Patent classifications
G01J3/04
Systems, methods, and apparatus for radiation detection
A radiation detection technique employs field enhancing structures and electroluminescent materials to converts incident Terahertz (THz) radiation into visible light and/or infrared light. In this technique, the field-enhancing structures, such as split ring resonators or micro-slits, enhances the electric field of incoming THz light within a local area, where the electroluminescent material is applied. The enhanced electric field then induces the electroluminescent material to emit visible and/or infrared light via electroluminescent process. A detector such as avalanche photodiode can detect and measure the emitted light. This technique allows cost-effective detection of THz radiation at room temperatures.
SPECTRAL-IMAGE ACQUISITION DEVICE
This spectral-image-obtaining device includes: a line-spectral-image acquiring unit that acquires a plurality of line spectral images; a frame-image acquiring unit that has an image-capturing range that encompasses that over which image capturing is performed by the line-spectral-image acquiring unit and that acquires a two-dimensional frame image that contains fewer color signals than the line spectral images; a comparison-image estimating unit that estimates comparison images for all lines based on the line spectral images acquired by the line-spectral-image acquiring unit and a wavelength characteristic of the frame-image acquiring unit; a line-spectral-image positional-deviation detecting unit that detects amounts of positional deviation between the comparison images estimated by the comparison-image estimating unit and corresponding positions within the frame image; and a positional-deviation correcting unit that fits the line spectral images to corresponding positions within the frame image based on the amounts of positional deviation detected by the line-spectral-image positional-deviation detecting unit.
SPECTRAL COLORIMETRIC APPARATUS AND IMAGE FORMING APPARATUS THAT USES THE SAME
A spectral colorimetric apparatus comprises a light source, a spectral element, a light receiving element, a substrate on which the light receiving element is mounted, a housing and a pressing portion. The housing has a first side wall on which the substrate is fixed and a second side wall on which the spectral element is fixed. The pressing portion pinches the spectral element together with the second side wall and presses the spectral element to the second side wall.
Adjustable aperture device with integral aperture holes
An adjustable aperture device for an electromagnetic radiation detecting apparatus includes a position adjustment body configured for adjusting a position of a selected aperture hole of multiple selectable aperture holes, where electromagnetic radiation propagates through the selected aperture hole. The adjustable aperture device further includes a guide unit configured for guiding the position adjustment body along a predefined guide direction, and an aperture body defining the aperture holes and including multiple engagement sections, where the adjustment body is engagable in a selectable one of the engagement sections to thereby select the selected aperture hole. The adjustable aperture device further includes a pre-loading element configured for pre-loading the position adjustment body towards the aperture body, and a drive unit configured for driving the aperture body to move so that the position adjustment body is engaged in a respective one of the plurality of engagement sections.
Adjustable aperture device with integral aperture holes
An adjustable aperture device for an electromagnetic radiation detecting apparatus includes a position adjustment body configured for adjusting a position of a selected aperture hole of multiple selectable aperture holes, where electromagnetic radiation propagates through the selected aperture hole. The adjustable aperture device further includes a guide unit configured for guiding the position adjustment body along a predefined guide direction, and an aperture body defining the aperture holes and including multiple engagement sections, where the adjustment body is engagable in a selectable one of the engagement sections to thereby select the selected aperture hole. The adjustable aperture device further includes a pre-loading element configured for pre-loading the position adjustment body towards the aperture body, and a drive unit configured for driving the aperture body to move so that the position adjustment body is engaged in a respective one of the plurality of engagement sections.
Optical module of micro spectrometer with tapered slit and slit structure thereof
An optical module of a micro spectrometer with tapered slit and slit structure thereof. The optical module includes an input section and a micro diffraction grating. The input section includes a slit structure, which receives a first optical signal and outputs a second optical signal travelling along a first optical path. The slit structure includes a substrate and a slit, which penetrates through the substrate and has a gradually reduced dimension from a first surface of the substrate to a second surface of the substrate. The micro diffraction grating, disposed on the first optical path, receives the second optical signal and separates the second optical signal into a plurality of spectrum components travelling along a second optical path. The optical module of the micro spectrometer with the tapered slit and slit structure thereof according to the embodiment of the invention can be manufactured in a mass-production manner using the semiconductor manufacturing processes, so that the cost can be decreased, and the slit can have a smooth surface, which avoids the negative effect on the incident light.
Optical module of micro spectrometer with tapered slit and slit structure thereof
An optical module of a micro spectrometer with tapered slit and slit structure thereof. The optical module includes an input section and a micro diffraction grating. The input section includes a slit structure, which receives a first optical signal and outputs a second optical signal travelling along a first optical path. The slit structure includes a substrate and a slit, which penetrates through the substrate and has a gradually reduced dimension from a first surface of the substrate to a second surface of the substrate. The micro diffraction grating, disposed on the first optical path, receives the second optical signal and separates the second optical signal into a plurality of spectrum components travelling along a second optical path. The optical module of the micro spectrometer with the tapered slit and slit structure thereof according to the embodiment of the invention can be manufactured in a mass-production manner using the semiconductor manufacturing processes, so that the cost can be decreased, and the slit can have a smooth surface, which avoids the negative effect on the incident light.
SPECTROPHOTOMETER, SPECTROMETER, AND METHOD OF MANUFACTURING SPECTROPHOTOMETER
A spectrophotometer 300 includes a white light source 212, condenser lenses 242a, 242b that collect light emitted from the white light source 212, a slit 245 that diffracts the light collected by the condenser lenses 242a, 242b, a concave diffraction grating 246 that splits the light having passed through the slit 245, and a multi-wavelength detector 248 having a plurality of photodetection elements 304 that detect the light split by the concave diffraction grating 246, and each of the plurality of photodetection elements 304 included in the multi-wavelength detector 248 is arranged at an image position of the concave diffraction grating 246.
Multi-mode imaging spectrometer
A multi-mode imaging spectrometer that incorporates two orthogonally positioned entrance slits and is configurable between a first mode in which the system produces images of relatively wide spatial coverage with moderate spectral resolution, using a first one of the two slits, and a second mode in which the system produces images of a smaller spatial area with fine spectral resolution, using the other one of the two slits.
Multi-mode imaging spectrometer
A multi-mode imaging spectrometer that incorporates two orthogonally positioned entrance slits and is configurable between a first mode in which the system produces images of relatively wide spatial coverage with moderate spectral resolution, using a first one of the two slits, and a second mode in which the system produces images of a smaller spatial area with fine spectral resolution, using the other one of the two slits.