A Brillouin modality can be supplemented by an auxiliary modality, such as an optical imaging modality or a spectroscopy modality. In some embodiments, the auxiliary modality can be used to guide the Brillouin measurement to a desired region of interest, so that acquisition times for the Brillouin measurement can be reduced as compared to interrogating the entire sample. The auxiliary modality may have an acquisition speed faster than that of the Brillouin modality. In some embodiment, the auxiliary modality determines a composition of materials within a voxel in the sample interrogated by the Brillouin modality. Using the information provided by the auxiliary modality, the Brillouin signatures corresponding to the materials within the voxel can be unmixed, thereby providing a more accurate measurement of the sample.

A colorimetric device and a colorimetric method according to the present invention extract a chart region candidate, which is a candidate for a chart region, from an image of a color chart, obtain an evaluation value of this chart region candidate, determine whether or not the chart region candidate is the chart region based on this obtained evaluation value, obtain each position of a plurality of patches for the chart region candidate determined as the chart region as a result of the determination and colorimetrically measure each of the patches at each obtained position of the plurality of the patches.

In a colorimetric device and a colorimetric method according to the present invention, chart definition information including at least patch position definition information representing each position of a plurality of patches in a color chart is stored, patch position measurement information representing the position of the patch is obtained on the basis of an image of the color chart, patch position correction information is obtained by correcting the patch position measurement information on the basis of the chart definition information, and then, each color of the plurality of patches is measured in each of the positions of the plurality of patches represented by the patch position correction information.

Apparatus for determining information associated with reflection characteristics of a surface comprising a sensor (60) configured to generate sensor output dependent on an intensity of light incident on the sensor and having a field of view directed at an external surface (57) in use; an illumination source (58) configured to emit light onto the external surface in use; an optically transparent window (61) located such as to allow light to pass from the illumination source to the external surface and to allow light to pass to the sensor from the external surface in use; a light concentrator (66) fixed to or integral with the window, the light concentrator being configured to concentrate at least some light from the illumination source onto the external surface in use such that the concentrated light may be reflected from the external surface onto the sensor via the window; and a processor (40) configured to use the sensor output to determine information associated with reflection characteristics of the external surface.

A spectrometry system includes an imaging apparatus that includes an imaging element which captures an image, and a spectroscopic module that includes a wavelength variable interference filter and an attachment unit which holds the wavelength variable interference filter, is provided to be attachable to and detachable from the imaging apparatus, and can dispose the wavelength variable interference filter on an optical path of incident light to the imaging element during attachment to the imaging apparatus.

The present invention relates to a colour sensor having at least one photosensitive element, in front of which a layer stack of dielectric layers and structured metal layers is constructed, and at least one colour filter, through which optical radiation incident on a light input side of the colour sensor is filtered before it reaches a photosensitive surface of the photosensitive element. In the suggested colour sensor, an array of angle-selective passageways is provided for the optical radiation between the light input side and the photosensitive surface, and each passageway only allows parts of the optical radiation incident on the light input side of the colour sensor within a limited angle of incidence range relative to an axis extending perpendicularly to the colour filter to pass through to the photosensitive surface. When the colour sensor is manufactured with semiconductor technology, it enables the angle-selective structures to be integrated in the CMOS layer stack. In this way, ultra-flat colour sensors can be made.

A measurement device includes a light source that radiates an illumination light on a measurement object; and a measurement unit that measures a measurement light that is reflection light obtained by the illumination light being reflected by the measurement object or transmitted light obtained by the illumination light passing through the measurement object. The illumination light is a plurality of illumination lights. In a case where the measurement object is positioned at a reference position, an illumination center at which an optical axis of each of the plurality of illumination lights and the measurement object intersect, and a measurement center that is a center of a measurement region of the measurement object measured by the measurement unit are positioned at different positions.

This spectral-image-obtaining device includes: a line-spectral-image acquiring unit that acquires a plurality of line spectral images; a frame-image acquiring unit that has an image-capturing range that encompasses that over which image capturing is performed by the line-spectral-image acquiring unit and that acquires a two-dimensional frame image that contains fewer color signals than the line spectral images; a comparison-image estimating unit that estimates comparison images for all lines based on the line spectral images acquired by the line-spectral-image acquiring unit and a wavelength characteristic of the frame-image acquiring unit; a line-spectral-image positional-deviation detecting unit that detects amounts of positional deviation between the comparison images estimated by the comparison-image estimating unit and corresponding positions within the frame image; and a positional-deviation correcting unit that fits the line spectral images to corresponding positions within the frame image based on the amounts of positional deviation detected by the line-spectral-image positional-deviation detecting unit.

Reflected light detecting device and method with surface reflected light components collectively be extracted/removed when detecting reflected light arising in casting light onto target-object range having non-planar surface. The device includes: a first illuminating device causing first-measurement light in predetermined polarization direction to enter target-object first region from first direction; polarization optical system position part of first-surface reflected light enters the polarization optical system, the first-surface reflected light being the first-measurement in the first region surface; a second illuminating device causing second-measurement light in the same first-measurement light polarization direction to enter second region from second direction, the second region being on the target-object surface, different from the first region; adjusting direction of the second-measurement light optical axis so part of second-surface reflected light enters the polarization optical system, the second-surface reflected light being the second-measurement in second region surface; and detecting light having passed through the polarization optical system.

A spectrometer system may be used to determine one or more spectra of an object, and the one or more spectra may be associated with one or more attributes of the object that are relevant to the user. While the spectrometer system can take many forms, in many instances the system comprises a spectrometer and a processing device in communication with the spectrometer and with a remote server, wherein the spectrometer is physically integrated with an apparatus. The apparatus may have a function different than that of the spectrometer, such as a consumer appliance or device.