G01J2003/1208

Monolithic assembly of reflective spatial heterodyne spectrometer

Novel monolithic cyclical reflective spatial heterodyne spectrometers (CRSHS) are presented. Monolithic CRSHS in accordance with the invention have a single frame wherein a flat mirror, roof mirror, and symmetric grating are affixed. The invention contains only fixed parts; the flat mirror, roof mirror, and symmetric grating do not move in relation to the frame. Compared to conventional CRSHS known in the art, the present invention enables much smaller and lighter CRSHS, requires less time and skill for maintenance, and is a better economic option. The disclosed invention may include fixed field-widening optical elements or a fiber-fed assembly.

attachable spectroscope to an auxiliary CCD or CMOS camera as detector for gem identification
20170322082 · 2017-11-09 ·

The present invention includes a spectroscope for gem identification and a fixing device to connect the spectroscope and an auxiliary image sensor. The functional compartments of the spectroscope concerning the present invention include a tube, an incident window, a slit, lens, a newly designed grism, and an exit window; there are two different kind of fixing device designed to fulfill its purpose, one is a clamp, the other is a shell.

FIELD LENS CORRECTED THREE MIRROR ANASTIGMAT SPECTROGRAPH
20170268927 · 2017-09-21 ·

A spectrograph that includes camera focusing optics with a primary mirror having a concave-shaped reflective mirror surface, a secondary mirror having a convex-shaped reflective mirror surface and positioned to receive light reflected by the primary mirror, a tertiary mirror having a concave reflective mirror surface and positioned to receive light reflected by the secondary mirror, and a field correcting lens comprising a convex lens surface in combination with a concave lens surface, wherein light received by said field correcting lens from said tertiary mirror enters said convex lens surface, traverses said field correcting lens, and exits from said concave lens surface. The optional field correcting lens is positioned such that the primary mirror, secondary mirror, tertiary mirror, and the field correcting lens share the common parent vertex axis.

METHOD AND APPARATUS FOR CONFOCAL MICROSCOPES
20210396981 · 2021-12-23 ·

Methods and system for chromatic confocal microscopy are described. One example chromatic confocal microscope system includes a hyperchromatic objective lens configured to focus the light of different wavelengths onto different corresponding focal planes that are separated from one another within a sample object, focusing optics positioned to receive multi-spectral light reflected from the sample object after passing through the hyperchromatic objective lens, a detection slit to receive light from the focusing optics and to block at least a portion of light that is incident thereon, and a grating positioned to receive light after passing through the detection slit and to produce spatially separated light of different wavelengths to enable the detection of spatially separated light by an imaging sensor. The described chromatic confocal microscopes may be used to develop low-cost chromatic confocal endoscopes for disease diagnosis of human internal organs in vivo.

COMPACT SPECTROMETERS AND INSTRUMENTS INCLUDING THEM
20210381890 · 2021-12-09 ·

A spectrometer with a Schmidt reflector is described. The spectrometer may include a Schmidt corrector and a dispersive element as separate components. Alternatively, the Schmidt corrector and dispersive element may be combined into a single optical component. The spectrometer may further include a field-flattener lens.

OPTIC FOR MULTI-PASS OPTICAL CHANNEL MONITOR
20220209864 · 2022-06-30 ·

An optical device may include a dispersion element. The optical device may include a reflective optic to reflect an optical beam with a fixed offset perpendicular to a dispersion direction of the dispersion element and with a negative offset in the dispersion direction of the dispersion element. The reflective optic may be aligned to the dispersion element to offset an optical beam with respect to the dispersion element and to cause the optical beam to pass through the dispersion element on a plurality of passes, offsetting the optical beam on each of the plurality of passes.

TIME-OF-FLIGHT IMAGING AND PHYSIOLOGICAL MEASUREMENTS
20220160234 · 2022-05-26 ·

A measurement system is provided with an array of laser diodes with one or more Bragg reflectors. At least a portion of the light generated by the array is configured to penetrate tissue comprising skin. A detection system configured to: measure a phase shift, and a time-of-flight, of at least a portion of the light from the array of laser diodes reflected from the tissue relative to the portion of the light generated by the array; generate one or more images of the tissue; detect oxy- or deoxy-hemoglobin in the tissue; non-invasively measure blood in blood vessels within or below a dermis layer within the skin; measure one or more physiological parameters based at least in part on the non-invasively measured blood; and measure a variation in the blood or physiological parameter over a period of time.

Inspection device, PTP packaging machine and PTP sheet manufacturing method

An inspection device includes: an irradiator that irradiates an object with near-infrared light; a spectroscope that has a slit where reflected light enters and that disperses the reflected light into wavelength component lights; an imaging device that comprises an imaging element that takes a spectroscopic image of the wavelength component lights; and a processor that: obtains spectral data based on the spectroscopic image; and detects a type of the object using a predetermined analysis based on the spectral data. Each of the wavelength component lights is a single wavelength light, the inspection device satisfies L≥2P, where L is a width of each of the wavelength component lights in a wavelength dispersion direction on a light receiving surface of the imaging element and P is a width of a pixel in the wavelength dispersion direction on the light receiving surface.

Hyperspectral sensor

Provided is a hyperspectral sensor including a spectral angle converting unit configured to convert an angle of incident light differently according to a wavelength, a diffraction unit configured to selectively diffract the incident light according to an incident angle and a wavelength, a focusing optics including at least one lens, and configured to collect diffracted light passing through the diffraction unit, and an image sensor configured to acquire an image passing through the focusing optics and formed on a focal plane, wherein the diffraction unit includes a volume Bragg grating having a periodic refractive index distribution therein.

Spectroscopic analysis device

A spectroscopic analysis device includes a light source configured to emit light including a plurality of wavelength components, a polarizer configured to convert the light emitted from the light source to a light of linearly polarized light to be radiated to a sample, a polarizing diffraction element configured to diffract and spectrally disperse a first polarization component included in the light having passed through the sample in a first direction, the polarizing diffraction element being configured to diffract and spectrally disperse a second polarization component included in the light in a second direction different from the first direction, a prism which is disposed on an exit side of the polarizing diffraction element and which has a first exit surface crossing the first direction and a second exit surface crossing the second direction, and in which angles of the first exit surface and the second exit surface with respect to a reference plane including the first direction and the second direction are different, an imaging element configured to capture an image of the first polarization component emitted from the first exit surface of the prism and an image of the second polarization component emitted from the second exit surface, and a processor configured to analyze the sample based on an imaging result of the imaging element.