Systems for and methods for in situ optimization of tunable light emitting diode sources are disclosed herein. During operation, the systems and methods obtain real-time feedback from an image sensor, and that feedback is used to tune the tunable LEDs. By tuning the tunable LEDs, the best values for the LED spectral output can be selected based on the feedback from the image sensor, and an image with improved contrast is obtained. Alternatively, the amount of time to obtain an image with acceptable contrast is reduced.

A gas sensor includes a light receiving element, a light emitting element, an integrated circuit, a lead frame, and a sealing member configured to seal these into a package. The lead frame includes at least one die pad portion and a plurality of terminal portions, the die pad portion includes a first region having a first thickness and a second region having a second thickness thinner than the first thickness, the integrated circuit is arranged on the second region of the die pad portion, the light emitting element is electrically connected to at least one of the plurality of terminal portions, the light receiving element is electrically connected to the integrated circuit and is arranged on the opposite side to the light emitting element with the integrated circuit interposed therebetween, and the integrated circuit is electrically connected to at least one of the plurality of terminal portions.

Provided is a spectrum analysis method including: accumulating n spectrums obtained by consecutively fast Fourier transforming an input signal n times; receiving a threshold; identifying, in the n spectrums accumulated in the accumulating, frequently occurring data that includes data whose number of occurrences exceeds the threshold received in the receiving, the number of occurrences being defined as a total number of items of data at a same frequency point that indicate levels that are close to each other, to within a predetermined range; selecting a maximum level at each of the frequency points from among only the identified frequently occurring data; and outputting a spectrum indicating the maximum levels selected at the frequency points.

The present disclosure relates to a spectrometer using multiple light sources. The spectrometer includes: a sample unit accommodating the sample; a multiple-light-sources unit irradiating light of different wavelengths to the sample unit; a sensor unit configured to measure absorbance generated at a wavelength of a light source irradiated to the sample unit; and a multiple scatterer configured to amplify the number of multiple scattering of the light source irradiated to the sample unit, wherein the sensor unit derives spectrum information by measuring absorbance at different wavelengths.

The present disclosure relates to a spectrometer using multiple light sources. The spectrometer includes: a sample unit accommodating the sample; a multiple-light-sources unit irradiating light of different wavelengths to the sample unit; a sensor unit configured to measure absorbance generated at a wavelength of a light source irradiated to the sample unit; and a multiple scatterer configured to amplify the number of multiple scattering of the light source irradiated to the sample unit, wherein the sensor unit derives spectrum information by measuring absorbance at different wavelengths.

A totagram is produced by an iterative spectral phase recovery process resulting in complete information recovery using special masks, without a reference beam. Using these special masking systems reduce computation time, number of masks, and number of iterations. The special masking system is (1) a unity mask together with one or more bipolar binary masks with elements equal to 1 and −1, or (2) a unity mask together with one or more phase masks, or (3) a unity mask together with one pair of masks or more than one pair of masks having binary amplitudes of 0's and 1's, in which the masks in the pair are complementary to each other with respect to amplitude, or (4) one or more pairs of complementary masks with binary amplitudes of 0's and 1's without a unity mask.

Provided is a spectrum analysis method including: accumulating n spectrums obtained by consecutively fast Fourier transforming an input signal n times; receiving a threshold; identifying, in the n spectrums accumulated in the accumulating, frequently occurring data that includes data whose number of occurrences exceeds the threshold received in the receiving, the number of occurrences being defined as a total number of items of data at a same frequency point that indicate levels that are close to each other, to within a predetermined range; selecting a maximum level at each of the frequency points from among only the identified frequently occurring data; and outputting a spectrum indicating the maximum levels selected at the frequency points.

A system for a high resolution optical spectrum analyzer (OSA) using an efficient multi-pass configuration is disclosed. The system may include an entrance slit to allow inward passage of an optical beam. The system may also include a grating element to diffract the optical beam. The system may further include a retroreflective element to retroreflect the optical beam. The system may also include a mirror to reflect the optical beam. The system may include an exit slit, which in some examples may be adjacent to the entrance slit. The exit slit may allow outward passage of the optical beam for a high resolution optical measurement.

The disclosure relates to a spectrometer, comprising: an illumination device for illuminating a spectrometric measurement region; a detection unit for detecting electromagnetic radiation coming from the spectrometric measurement region; and a spectral element, which is arranged in the beam path between the illumination device and the detection unit. The illumination device comprises: a light emitting diode having a first central wavelength, which is designed to emit first electromagnetic radiation having a first spectrum; and a luminescent element for converting a first component of the first electromagnetic radiation having the first spectrum into second electromagnetic radiation having a second spectrum. The first central wavelength is 550 nm or 3000 nm or has a value between 550 nm and 3000 nm. The first spectrum and the second spectrum have an overlap.

A polarized Raman Spectrometric system for defining parameters of a polycrystaline material, the system comprises a polarized Raman Spectrometric apparatus, a computer-controlled sample stage for positioning a sample at different locations, and a computer comprising a processor and an associated memory. The polarized Raman Spectrometric apparatus generates signal(s) from either small sized spots at multiple locations on a sample or from an elongated line-shaped points on the sample, and the processor analyzes the signal(s) to define the parameters of said polycrystalline material.