G01J2003/1226

TRACE MICROANALYSIS MICROSCOPE SYSTEMS AND METHODS
20220412802 · 2022-12-29 · ·

The invention discloses a Trace Microanalysis Microscope System for high throughput screening. A multimodal imaging sensor arrangement acquires color, multispectral, hyperspectral and multi-directional polarized imaging, independently and in combinations thereof. In one aspect of this disclosure, the multimodal acquisition is combined with a plurality of sample illumination modes, further expanding the dimensionality of the generated data. In another aspect of this invention, machine learning-based methods combining and comparing a- priori data with the acquired multimodal data space, provide unique identifiers for the composition of the analyzed target objects. In yet another aspect of this invention, projection mapping of the identified compositional features navigates secondary sampling for subsequent analyses.

Image sensor and method of operating

Optical spectrometers may be used to determine the spectral components of electromagnetic waves. Spectrometers may be large, bulky devices and may require waves to enter at a nearly direct angle of incidence in order to record a measurement. What is disclosed is an ultra-compact spectrometer with nanophotonic components as light dispersion technology. Nanophotonic components may contain metasurfaces and Bragg filters. Each metasurface may contain light scattering nanostructures that may be randomized to create a large input angle, and the Bragg filter may result in the light dispersion independent of the input angle. The spectrometer may be capable of handling about 200 nm bandwidth. The ultra-compact spectrometer may be able to read image data in the visible (400-600 nm) and to read spectral data in the near-infrared (700-900 nm) wavelength range. The surface area of the spectrometer may be about 1 mm.sup.2, allowing it to fit on mobile devices.

Photosensors for color measurement
11592334 · 2023-02-28 · ·

A sensor package includes a semiconductor sensor chip having multiple light sensitive regions each of which defines a respective light sensitive channel. An optical filter structure is disposed over the sensor chip and includes filters defining respective spectral functions for different ones of the light sensitive channels. In particular, the optical filter structure includes at least three optical filters defining spectral functions for tristimulus detection by a first subset of the light sensitive channels, and at least one additional optical filter defining a spectral function for spectral detection by a second subset of the light sensitive channels encompassing a wavelength range that differs from that of the first subset of light sensitive channels.

Sensor window comprising a plurality of sets of layers to reflect one or more colors of light that match a surface adjacent to the sensor window

A sensor window may include a substrate and a set of layers disposed onto the substrate. The set of layers may include a first subset of layers of a first refractive index and a second set of layers of a second refractive index different from the first refractive index. The set of layers may be associated with a threshold transmissivity in a sensing spectral range. The set of layers may be configured to a particular color in a visible spectral range and may be associated with a threshold opacity in the visible spectral range.

IMAGE SENSOR AND METHOD OF OPERATING

Optical spectrometers may be used to determine the spectral components of electromagnetic waves. Spectrometers may be large, bulky devices and may require waves to enter at a nearly direct angle of incidence in order to record a measurement. What is disclosed is an ultra-compact spectrometer with nanophotonic components as light dispersion technology. Nanophotonic components may contain metasurfaces and Bragg filters. Each metasurface may contain light scattering nanostructures that may be randomized to create a large input angle, and the Bragg filter may result in the light dispersion independent of the input angle. The spectrometer may be capable of handling about 200 nm bandwidth. The ultra-compact spectrometer may be able to read image data in the visible (400-600 nm) and to read spectral data in the near-infrared (700-900 nm) wavelength range. The surface area of the spectrometer may be about 1 mm.sup.2, allowing it to fit on mobile devices.

ILLUMINANT CORRECTION FOR A SPECTRAL IMAGER

A sensor system includes an array of optical sensors on an integrated circuit and a plurality of sets of optical filters atop at least a portion of the array. Each set of optical filters is associated with a set of optical sensors of the array, with a set of optical filters including a plurality of optical filters, with each optical filter being configured to pass light in a different wavelength range. A first interface is configured to interface with the optical sensors and first processing circuitry that is configured to execute operational instructions for receiving an output signal representative of received light from the optical sensors and determining a spectral response for each set of optical sensors. A second interface is configured to interface with the first processing circuitry with second processing circuitry that is configured for determining, based on the spectral response for each set of optical sensors, an illuminant spectrum for each spectral response and then substantially remove the illuminant spectrum from the spectral response.

Correction and calibration of spectral sensor output

An spectral sensor system includes an array of optical sensors arranged on an integrated circuit, an interface between the plurality of optical sensors and a first processing device, a plurality of sets of optical filters configured as a layer located atop the plurality of optical sensors, with each set of optical filters including a plurality of optical filters, each optical filter configured to pass light in a different wavelength range. The spectral sensor system includes a memory configured to interface with the first processing device, the memory configured to store calibration data associated with the plurality of sets of optical sensors. The spectral sensor system further includes second processing device includes an artificial neural network configured to correct a spectral response generated by the plurality of optical sensors and an interface between the first processing device and the second processing device is configured to transmit information therebetween.

FILTER ARRAY AND LIGHT DETECTION SYSTEM
20230092032 · 2023-03-23 ·

A filter array includes optical filters that are disposed in a two-dimensional plane. At least one optical filter of the optical filters includes an interference layer having a first surface and a second surface opposite the first surface, and a reflective layer provided on the first surface. A transmission spectrum of the at least one optical filter has maximum values. The reflective layer is not provided on the second surface.

MINIATURE SPECTRUM MEASURING DEVICE AND THIN FILM FILTER
20230092614 · 2023-03-23 ·

A filter and a miniature spectrum measuring device are provided. The filter includes a plurality of film structures. Each of the film structures includes an H-type structural film, an L-type structural film, and a cavity film disposed between the H-type structural film and the L-type structural film.

Measurement device and measurement method
11480466 · 2022-10-25 · ·

Provided is a measurement device including a spectroscope, a movement mechanism configured to relatively move the spectroscope in one direction, and one or more processors configured to determine whether a measurement position measured by the spectroscope is moved into a color patch, in which the one or more processors cause the spectroscope to execute measurement processing for a plurality of wavelengths set in advance while relatively moving the spectroscope in the one direction, and when at least one of amounts of variation of measured values with respect to each of the plurality of wavelengths obtained in the measurement processing exceeds a first threshold value and then each of the amounts of variation of the measured values of the plurality of wavelengths falls below a second threshold value which is less than or equal to the first threshold value, determine that the measurement position is moved into the color patch.