The present invention provides a time-resolved single-photon counting apparatus, including an excitation light source for generating pulsed excitation light, a specimen optics for collecting an optical signal caused by irradiating the pulsed excitation light to a specimen, a photoelectric converter for photoelectrically converting the optical signal to generate an analog single-photon signal, an analog-to-digital (AD) signal converter for sampling the analog single-photon signal to convert the same into a digital single-photon signal, a digital photon-discrimination and timing detector for generating a photon-discrimination signal by discriminating the single-photon property of the digital single-photon signal to count a pulse time point of the digital single-photon signal to generate a delay time signal having delay time information, and a time-signal processor for counting valid single-photon detection events according to the delay time with reference to the photon-discrimination signal.

Provided is a spectrum analysis method including: accumulating n spectrums obtained by consecutively fast Fourier transforming an input signal n times; receiving a threshold; identifying, in the n spectrums accumulated in the accumulating, frequently occurring data that includes data whose number of occurrences exceeds the threshold received in the receiving, the number of occurrences being defined as a total number of items of data at a same frequency point that indicate levels that are close to each other, to within a predetermined range; selecting a maximum level at each of the frequency points from among only the identified frequently occurring data; and outputting a spectrum indicating the maximum levels selected at the frequency points.

Devices and methods for sampling an analog signal to perform data analysis are disclosed. The sampling devices and corresponding methods include a detector module that measures a response generated from a sample, an analog to digital converter that samples the analog signal, received from the detector module, and converting it into a digital signal, a sampling rate of the converter being faster than the response of the sample; and a logic circuit coupled to the converter that processes the digital signal to generate a reduced digital data signal, the logic circuit processing the digital signal acquired from the converter to generate a continuous data transfer to a processing system.

An optical resonance imaging system includes a light emitting device to emit laser pulses onto a subject. The laser pulses include a first pulse and a second pulse to place the subject in an excited state. The laser pulses also include a third pulse to stimulate emission of one or more third order signals from the subject. The system also includes a spectrometer to receive the one or more third order signals and to generate spectrum signals commensurate with intensities of the one or more third order signals. The system may further include circuitry configured to analyze the spectrum signals, generate one or more images of the subject based on the analysis, and construct one or more maps of positions of the subject based on the one or more images.

An optical filter including filter regions arrayed two-dimensionally, in which the filter regions include a first region and a second region; a wavelength distribution of an optical transmittance of the first region has a first local maximum in a first wavelength band and a second local maximum in a second wavelength band that differs from the first wavelength band, and a wavelength distribution of an optical transmittance of the second region has a third local maximum in a third wavelength band that differs from each of the first wavelength band and the second wavelength band and a fourth local maximum in a fourth wavelength band that differs from the third wavelength band.

Provided is a spectrum analysis method including: accumulating n spectrums obtained by consecutively fast Fourier transforming an input signal n times; receiving a threshold; identifying, in the n spectrums accumulated in the accumulating, frequently occurring data that includes data whose number of occurrences exceeds the threshold received in the receiving, the number of occurrences being defined as a total number of items of data at a same frequency point that indicate levels that are close to each other, to within a predetermined range; selecting a maximum level at each of the frequency points from among only the identified frequently occurring data; and outputting a spectrum indicating the maximum levels selected at the frequency points.

The present invention discloses, inter alia, a method for measuring and analyzing semi-transparent transient sources by remote sensing, comprising the steps of bore-sighting at least one spectrometer and at least one optic device selected from a group consisting of one or more spectrometers, one or more imagers, and at least one spectrometer and at least one imager; mounting at least one bore-sighted pair on at least one platform; and pointing simultaneously all platforms towards at least one field of view. The invention also discloses a platform for remote sensing of semi-transparent transient source comprising at least one first spectrometer in a first wavelength range; at least one second optic device selected from a group consisting of one or more spectrometers, one or more imagers, and at least one spectrometer and at least one imager; each of which is sensitive either in said first wavelength range or in any second wavelength range; at least one platform; wherein said at least one first spectrometer and said at least one second spectrometer are mounted on said platform and bore-sighted to observe the same or at least overlapping field of view.

Optical imaging or spectroscopy described can use laminar optical tomography (LOT), diffuse correlation spectroscopy (DCS), or the like. An incident beam is scanned across a target. An orthogonal or oblique optical response can be obtained, such as concurrently at different distances from the incident beam. The optical response from multiple incident wavelengths can be concurrently obtained by dispersing the response wavelengths in a direction orthogonal to the response distances from the incident beam. Temporal correlation can be measured, from which flow and other parameters can be computed. An optical conduit can enable endoscopic or laparoscopic imaging or spectroscopy of internal target locations. An articulating arm can communicate the light for performing the LOT, DCS, or the like. The imaging can find use for skin cancer diagnosis, such as distinguishing lentigo maligna (LM) from lentigo maligna melanoma (LMM).

The invention provides systems for characterizing a biological sample by analyzing emission of fluorescent light from the biological sample upon excitation and methods for using the same. The system includes a laser source, collection fibers, a demultiplexer and an optical delay device. All references cited herein are incorporated by reference in their entirety as though fully set forth. Unless defined otherwise, technical and scientific terms used herein have the same meaning as commonly understood by one of-ordinary skill in the art in which this invention belongs.

An optical manufacturing process sensing and status indication system is taught that is able to utilize optical emissions from a manufacturing process to infer the state of the process. In one case, it is able to use these optical emissions to distinguish thermal phenomena on two timescales and to perform feature extraction and classification so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process. In other case, it is able to utilize these optical emissions to derive corresponding spectra and identify features within those spectra so that nominal process conditions may be uniquely distinguished from off-nominal process conditions at a given instant in time or over a sequential series of instants in time occurring over the duration of the manufacturing process.