Patent classifications
G01J3/0291
Fully integrated gas concentration sensor
A gas concentration sensor is includes an integrated die-form electromagnetic radiation source and an integrated die-form infrared detector. In one or more implementations, the gas concentration sensor includes a package substrate defining at least one aperture, a gas permeable mesh coupled to the package substrate and covering at least a portion of the at least one aperture, a die-form electromagnetic radiation source positioned in an interior region of the package substrate, a die-form detector positioned in the interior region of the package substrate, and control circuitry operably coupled to the die-form detector and configured to detect and calibrate one or more signal outputs from the die-form detector to determine a gas concentration within the interior region of the package substrate. The gas concentration sensor can be configured for specific detection of various gases through control of the spectral wavelengths emitted by the electromagnetic radiation source(s) and/or detected by the detector(s).
NON-POWER-DRIVEN PHOTOMETER INCLUDING MULTIPLE PHOTORECEIVERS
A non-power-driven photometer is provided, the photometer comprising: a body; and multiple narrow angle photoreceivers (narrow angle probes) formed in the body, wherein the multiple narrow angle probes receive light in the atmosphere, which is incident over a range of different azimuth angles, and allow the characteristics of the atmosphere to be analyzed with reference to the relationship between the received light and the azimuth angle of the narrow angle probe corresponding to the received light. According to the present invention, since the photometer is driven without being supplied with power, light intensity measurement can be performed in a short time. Further, since light intensity measurement can be performed with no movement or only a short-distance movement of a vehicle or airplane equipped with the photometer, the problem of errors caused by differences in the time and location of measurement can be prevented.
SPECTROMETER AND OPTICAL INPUT PORTION THEREOF
A spectrometer (100) and an optical input portion (32) thereof are disclosed. The optical input portion (32) comprises an assembly structure (322), and the assembly structure (322) is formed at a hole wall (321) of a through hole (3211) of the optical input portion (32). A light (L1) is incident into a dispersing element (2) of the spectrometer (100) along an optical path (13) after passing through the through hole (3211), and is dispersed by the dispersing element (2). The assembly structure (322) is used to be detachably assembled with an optical element (200). When the optical element (200) is assembled with the assembly structure (322), an optical axis of the optical element (200) is linked to the optical path (13). As a result, the light (L1) passing through the optical element (200) is incident to the dispersing element (2) along the optical axis and the optical path (13).
INTEGRATED SPECTRAL UNIT
Aspects of the disclosure relate to an integrated spectral unit including a micro-electro-mechanical systems (MEMS) interferometer fabricated within a first substrate and a light redirecting structure integrated on a second substrate, where the second substrate is coupled to the first substrate. The light redirecting structure includes at least one mirror for receiving an input light beam propagating in an out-of-plane direction with respect to the first substrate and redirecting the input light beam to an in-plane direction with respect to the first substrate towards the MEMS interferometer.
MEASURING DEVICE
The invention provides a measuring device for analyzing a luminescent sample and, in particular, for measuring the concentration of at least one analyte in a luminescent sample, comprising: a housing with a sample receptacle space for accommodating a sample container; a sample container for accommodating the luminescent sample; a radiation receiver apparatus for receiving radiation emitted by the luminescent sample; and an evaluation apparatus for evaluating the radiation from the luminescent sample received by the radiation receiver apparatus. The invention moreover provides a measuring device comprising a base part and a measuring head arranged at the base part in an interchangeable manner, wherein the measuring head is embodied to analyze the luminescent sample or it is embodied as a spectrometer measuring head.
IMAGING ASSEMBLY FOR A DRONE AND SYSTEM COMPRISING SUCH AN ASSEMBLY MOUNTED ON A DRONE
The imaging assembly includes: a multi-band sensor (5), comprising a plurality of light sensors (7) each for measuring a light intensity returned by a target (8) in a predetermined frequency band; a sunlight detector (9), comprising a plurality of control sensors (11) each for measuring an ambient light intensity in one of the predetermined bands of frequencies of the multi-band sensor (5) each associated with a band-pass filtre; an electronic module (13) configured so as to calculate at least one characteristic variable value of the light intensity returned by the target (8) in each predetermined frequency band;
the sunlight detector (9) comprising a box casing (21), the control sensors (11) being attached to the box casing (21), the band-pass filtres (17) being attached to the box casing (21) each one so as to be facing the photosensitive surface of the associated control sensor.
COLOR MEASURING SYSTEM, BACKING PLATE, AND COLOR MEASURING APPARATUS
A color measuring system includes a color measuring apparatus performing color measurement of a color measurement target, a backing plate disposed under the color measurement target, and an alignment unit with which alignment between the backing plate and the color measuring apparatus is performed in a state where the backing plate is disposed under the color measurement target and entirely covered with the color measurement target.
System for determining a composition of a sample using wavelength dependent variability measurement with multiple time intervals
Disclosed are apparatus, kits, methods, and systems that include a radiation source configured to direct radiation to a sample; a detector configured to measure radiation from the sample; an electronic processor configured to determine information about the sample based on the measured radiation; a housing enclosing the source, the detector, and the electronic processor, the housing having a hand-held form factor; an arm configured to maintain a separation between the sample and the housing, the arm including a first end configured to connect to the housing and a second end configured to contact the sample; and a layer positioned on the second end of the arm, the layer being configured to contact the sample and to transmit at least a portion of the radiation from the sample to the detector.
SPECTROMETER MODULE
In a spectroscopic module, a light shielding member is disposed between a plurality of bandpass filters and a light detector. The light shielding member includes a plurality of wall portions. The plurality of wall portions are arranged along an X direction with a light passage opening interposed therebetween, each of a plurality of optical paths from the plurality of bandpass filters to a plurality of light receiving regions passing through the light passage opening. A first wall portion and a second wall portion adjacent to each other among the plurality of wall portions are in contact with the bandpass filter, the bandpass filter corresponding to the light passage opening between the first wall portion and the second wall portion. A width in a Y direction of the light passage opening is larger than a width in the Y direction of the bandpass filter.
Tunable Spectral Slicer And Methods Of Use
Systems and methods for filtering an optical beam are described. In one implementation, a system for filtering an input optical beam includes a first beamsplitter, a first spectral slicing module, a second spectral slicing module, and a second beamsplitter. The first beamsplitter is configured to split the input optical beam into a first optical beam and a second optical beam. The first spectral slicing module has a first passband and is configured to filter the first optical beam. The second spectral slicing module has a second passband and is configured to filter the second optical beam. The second beamsplitter is configured to combine the first optical beam and the second optical beam into an output optical beam. The first and second spectral slicing modules may each comprise a longpass filter and a shortpass filter aligned along its optical axis, and the longpass filter and/or the shortpass filter are rotatable relative to the optical axis. Advantageously, the optical system allows for tunable spectral filtering of the input optical beam suitable for 2-D imaging systems.