In an optical device, a base and a movable unit are constituted by a semiconductor substrate including a first semiconductor layer, an insulating layer, and a second semiconductor layer in this order from one side in a predetermined direction. The base is constituted by the first semiconductor layer, the insulating layer, and the second semiconductor layer. The movable unit includes an arrangement portion that is constituted by the second semiconductor layer. The optical function unit is disposed on a surface of the arrangement portion on the one side. The first semiconductor layer that constitutes the base is thicker than the second semiconductor layer that constitutes the base. A surface of the base on the one side is located more to the one side than the optical function unit.

A polarized Raman Spectrometric system for defining parameters of a polycrystaline material, the system comprises a polarized Raman Spectrometric apparatus, a computer-controlled sample stage for positioning a sample at different locations, and a computer comprising a processor and an associated memory. The polarized Raman Spectrometric apparatus generates signal(s) from either small sized spots at multiple locations on a sample or from an elongated line-shaped points on the sample, and the processor analyzes the signal(s) to define the parameters of said polycrystalline material.

A polarized Raman Spectrometric system for defining parameters of a polycrystaline material, the system comprises a polarized Raman Spectrometric apparatus, a computer-controlled sample stage for positioning a sample at different locations, and a computer comprising a processor and an associated memory. The polarized Raman Spectrometric apparatus generates signal(s) from either small sized spots at multiple locations on a sample or from an elongated line-shaped points on the sample, and the processor analyzes the signal(s) to define the parameters of said polycrystalline material.

A spectrometer for detecting an electromagnetic (EM) wave spectrum having one or more wavelength components within a spectral band of interest, and a method of detecting an electromagnetic (EM) wave spectrum having one or more wavelength components within a spectral band of interest. The method uses an entrance aperture; a dispersion and imaging optics containing at least one dispersion element; an exit aperture; a collection optics; and at least one single-pixel detector, each single-pixel detector sensitive to one or more of the wavelength components; and the method comprises the steps of spatially encoding at least one entrance slit of the entrance aperture along a direction substantially transverse to a direction of dispersion of the dispersion and imaging optics; creating, using the dispersion and imaging optics, dispersed images of the entrance aperture on a plane of the exit aperture, such that respective images at the different wavelength components are offset by different amounts of displacements along the direction of dispersion; spatially encoding a plurality of exit slits of the exit aperture along the direction substantially transverse to the direction of dispersion, wherein the exit aperture comprises a plurality of exit slits arranged in the direction of dispersion; gathering, using the collection optics, a total EM wave energy that enters the entrance aperture and exits the exit aperture to one of the at least one single-pixel detectors; changing at least one of an encoding pattern of the at least one entrance slits and an encoding pattern of the plurality of exit slits for a number of times; and measuring the output of the at least one detector for respective ones of the number of times for reconstructing the EM wave spectrum.

An optical module includes a support layer, a device layer which is provided on the support layer, and a movable mirror which is mounted in the device layer. The device layer has a mounting region which is penetrated by the movable mirror, and a driving region which is connected to the mounting region. A space corresponding to at least the mounting region and the driving region is formed between the support layer and the device layer. A portion of the movable mirror is positioned in the space.

An electronic device may include sensors such as a visible-light image sensor for capturing images. The sensors may also include optical sensors that operate at other wavelengths. An infrared light sensor may be used to gather an infrared light spectrum of a target object. The infrared light sensor may have a beam steerer and other adjustable components such as adjustable lenses and adjustable polarizers. During operation, an infrared beam emitted by the infrared light sensor may be steered onto the target object using information from a captured visible-light image and/or other sensor data such as distance sensor data, orientation sensor data, three-dimensional image sensor data, and data from other sensors. Infrared spectra, visible-light camera images, and/or data from other sensors may be used in characterizing target objects so that notifications can be provided to a user and other actions taken.

An optical assembly for an analyzer instrument for analysis of elemental composition of a sample using optical emission spectroscopy includes: an exciter generating an excitation focused at a target position to produce optical emission from the sample; and an optical arrangement including a light collection arrangement transferring the optical emission from the target position to a detector assembly's detector interface. The light collection arrangement includes: an off-axis parabolic light collecting mirror including an aperture, a lens arrangement including converging and diverging axicon lens portions, the lens arrangement positioned so its optical axis is parallel to that of the light collecting mirror and intersects a surface of the light collecting mirror at the aperture, and an off-axis parabolic focusing mirror having its focal point at the detector interface, the optical axis of the lens arrangement being parallel to that of the focusing mirror and intersects the focusing mirror's surface.

An optical assembly for an analyzer instrument for analysis of elemental composition of a sample using optical emission spectroscopy includes: an exciter generating an excitation focused at a target position to produce optical emission from the sample; and an optical arrangement including a light collection arrangement transferring the optical emission from the target position to a detector assembly's detector interface. The light collection arrangement includes: an off-axis parabolic light collecting mirror including an aperture, a lens arrangement including converging and diverging axicon lens portions, the lens arrangement positioned so its optical axis is parallel to that of the light collecting mirror and intersects a surface of the light collecting mirror at the aperture, and an off-axis parabolic focusing mirror having its focal point at the detector interface, the optical axis of the lens arrangement being parallel to that of the focusing mirror and intersects the focusing mirror's surface.

Systems and methods here may be used for automated capturing and analyzing spectrometer data of multiple sample gemstones on a stage, including mapping digital camera image data of samples, applying a Raman Probe to a first sample gemstone under evaluation on the stage, receiving spectrometer data of the sample gemstone from the probe, automatically moving the stage to a second sample, using the image data, and analyzing the other samples.

A spectral sensor comprising a Fabry-Perot interferometer having a pair of reflectors, a photodetector located beneath the Fabry-Perot interferometer, a capacitance measurement circuit configured to measure a capacitance of the Fabry-Perot interferometer, and a controller configured to control a voltage applied across the reflectors of the Fabry-Perot interferometer.