A method for true-to-sample measurement by a mobile ingredient analysis system having a housing with a window, an interface for an external reference unit, a display and operating unit, a light source, an optical spectrometer, a camera, an internal reference unit, and an electronic control unit. The method includes: selecting a calibration product suitable for a sample to be examined; performing a plausibility check of the calibration product, an incorrect selection being signaled and an alternative calibration product being selected; outputting measurement conditions comprising the measurement point to be selected and measurement duration for the selected calibration product; capturing measured values of the sample by the spectrometer under the measurement conditions and with simultaneous monitoring of the measurement conditions; processing the captured measured values by means of an electronic control unit, each measured value captured while the measurement conditions were met being declared valid; outputting the measured values deemed valid.

A wavelength shift correction system and method includes a wavelength shift correction light source that emits wavelength shift correction light including a plurality of rays of wavelength shift correction emission-line light; and a spectrometer including a spectroscopic unit that receives the respective rays of dispersed spectral light obtained by dispersing incident light in accordance with wavelength with a plurality of photoelectric converters in the dispersion direction, and outputs electrical signals corresponding to the light intensities of the rays of dispersed spectral light. When the wavelength shift correction light is measured as the incident light with the spectrometer to be subjected to wavelength shift correction, a wavelength variation is determined on the basis of the respective electrical signals output from a plurality of specific photoelectric conversion elements that receive the plurality of rays of wavelength shift correction emission-line light in the plurality of photoelectric conversion elements.

A method for analyzing 2D material thin film and a system for analyzing 2D material thin film are disclosed. The detection method includes the following steps: capturing sample images of 2D material thin films; measuring the 2D material thin films by a Raman spectrometer; performing a visible light hyperspectral algorithm on the sample images by a processor to generate a plurality of visible light hyperspectral images; performing a training and validation procedure, performing an image feature algorithm on the visible light hyperspectral images, and establishing a thin film prediction model based on a validation; and capturing a thin-film image to be measured by the optical microscope, performing the visible light hyperspectral algorithm, and then generating a distribution result of the thin-film image to be measured according to an analysis of the thin film prediction model.

An optical wavelength calibrator is configured to be used on premises with instrumentation such as an optical spectrum analyzer. The on-premises calibrator includes both a fixed wavelength source and a tunable wavelength source, with a variable optical attenuator controlling the power level of a calibration beam provided as an output. A controller within the on-premises calibrator is used to generate the control signals for the various components in response to received external commands, typically via from an external GUI of the user's computer system. The controller is used in combination with the tunable wavelength source to provide a series of output calibration signals at different wavelengths, providing the ability to performance calibration across a desired spectral region and not just a single wavelength. The on-premises calibrator maintains real-time wavelength stability of the instrument to minimize down time when compared off-site extensive re-calibration services.

A polarized Raman Spectrometric system for defining parameters of a polycrystalline material, said system comprising: a polarized Raman Spectrometric apparatus, a computer-controlled sample stage for positioning a sample at different locations, and a computer comprising a processor and an associated memory.

Systems and methods here may be used for automated capturing and analyzing spectrometer data of multiple sample gemstones on a stage, including mapping digital camera image data of samples, applying a Raman Probe to a first sample gemstone under evaluation on the stage, receiving spectrometer data of the sample gemstone from the probe, automatically moving the stage to a second sample, using the image data, and analyzing the other samples.

A gas sensor includes a light receiving element, a light emitting element, an integrated circuit, a lead frame, and a sealing member configured to seal these into a package. The lead frame includes at least one die pad portion and a plurality of terminal portions, the die pad portion includes a first region having a first thickness and a second region having a second thickness thinner than the first thickness, the integrated circuit is arranged on the second region of the die pad portion, the light emitting element is electrically connected to at least one of the plurality of terminal portions, the light receiving element is electrically connected to the integrated circuit and is arranged on the opposite side to the light emitting element with the integrated circuit interposed therebetween, and the integrated circuit is electrically connected to at least one of the plurality of terminal portions.

A system for a high resolution optical spectrum analyzer (OSA) using an efficient multi-pass configuration is disclosed. The system may include an entrance slit to allow inward passage of an optical beam. The system may also include a grating element to diffract the optical beam. The system may further include a retroreflective element to retroreflect the optical beam. The system may also include a mirror to reflect the optical beam. The system may include an exit slit, which in some examples may be adjacent to the entrance slit. The exit slit may allow outward passage of the optical beam for a high resolution optical measurement.

In some implementations, a device may determine that an unknown sample is an outlier sample by using an aggregated classification model. The device may determine that one or more spectroscopic measurements are not performed accurately based on determining that the unknown sample is the outlier sample. The device may cause one or more actions based on determining the one or more spectroscopic measurements are not performed accurately.

The present disclosure provides a spectral imaging chip and apparatus, an information processing method, a fingerprint living body identification device and a fingerprint module. The spectral imaging chip can obtain spectral information of a captured object without affecting the spatial resolution and imaging quality of the resulting image, which is convenient for grasping more comprehensive information of the object to be imaged. The fingerprint living body identification device and fingerprint module can realize fingerprint living body identification through the spectral imaging chip, which is advantageous to improve the stability of the component performance, while reducing the volume, weight and cost of the spectral components, greatly improving the anti-counterfeiting ability of the fingerprint identification system.