An optical device may include a plurality of sensor elements and a plurality of optical channels. The plurality of sensor elements may include a first set of sensor elements associated with a first wavelength range and a second set of sensor elements associated with a second wavelength range. The plurality of optical channels may include a first set of optical channels associated with the first wavelength range and a second set of optical channels associated with the second wavelength range. A first optical channel, of the first set of optical channels, may be disposed over a first sensor element, of the first set of sensor elements, and a second optical channel, of the second set of optical channels, may be disposed over a second sensor element, of the second set of sensor elements.

The device comprises an array (8) of cells (10), with each cell having a single-photon avalanche diode (12) and a quenching circuit (14). Each cell (10) further comprises a first analog output (A) as well as a digital output (D). A latch (20) is provided for buffering a pulse generated by the diode (12) and selectively feeding it to the digital output (D). The cells (10) are arranged in rows and columns, and the outputs (A, D) are fed to analog and digital bus lines (40, 42) for off-array analog and digital signal processing. A data switch (54) and a shift register (58) are provided for serializing various measurement results detected by the device.

A spectral filter may include a plurality of filter arrays each including a plurality of unit filters having different center wavelengths from each other. Each of the plurality of unit filters may include a first metal reflection layer and a second metal reflection layer which are disposed to be apart from each other; a cavity including a first pattern and being arranged between the first metal reflection layer and the second metal reflection layer; and a lower pattern film being disposed under the first metal reflection layer and including a second pattern. In unit filters having a same center wavelength in each of the plurality of unit filters corresponding to the plurality of filter arrays, the first pattern of the cavity and the second pattern of the lower pattern film may vary according to a position of the unit filters.

An optical system for a hyperspectral camera and a hyperspectral camera comprising such an optical system are disclosed. The optical system comprises fore optics (1000), an image sensor (1800), a slit (1500), relay optics (1200), a first optical element (2000) positioned before the slit (1500), where the first optical element (2000) is defocusing light in a direction parallel to the slit (1500) while keeping focus in a direction perpendicular to the slit (1500); and a second optical element (2100) positioned after the slit (1500), where the second optical element (2100) is compensating the defocus of the depicted scene introduced by the first element (2000).

Aspects of the present disclosure provide a method for wavelength calibration of a spectrometer. The method can include receiving a calibration light signal having first spectral components of different first wavelengths; separating and projecting the first spectral components onto pixels of a detector of the spectrometer; establishing a relation between the first wavelengths and pixel numbers of first pixels on which the first spectral components are projected; calculating first residual errors between the first wavelengths and estimated wavelengths that are associated by the relation to the pixel numbers of the first pixels; receiving an optical signal having a second spectral component of a second wavelength; projecting the optical signal onto a second pixel; and calibrating the second wavelength based on a second residual error calculated based on one of the first residual errors that corresponds to a pair of the first pixels between which the second pixel is located.

The invention relates to a device for conducting radiation, a photodetector arrangement, and a method for spatially resolved spectral analysis.

A polarized Raman Spectrometric system for defining parameters of a polycrystaline material, the system comprises a polarized Raman Spectrometric apparatus, a computer-controlled sample stage for positioning a sample at different locations, and a computer comprising a processor and an associated memory. The polarized Raman Spectrometric apparatus generates signal(s) from either small sized spots at multiple locations on a sample or from an elongated line-shaped points on the sample, and the processor analyzes the signal(s) to define the parameters of said polycrystalline material.

The invention discloses a Trace Microanalysis Microscope System for high throughput screening. A multimodal imaging sensor arrangement acquires color, multispectral, hyperspectral and multi-directional polarized imaging, independently and in combinations thereof. In one aspect of this disclosure, the multimodal acquisition is combined with a plurality of sample illumination modes, further expanding the dimensionality of the generated data. In another aspect of this invention, machine learning-based methods combining and comparing a- priori data with the acquired multimodal data space, provide unique identifiers for the composition of the analyzed target objects. In yet another aspect of this invention, projection mapping of the identified compositional features navigates secondary sampling for subsequent analyses.

This invention addresses the abovementioned problem, and the purpose of this invention is to provide a far-infrared spectroscopy device that uses an is-TPG method to generate far-infrared light, and is capable of efficiently detecting is-TPG light without a detection optical system being fine-tuned. Even if the far-infrared light incidence angles on an Si prism for detection are the same when far-infrared light having a first frequency is incident on a non-linear optical crystal for detection and when far-infrared light having a second frequency is incident on the non-linear optical crystal for detection, this far-infrared. spectroscopy device adjusts the incidence surface angle of pump light in relation to the non-linear optical crystal for detection such that the angle of the far-infrared light in relation to the pump light within the non-linear optical crystal for detection can be appropriately set for each far-infrared light frequency (see FIG. 1A).

Improved imaging and spectrographic devices and systems, and in particular hyperspectral systems and devices suitable for use in analysis of soils and other geological substances, as well as other types of samples. The hyperspectral systems comprise diffraction gratings and a linear image sensor, and optionally one or more of light sources, lenses, slits, and digital light processors, and corresponding control processors and memory. Among other advantages, the hyperspectral systems and devices enable detailed spectrographic analysis of specific points, regions, and/or areas in analytical samples such as core samples and other types of soil blocks, using visible, infrared, and/or ultraviolet electromagnetic radiation.