Patent classifications
G01J3/2846
WIDE-FIELD DEEP UV RAMAN MICROSCOPE
A spectroscopy device includes an incoherent light source, tunable to a predetermined emission wavelength; a microscope platform comprising a microscope objective comprising a deep-UV optimized objective and a focal plane defined thereon; a notch filter having an absorption frequency matched to the emission wavelength; and a frequency-selective optical path from the wide-field UV light source to the microscope platform onto the focal plane and from the focal plane through the notch filter.
IMAGING DEVICE PROVIDED WITH LIGHT SOURCE THAT EMITS PULSED LIGHT AND IMAGE SENSOR
An optical filter including filter regions arrayed two-dimensionally, in which the filter regions include a first region and a second region; a wavelength distribution of an optical transmittance of the first region has a first local maximum in a first wavelength band and a second local maximum in a second wavelength band that differs from the first wavelength band, and a wavelength distribution of an optical transmittance of the second region has a third local maximum in a third wavelength band that differs from each of the first wavelength band and the second wavelength band and a fourth local maximum in a fourth wavelength band that differs from the third wavelength band.
Multiplexing and Encoding for Reference Switching
Methods and systems for measuring one or more properties of a sample are disclosed. The methods and systems can include multiplexing measurements of signals associated with a plurality of wavelengths without adding any signal independent noise and without increasing the total measurement time. One or more levels of encoding, where, in some examples, a level of encoding can be nested within one or more other levels of encoding. Multiplexing can include wavelength, position, and detector state multiplexing. In some examples, SNR can be enhanced by grouping together one or more signals based on one or more properties including, but not limited to, signal intensity, drift properties, optical power detected, wavelength, location within one or more components, material properties of the light sources, and electrical power. In some examples, the system can be configured for optimizing the conditions of each group individually based on the properties of a given group.
MULTI-LAYER SPECTRAL MODULATION SPECTROMETER
A system includes a first spectral modulator, a second spectral modulator, a light guide optically, a photodetector, and an electronic control device. The first spectral modulator receives sample light, and modulates the sample light according to a first spectral response pattern to produce first modulated light. The second spectral modulator receives the first modulated light from the first spectral modulator via the light guide, modulates the first modulated light according to a second spectral response pattern to produce second modulated light, and transmits the second modulated light to the photodetector. The photodetector measures an intensity of the second modulated light incident on the photodetector, and generates one or more signals corresponding to the intensity of the second modulated light. The electronic control device determines a spectral distribution of the sample light based on the one or more signals.
Imaging device provided with light source that emits pulsed light and image sensor
An optical filter including filter regions arrayed two-dimensionally, in which the filter regions include a first region and a second region; a wavelength distribution of an optical transmittance of the first region has a first local maximum in a first wavelength band and a second local maximum in a second wavelength band that differs from the first wavelength band, and a wavelength distribution of an optical transmittance of the second region has a third local maximum in a third wavelength band that differs from each of the first wavelength band and the second wavelength band and a fourth local maximum in a fourth wavelength band that differs from the third wavelength band.
Multiplexing and encoding for reference switching
Methods and systems for measuring one or more properties of a sample are disclosed. The methods and systems can include multiplexing measurements of signals associated with a plurality of wavelengths without adding any signal independent noise and without increasing the total measurement time. One or more levels of encoding, where, in some examples, a level of encoding can be nested within one or more other levels of encoding. Multiplexing can include wavelength, position, and detector state multiplexing. In some examples, SNR can be enhanced by grouping together one or more signals based on one or more properties including, but not limited to, signal intensity, drift properties, optical power detected, wavelength, location within one or more components, material properties of the light sources, and electrical power. In some examples, the system can be configured for optimizing the conditions of each group individually based on the properties of a given group.
Temporal-spectral multiplexing sensor and method
A temporal-spectral multiplexing sensor for simultaneous or near simultaneous spatial-temporal-spectral analysis of an incoming optical radiation field. A spectral encoder produces a time series of spectrally encoded optical images at a high sampling rate. A series of full panchromatic spectrally encoded optical images are collected at a rate similar to the sampling rate. A detector records at least one spatial region of the spectrally encoded optical image. A processor is configured to process two series of spectrally encoded optical images to produce an artifact-free spectral image. The processing includes using the panchromatic images to normalize the spectrally encoded images, and decoding the normalized encoded images to produce high fidelity spectral signatures, free of temporal artifacts due to fluctuations at frequencies slower than the sampling rate for polychromatic images.
DATA PROCESSING SYSTEM DISPOSED ON SENSOR AND METHOD THEREOF
A data processing system disposed on a sensor comprises a de-identified sensing device and a decoding device. The de-identified sensing device is configured to receive a sensing data of a target and to process the sensing data to generate a de-identified data. The decoding device communicably connects to the de-identified sensing device and is configured to generate a decoded data according to the de-identified data and a decoding parameter obtained from a database trained by machine learning. The de-identified sensing device comprises an analog encoder configured to encode the sensing data to generate a responsive data.
Temporal-Spectral Multiplexing Sensor and Method
A temporal-spectral multiplexing sensor for simultaneous or near simultaneous spatial-temporal-spectral analysis of an incoming optical radiation field. A spectral encoder produces a time series of spectrally encoded optical images at a high sampling rate. A series of full panchromatic spectrally encoded optical images are collected at a rate similar to the sampling rate. A detector records at least one spatial region of the spectrally encoded optical image. A processor is configured to process two series of spectrally encoded optical images to produce an artifact-free spectral image. The processing includes using the panchromatic images to normalize the spectrally encoded images, and decoding the normalized encoded images to produce high fidelity spectral signatures, free of temporal artifacts due to fluctuations at frequencies slower than the sampling rate for polychromatic images.
Methods And Systems For Scanning Probe Sample Property Measurement And Imaging
Infrared (IR) vibrational scattering scanning near-field optical microscopy (s-SNOM) has advanced to become a powerful nanoimaging and spectroscopy technique with applications ranging from biological to quantum materials. However, full spatiospectral s-SNOM continues to be challenged by long measurement times and drift during the acquisition of large associated datasets. Various embodiments provide for a novel approach of computational spatiospectral s-SNOM by transforming the basis from the stationary frame into the rotating frame of the IR carrier frequency. Some embodiments see acceleration of IR s-SNOM data collection by a factor of 10 or more in combination with prior knowledge of the electronic or vibrational resonances to be probed, the IR source excitation spectrum, and other general sample characteristics.