that is proportional to the concentration of absorbing species in the portion of the furnace atmosphere. Apparatus for carrying out the method is also described.

According to various embodiments, a sensing device for measuring oxygen concentration cycles in breath is disclosed. The sensing device includes a laser configured to emit light at an A-band of oxygen, a lens configured to collimate the light, and a multi-pass cell configured to contain a replaceable sample cell. The light passes through the multi-pass cell and is attenuated by oxygen in the sample cell. The sensing device further includes a photodetector configurated to convert the attenuated light into an electrical signal, and a lock-in amplifier or an equivalent processing circuit configured to determine oxygen concentration from the electrical signal.

Spectrophotometer system configured to characterize and/or measure spectrally (wavelength)-dependent properties of material components (such as molecular, viral, and/or bacterial analytes) associated with or of an object prior to the time when optical fingerprints of such material components start to degrade, and associated methods. System can be enhanced by a capability of selecting specific wavelengths of operation for such system to optimize cost-efficiency of the system.

A spectroscopic sensor includes a wiring substrate having a main surface, a light detector disposed on the main surface of the wiring substrate, a Fabry-Perot interference filter, a spacer which is provided on the main surface of the wiring substrate and supports the Fabry-Perot interference filter so that the Fabry-Perot interference filter and the light detector are separated from each other, and a stein connected to a ground potential. A second current path which has a smaller electric resistance than that of an arbitrary first current path which extends from the Fabry-Perot interference filter to the light detector via the spacer and the wiring substrate is formed between the Fabry-Perot interference filter and the stein.

A field spectral radiometer includes a support structure and a remote sensing head disposed on the support structure. The remote sensing head includes a central axis, a first optical element disposed on a first side of the central axis and defining a first optical path for a first optical channel, and a second optical element disposed on a second side of the central axis and defining second optical path for a second optical channel. An instrumentation assembly disposed on the support structure. the instrumentation assembly includes a first detection path associated with the first optical channel and a second detection path associated with the second optical channel, the first and second detection path include optical indexers for manipulating the first and second optical channels. The field spectral radiometer may include a calibration assembly disposed on the base. The calibration assembly may include a calibrating light source for calibrating the remote sensing head.