A system for testing a spectral response speed of a tunable filter is disclosed, which includes a collimating light source, a beam splitting element, a focusing lens, and an image recording device of light spot position arranged successively. The tunable filter is disposed between the collimating light source and the beam splitting element and configured to be continuously tuned within a certain wavelength range during testing. The beam splitting element is used to form light beams of different wavelength bands passing through the tunable filter into diffracted beams or refracted beams corresponding to different wavelength bands. The focusing lens is used to perform focusing. The image recording device of light spot position is used to record change information about positions where the diffracted beams or refracted beams corresponding to different wavelength bands are imaged.

A system and method for assaying high and low abundant biomolecules within a biological fluid sample is provided. The method includes: a) placing a biological fluid sample in contact with a first nanostructure surface; b) interrogating the sample with a light source, the sample in contact with the first nanostructure surface, the interrogation using a SERS technique; c) detecting an enhanced Raman scattering from at least one high abundant biomolecule type and producing first signals representative thereof; d) placing the sample in contact with a second nanostructure surface having a targeting agent that targets a low abundant biomolecule; e) interrogating the sample with the light source using the SERS technique; f) detecting the enhanced Raman scattering from the low abundant biomolecules and producing second signals representative thereof; and g) assaying the biological fluid sample using the first signals and the second signals.

An imaging system uses a dynamically varying coded mask, such as a spatial light modulator (SLM), to time-encode multiple degrees of freedom of a light field in parallel and a detector and processor to decode the encoded information. The encoded information may be decoded at the pixel level (e.g., with independently modulated counters in each pixel), on a read-out integrated circuit coupled to the detector, or on a circuit external to the detector. For example, the SLM, detector, and processor may create modulation sequences representing a system of linear equations where the variables represent a degree of freedom of the light field that is being sensed. If the number of equations and variables form a fully determined or overdetermined system of linear equations, the system of linear equations' solution can be determined through a matrix inverse. Otherwise, a solution can be determined with compressed sensing reconstruction techniques with the constraint that the signal is sparse in the frequency domain.

A detection device (113) for a microscope comprises a dispersive element (211) in the beam path (290) of light and a selection element (212). The selection element (212) separates a beam path (291) of a spectral portion of the light from the beam path (290) of the light. The detector device (113) furthermore comprises a focusing optical unit (213) configured to focus the beam path (291) of the spectral portion of the light onto a sensor (214). By way of example, the microscope may be a confocal microscope.

A detection device (113) for a microscope comprises a dispersive element (211) in the beam path (290) of light and a selection element (212). The selection element (212) separates a beam path (291) of a spectral portion of the light from the beam path (290) of the light. The detector device (113) furthermore comprises a focusing optical unit (213) configured to focus the beam path (291) of the spectral portion of the light onto a sensor (214). By way of example, the microscope may be a confocal microscope.

An optical system operating in the near or short-wave infrared wavelength range identifies an object based on water absorption. The system comprises a light source with modulated light emitting diodes operating at wavelengths near 1090 and 1440 nanometers, corresponding to lower and higher water absorption. The system further comprises one or more wavelength selective filters and a housing that is further coupled to an electrical circuit and a processor. The detection system comprises photodetectors that are synchronized to the light source, and the detection system receives at least a portion of light reflected from the object. The system is configured to identify the object by comparing the reflected light at the first and second wavelength to generate an output value, and then comparing the output value to a threshold. The optical system may be further coupled to a wearable device or a remote sensing system with a time-of-flight sensor.

An optical system operating in the near or short-wave infrared wavelength range identifies an object based on water absorption. The system comprises a light source with modulated light emitting diodes operating at wavelengths near 1090 and 1440 nanometers, corresponding to lower and higher water absorption. The system further comprises one or more wavelength selective filters and a housing that is further coupled to an electrical circuit and a processor. The detection system comprises photodetectors that are synchronized to the light source, and the detection system receives at least a portion of light reflected from the object. The system is configured to identify the object by comparing the reflected light at the first and second wavelength to generate an output value, and then comparing the output value to a threshold. The optical system may be further coupled to a wearable device or a remote sensing system with a time-of-flight sensor.

A total reflection spectroscopic measurement device includes a terahertz wave generation unit, an internal total reflection prism, a detection unit configured to detect the terahertz wave, an electric field vector measurement unit configured to measure an electric field vector of the terahertz wave, and an analysis unit configured to acquire information about an optical constant of the object to be measured. Proportions of S polarization component and P polarization component of the terahertz wave are constant. The analysis unit acquires the information about the optical constant on the basis of a ratio between S polarization component and P polarization component of the measured electric field vector when the object is not arranged on the total reflection surface and a ratio between S polarization component and P polarization component of the measured electric field vector when the object is arranged on the total reflection surface.

A total reflection spectroscopic measurement device includes a terahertz wave generation unit, an internal total reflection prism, a detection unit configured to detect the terahertz wave, an electric field vector measurement unit configured to measure an electric field vector of the terahertz wave, and an analysis unit configured to acquire information about an optical constant of the object to be measured. Proportions of S polarization component and P polarization component of the terahertz wave are constant. The analysis unit acquires the information about the optical constant on the basis of a ratio between S polarization component and P polarization component of the measured electric field vector when the object is not arranged on the total reflection surface and a ratio between S polarization component and P polarization component of the measured electric field vector when the object is arranged on the total reflection surface.

A polarimetry apparatus comprising a plurality of flexible light conduits each having first and second ends, and a respective polarization modulator associated with each light conduit, wherein each light conduit is configured to receive incident light from a different predetermined region in space via the first end, and deliver said light to a detector unit via the second end, and wherein the polarization modulator is configured to modulate the polarization of the light to enable a partial or complete polarization state of the incident light to be determined by the detector unit for each light conduit.