A system for determining a spectrum includes an interface and a processor. The interface is configured to receive a sample set of intensity data for an array of spatial locations and a set of spectral configurations. The processor is configured to determine a region of interest using the sample set of intensity data and determine a spectral peak for the region of interest.

According to an example, a plurality of pixels of a modulator upon which an input light beam impinges may be modulated to apply a first asymmetrical attenuation pattern on the input light beam and to direct a first attenuated light beam from the modulator and a first power level of the first attenuated light beam may be measured. The plurality of pixels may be modulated to apply a second asymmetrical attenuation pattern on the input light beam and to direct a second attenuated light beam from the modulator, and a second power level of the second attenuated light beam may be measured. A difference between the first power level and the second power level may be calculated and a modified peak frequency for an attenuated light beam from the calculated difference may be calculated.

A system and method for fording the peak wavelength of the spectrum sensed by an LSPR spectrometer is described herein. The method comprises reading an image representing the reflected/absorbed spectrum, using a mathematical model of the LSPR spectrometer system to estimate a parametric curve representing the absorbance/reflectance spectrum, and adjusting or optimizing the parameters of the parametric curve so as to increase the likelihood of the parametric curve representing the sensed spectrum. Also described herein is a novel method to achieve LSPR peak wavelength signal noise reduction using an adaptive regularization algorithm.

In example implementations, a method is provided. The method determines relative colorant volumes to colorimetry relationship of first substrate at first time. Determine relative colorant volumes to colorimetry relationship of first substrate at second time as function of relative colorant volumes to colorimetry relationship of first substrate at first time. Determine ratio of relative colorant volumes of first substrate at first time and second time. Determine relative colorant volumes to colorimetry relationship of second substrate at third time as function of ratio of relative colorant volumes of first substrate. Determine relative colorant volumes to colorimetry relationship of second substrate at fourth time as function of relative colorant volumes to colorimetry relationship of second substrate at third time. Compensate colorant drift on second substrate based on difference between relative colorant volumes to colorimetry relationship of second substrate at third time and fourth time. Compensate colorant drift on the first substrate.

In one aspect, a hyperspectral image measurement device is provided to include: a main body; an illumination module disposed in the main body and including LEDs having different peak wavelengths to irradiate light to a subject; a camera disposed on the main body and receiving light reflected from the subject to acquire an image of the subject; a barrel having a contact surface contacting the subject, the contact surface located to be spaced apart from the illumination module and the camera module by a predetermined distance; and a reference cover located on the contact surface and including a standard reflection layer for reflecting light irradiated from the illumination module toward the camera module.

A narrowband laser apparatus may be provided with a laser resonator including optical elements for narrowing a spectral linewidth, a spectrometer configured to detect spectral intensity distributions of multiple pulses included in a pulsed laser beam output from the laser resonator, a spectral waveform producer configured to produce a spectral waveform by adding up the spectral intensity distributions of the multiple pulses, a device function storage configured to store a device function of the spectrometer, a wavelength frequency function generator configured to generate a wavelength frequency function which represents a frequency distribution of center wavelengths of the multiple pulses, and a deconvolution processor configured to perform deconvolution processing on the spectral waveform with the device function and the wavelength frequency function.

A method for the non-destructive testing of the heating of a part made from polymer material, the method comprising the following steps: a) carrying out a measurement by infrared spectroscopy on a part to be tested and extracting therefrom at least one of absorbance values and transmittance values according to a spatial frequency; and b) from the measurement of at least one of absorbance and transmittance, determining the period of time during which said region of the part to be tested has been subjected to a given heating temperature and determining said heating temperature, using a reference database comprising at least one of absorbance measurements and transmittance measurements, the measurements established over a plurality of reference samples made from polymer material that have been subjected to a given temperature during a given period of time.

Provided is a sample analysis system including: a droplet device configured to intermittently introduce a sample to a measurement region set in plasma; a light emission detection device configured to detect light emission in the measurement region at a detection timing, the detection timing being set at a predetermined cycle in advance; and an analysis device configured to analyze the sample based on the detected light emission, wherein the analysis device is provided with: a distribution computing unit configured to compute a time-spatial light intensity distribution based on the detected light emission, the time-spatial light intensity distribution being a distribution of a light intensity according to the detection timing, a position in the measurement region, and a wavelength component of the light emission; and a characteristic specifying unit configured to compute, from the time-spatial light intensity distribution, a feature amount that correlates with a sample characteristic indicating a property of the sample and specify the sample characteristic based on the feature amount.

A spectrographic analyzer of pulses within a signal includes a data interface, an edge detection filter, a delay buffer, an integrator, and a histogram buffer. The data interface duplicates a stream of digital amplitude samples for the signal into a first and second stream. The edge detection filter determines the beginning and end of each pulse within the first stream of the digital amplitude samples. The delay buffer delays the second stream by a duration sufficient for the edge detection filter to determine both the beginning and end of each pulse. The integrator sums a respective amplitude total for each pulse. The respective amplitude total sums the digital amplitude samples between the beginning and end of each pulse in the second stream as delayed by the delay buffer. The histogram buffer maintains bins and increments a respective one of the bins encompassing the respective amplitude total for each pulse.

A system for determining a spectrum includes an interface and a processor. The interface is configured to receive a sample set of intensity data for an array of spatial locations and a set of spectral configurations. The processor is configured to determine a region of interest using the sample set of intensity data and determine a spectral peak for the region of interest.