G01J3/0289

PROCESSING APPARATUS, IMAGE PICKUP APPARATUS, IMAGE PICKUP SYSTEM, AND PROCESSING METHOD
20210381892 · 2021-12-09 ·

A processing apparatus combines a plurality of images based on a plurality of object images formed on an imaging plane of an image sensor by a plurality of lens units and to generate a combined image, and includes at least one processor or circuit that serves as an acquisition task configured to acquire information on a center position of each of the plurality of object images on the imaging plane, information on a correspondence relationship between the center position and positions of the plurality of images in the combined image, and conversion information for converting a first coordinate system in the imaging plane into a second coordinate system in the combined image, the conversion information being generated based on a correction function for correcting the plurality of object images, and a processing task configured to generate the combined image using the conversion information.

FIELD SPECTRAL RADIOMETERS INCLUDING CALIBRATION ASSEMBLIES

A field spectral radiometer includes a support structure and a remote sensing head disposed on the support structure. The remote sensing head includes a central axis, a first optical element disposed on a first side of the central axis and defining a first optical path for a first optical channel, and a second optical element disposed on a second side of the central axis and defining second optical path for a second optical channel. An instrumentation assembly disposed on the support structure. the instrumentation assembly includes a first detection path associated with the first optical channel and a second detection path associated with the second optical channel, the first and second detection path include optical indexers for manipulating the first and second optical channels. The field spectral radiometer may include a calibration assembly disposed on the base. The calibration assembly may include a calibrating light source for calibrating the remote sensing head.

Multi-angle imager

A multi-angle imager (10) comprises an imaging array (Mij) configured to receive light beams (Li) via one or more entrance pupils (A1) according to distinct fields of view (Vi) of an object (P0) along each of multiple entry angles (αi). The imaging array (Mij) comprises multiple imaging branches (M1j, M2j) configured to form respective optical paths for the light beams (L1, L2) through the imager (10) for imaging respective subsections (S1, S2) of the object (P0). Each imaging branch (M1j) comprises a distinct set of optical elements (M11, M21) configured to receive the respective light beam (L1) along the respective entry angle (α1) and redirect the respective light beam (L1) towards the imaging plane (P1). The light beams (L1, L2) from each of the multiple imaging branches (M1j, M2j) are redirected to travel in a common direction (y) between the imaging array (Mij) and the imaging plane (P1).

HANDHELD NON-CONTACT MULTISPECTRAL MEASUREMENT DEVICE WITH POSITION CORRECTION

A non-contact multispectral measurement device for measuring reflectance properties of a surface of interest may include a multispectral measurement system, a position measurement system for measuring position values of the multispectral measurement system relative to the surface of interest, and means to correct multispectral values from the multispectral measurement system based on detected position values from the position measurement system. In some embodiments the multispectral measurement system is configured with a retro-reflection measurement geometry, where the illumination light path and observation light path are inclined with respect to a surface normal of the surface of interest to reduce detection of gloss or surface reflections while obtaining multispectral values. The position measurement system may be selected from the group consisting of: a pattern projector and a camera, a camera autofocus system, a stereo vision system, a laser range finder, and a time of flight distance sensor.

Method of crop analysis using drone with flying and driving capability

There is provided method of analyzing a field of crops using a drone. The method initially includes remotely controlling the drone to fly the drone to adjacent the field of crops. The method further includes remotely controlling the drone to land the drone adjacent the crops. The method further includes remotely controlling the drone to drive the drone on the ground along the crops. The method further includes capturing ground-based images of the crops at an upward view angle using a multispectral camera on-board the drone.

ANGULAR DEPTH RESOLVED RAMAN SPECTROSCOPY APPARATUS AND METHOD

An apparatus and method for analyzing a tissue sample to provide depth-selective information includes at least one light source, collection light optics, and a light detector. The light source is configured to produce a light beam having one or more wavelengths of light that cause a tissue sample to produce Raman light signals upon interrogation of the tissue sample. The light beam is oriented to impinge on an exposed surface of the tissue sample at a point of incidence (POI), and oriented so that the light beam enters the tissue sample at an oblique angle relative to the exposed surface of the tissue sample. The collection light optics are configured to collect the Raman light signals emanating from the tissue sample at one or more predetermined lateral distances from the point of incidence. The light detector is configured to receive the Raman light signals from the collection light optics.

HIGH SPEED SCANNING SYSTEMS FOR SUPER RESOLUTION IMAGING

Disclosed herein is a high throughput optical scanning system to generate super resolution images and methods of use. The optical scanning device and methods of use provided herein can allow high throughput scanning of a continuously moving object with a high resolution despite fluctuations in stage velocity. This can aid in high throughput scanning of a substrate, such as a biological chip comprising fluorophores. Also provided herein are improved optical relay systems and scanning optics.

MEASURING A COLOR OF A TARGET COATING
20220187198 · 2022-06-16 · ·

Devices and methods for measuring color of a target coating are provided. In an exemplary embodiment, a color measurement device includes a housing configured for placement on a target coating. A source connected to the housing directs a beam of electromagnetic radiation towards the target coating at an entrance angle. A spherical coordinate system is used, where the entrance angle is a polar angle measured from a zenith that is normal to the target coating surface. First and second detectors are connected to the housing at a first and second polar angle, respectively, to measure the electromagnetic radiation reflected by a target population of flakes within the target coating, where all the flakes in the target population of flakes have the same angled flake normal polar angle. The first polar angle is different than the second polar angle.

Automated delay line alignment

A system and method for pre-aligning a light beam in a spectroscopic measuring device such as a pump-probe device prior to conducting a measurement procedure is provided, which eliminates the need for monitoring or modification of the beam trajectory through adjustments of elements transmitting the beam (e.g., mirrors) over the course of a measurement process.

PLASMA PROCESSING APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE USING THE SAME
20220172928 · 2022-06-02 ·

A plasma processing apparatus is provided. A plasma processing apparatus includes a chamber, in which a plasma process is performed, a chuck disposed inside the chamber and provided with a wafer, a gas feeder disposed on the chuck and for providing process gas to the inside of the chamber, an OES port extending in a vertical direction along a sidewall of the chamber, and for receiving each of a first light emitted from plasma at a first position and a second light emitted from plasma at a second position closer to the gas feeder than the first position, an OES sensor for sensing the first light to measure first plasma data, and sensing the second light to measure second plasma data, and a control unit for controlling the plasma process using the first and second plasma data.