An LED lighting based multispectral imaging system for color measurement is provided, including a main control computer and an enclosed type lamp box, where a digital camera is provided at the top of the lamp box, and an LED lamp set control apparatus, a drawer type bearing platform, and an LED lamp set are provided at the bottom of the lamp box. A to-be-measured object is placed on the drawer type bearing platform. The main control computer controls spectral power distribution of the LED lamp set to be in a reciprocal relationship with a spectral sensitivity curve of the digital camera and extracts a camera response and performs calculation, to obtain spectral reflectivity of each pixel of the to-be-measured object.

Disclosed are methods of fabricating an integrated computational element for use in an optical computing device. One method includes providing a substrate that has a first surface and a second surface substantially opposite the first surface, depositing multiple optical thin films on the first and second surfaces of the substrate via a thin film deposition process, and thereby generating a multilayer film stack device, cleaving the substrate to produce at least two optical thin film stacks, and securing one or more of the at least two optical thin film stacks to a secondary optical element for use as an integrated computational element (ICE).

A spectrum-inspection device includes: a sensor unit array including a first sensor unit and a second sensor unit; a dual-band pass filter disposed on the sensor unit array to cover the first sensor unit and the second sensor unit, wherein the dual-band pass filter allows a first waveband and a second waveband of a light beam to pass through; and a filter disposed on the dual-band pass filter to cover the second sensor unit, wherein the filter allows wavelengths of a light beam longer than a first wavelength to pass through, wherein the first wavelength is longer than a peak wavelength of the first waveband and shorter than a peak wavelength of the second waveband.

A divided pulse nonlinear optical source may be generated by combining nonlinear wave generation techniques with pulse division that can divide a parent pulse into N divided pulses, each divided pulse separate temporally. The N divided pulses can be passed into a nonlinear optical medium to generate an output. The output can include at least one output pulse for each divided pulse. The center wavelengths of each output pulse can be tuned so that each may have a center wavelength that is the same as, or differs from, each other output pulse. In some embodiments, the output pulses may be combined to generate the output. The output can be power scalable and wavelength tunable.

A spectrometer includes an illuminating section; a receiving section configured to detect radiation reflected from an object including an optically inhomogeneous scattering medium; a hardware section configured to obtain a solution of an inverse problem to reconstruct an absorption spectrum of the optically inhomogeneous scattering medium, wherein the illuminating section includes at least one light-emitting diode source, a radiation spectral curve of which is divided, by at least two spectral filters having different spectral transmission curves, into at least two spectral regions, to form an equivalent radiation spectrum from at least two spectral sources, and wherein the hardware section applies the solution of the inverse problem based on information about a spectral content of the radiation of the illuminating section, a signal obtained in a form of a response from the optically inhomogeneous scattering medium, and a spectral sensitivity curve of the receiving section.

An analyzer includes an acquirer configured to acquire color information on visible light and at least one of ultraviolet light and infrared light from image data, a memory configured to store reference data on the color information, and a determiner configured to determine characteristic data of an object in the image data based on the color information, the reference data, and an image capturing condition information. The image capturing condition information contains information on a spectral characteristic of illumination light in image capturing, and a spectral sensitivity curve of an image sensor and information on a spectral transmittance of an image capturing optical system.

A system for providing variable wavelength intensity attenuation to said focused beams by application of an aperture-like element that comprises at least two regions of filter material, or comprises different materials graded into one another, which different materials that have different responses to different wavelengths, wherein said system is applied to reduce differences in wavelength intensity levels when applied in collimated portions of a beam as a Spectral Angle Adjustor (SAA) or to preserve information in a beam while changing said beam effective diameter as a Spectral Aperture Stop (SAS); or to affect a Spectral Field Stop (SFS) that controls source image size when applied at a convergent/divergent beam focal point as a Spectrally Varying Aperture, (SVA) the end result depending on where in a beam it is applied.

A spectrum-inspection device includes: a sensor unit array including a first sensor unit and a second sensor unit; a dual-band pass filter disposed on the sensor unit array to cover the first sensor unit and the second sensor unit, wherein the dual-band pass filter allows a first waveband and a second waveband of a light beam to pass through; and a filter disposed on the dual-band pass filter to cover the second sensor unit, wherein the filter allows wavelengths of a light beam longer than a first wavelength to pass through, wherein the first wavelength is longer than a peak wavelength of the first waveband and shorter than a peak wavelength of the second waveband.

A spectrometer includes an illuminating section; a receiving section configured to detect radiation reflected from an object including an optically inhomogeneous scattering medium; a hardware section configured to obtain a solution of an inverse problem to reconstruct an absorption spectrum of the optically inhomogeneous scattering medium, wherein the illuminating section includes at least one light-emitting diode source, a radiation spectral curve of which is divided, by at least two spectral filters having different spectral transmission curves, into at least two spectral regions, to form an equivalent radiation spectrum from at least two spectral sources, and wherein the hardware section applies the solution of the inverse problem based on information about a spectral content of the radiation of the illuminating section, a signal obtained in a form of a response from the optically inhomogeneous scattering medium, and a spectral sensitivity curve of the receiving section.

A spectrometer includes an illuminating section; a receiving section configured to detect radiation reflected from an object including an optically inhomogeneous scattering medium; a hardware section configured to obtain a solution of an inverse problem to reconstruct an absorption spectrum of the optically inhomogeneous scattering medium, wherein the illuminating section includes at least one light-emitting diode source, a radiation spectral curve of which is divided, by at least two spectral filters having different spectral transmission curves, into at least two spectral regions, to form an equivalent radiation spectrum from at least two spectral sources, and wherein the hardware section applies the solution of the inverse problem based on information about a spectral content of the radiation of the illuminating section, a signal obtained in a form of a response from the optically inhomogeneous scattering medium, and a spectral sensitivity curve of the receiving section.