G01J3/2823

Imaging assisted scanning spectroscopy for gem identification

Systems and methods here may be used for automated capturing and analyzing spectrometer data of multiple sample gemstones on a stage, including mapping digital camera image data of samples, applying a Raman Probe to a first sample gemstone under evaluation on the stage, receiving spectrometer data of the sample gemstone from the probe, automatically moving the stage to a second sample, using the image data, and analyzing the other samples.

Image generation apparatus and image generation method
11503254 · 2022-11-15 · ·

An image generation apparatus includes: a spectroscopic filter switching a wavelength of transmitted image light depending on a change in distance between a pair of reflective films; an imaging element imaging the image light transmitted through the spectroscopic filter; and one or more processors, which switches the wavelength of the transmitted light to a plurality of wavelengths in forward scanning to narrow the distance between the reflective films and backward scanning to widen the distance between the reflective films, switches the wavelength of the transmitted light to wavelengths of red, green, and blue colors in the forward scanning and the backward scanning, synthesizing a color image by synthesizing spectroscopic images of the red, green, and blue colors obtained in the forward scanning performed once, and generating a color image by synthesizing spectroscopic images of the red, green, and blue colors obtained in the backward scanning performed once.

DETECTOR ARRAY AND A SPECTROMETER SYSTEM

Disclosed herein are a detector array, a spectrometer system including the detector array and a method of using of the spectrometer system. The detector array includes a substrate; and a plurality of detector pixels applied to a surface of the substrate, where each detector pixel has a sensor region which is designated for receiving a partition of incident light, where each detector pixel is designated for generating a sensor signal depending on an intensity of the partition of the incident light received by the sensor region of the detector pixel, where at least two adjacent detector pixels share a single connection to a common electric potential, and where the sensor regions of at least two of the detector pixels differ with respect to each other by an area of the corresponding sensor region.

SYSTEMS AND METHODS FOR HYPERSPECTRAL IMAGING AND ARTIFICIAL INTELLIGENCE ASSISTED AUTOMATED RECOGNITION OF DRUGS
20220358755 · 2022-11-10 ·

This disclosure relates to a system and a method for automated recognition of drugs. This disclosure also relates to a system for automated recognition of drugs comprising a hyper-spectral imaging system. This disclosure also relates to a hyper-spectral imaging system configured to automatically recognize drugs by using a neural network. This disclosure relates to training the neural network to identify a drug type (e.g., the name of the drug) based on an image (e.g., normal visible image and/or hyperspectral image) of the drug.

PHENOTYPING IMAGING SYSTEM WITH AUTOMATIC LEAF-HANDLING MECHANISM

A method and system are disclosed for providing consistent images of leaves of plants, including articulating a lower case of a housing with respect to an upper case via an imaging chamber articulation mechanism from i) a closed state to ii) an open state, the articulable space forms an imaging chamber which is dark when the imaging chamber articulation mechanism is in the closed state, placing the leaf within the imaging chamber, articulating the imaging chamber articulation mechanism to the closed state, activating one or more light sources, actuating a linear actuator to thereby linearly move a camera from i) an initial position to ii) an end position, obtaining images from the camera, re-actuating the linear actuator to thereby linearly move the camera from the end position to the initial position, re-articulating the lower case to the open state, and removing the leaf.

Single-sensor hyperspectral imaging device
11493675 · 2022-11-08 · ·

The present disclosure generally relates to hyperspectral spectroscopy, and in particular, to systems, methods and devices enabling a single-sensor hyperspectral imaging device. Hyperspectral (also known as “multispectral”) spectroscopy is an imaging technique that integrates multiples images of an object resolved at different narrow spectral bands (i.e., narrow ranges of wavelengths) into a single data structure, referred to as a three-dimensional hyperspectral data cube. Data provided by hyperspectral spectroscopy allow for the identification of individual components of a complex composition through the recognition of spectral signatures of individual components within the three-dimensional hyperspectral data cube.

Method for visualizing spectral data as an image, data processing device and computer-readable storage medium

A method for visualizing a data set as an image on a display having an x-axis and a y-axis is described. The data set comprises a plurality of values, each value of the plurality of values being associated to a respective point in a first dimension and a respective point in a second dimension, wherein the first dimension and the second dimension are assigned to the x-axis and the y-axis, respectively. A first resolution value for the image in the direction of the x-axis, and a second resolution value for the image in the direction of the y-axis are provided, wherein the first resolution value and the second resolution value are independent from each other. Based on the first resolution value and the second resolution value, the image is calculated as a representation of the data set. Further, a data processing device and a computer-readable storage medium are described.

Optical sensing calibration system and method
11493439 · 2022-11-08 · ·

An optical sensing system includes at least one electro-optical sensor having an adjustable field of view and at least one reflective member including a diffuse reflector surface positioned within the field of view of the at least one electro-optical sensor. The system also includes at least one controller configured to generate calibration parameters for the at least one electro-optical sensor based on data for at least one exposure detected by the electro-optical sensor when the diffuse reflector surface is within the field of view of the at least one electro-optical sensor. Methods for calculating the calibration parameters and for directly measuring reflectivity of objects in a scene with at least one electro-optical sensor are also disclosed herein.

Broad range gas illumination and imaging

Systems and methods disclosed herein provide for detecting gas by: illuminating, with a controllable illuminator system, a scene with light including radiation within the infrared (IR) wavelength range; controlling the illuminator system to emit light at a first wavelength corresponding to a first absorption level of a gas and at a second wavelength corresponding to a second absorption level of a gas, such that an equal amount of radiant energy over a time period is emitted onto the scene for each of said first and second wavelengths; and capturing a first IR image of the scene being illuminated with light at said first wavelength and a second IR image of the scene illuminated with light at said second wavelength, and comparing said first and second IR images to determine whether a characteristic for at least one specific gas is represented in said first and/or second IR images.

OPTICAL DIAGNOSTICS OF SEMICONDUCTOR PROCESS USING HYPERSPECTRAL IMAGING
20230097892 · 2023-03-30 · ·

Disclosed are embodiments of an improved apparatus and system, and associated methods for optically diagnosing a semiconductor manufacturing process. A hyperspectral imaging system is used to acquire spectrally-resolved images of emissions from the plasma, in a plasma processing system. Acquired hyperspectral images may be used to determine the chemical composition of the plasma and the plasma process endpoint. Alternatively, a hyperspectral imaging system is used to acquire spectrally-resolved images of a substrate before, during, or after processing, to determine properties of the substrate or layers and features formed on the substrate, including whether a process endpoint has been reached; or before or after processing, for inspecting the substrate condition.