A spectroscopic unit and spectroscopic device according to the present invention are provided with a filter that is provided with a plurality of optical filter elements disposed in order from the entrance side to the exit side of light under measurement and has different transmission wavelengths corresponding to entrance positions along a first direction. A first optical filter element from among the plurality of optical filter elements is tilted with respect to a second optical filter element disposed adjacently to the first optical filter element as a result of the first optical filter element being rotated by a prescribed angle with a third direction that is perpendicular to both the first direction and s second direction from the entrance side to the exit side as the axis of rotation thereof or being rotated by a prescribed angle with the first direction as the axis of rotation thereof.

This disclosure presents a process and system to determine characteristics of a subterranean formation proximate a borehole. Borehole material is typically pumped from the borehole, though borehole material can be used within the borehole as well. Extracted material of interest is collected from the borehole material and prepared for analyzation. Typically, the preparation can be a separation process, a filtering process, a moisture removal process, a pressure control process, a flow control process, a cleaning process, and other preparation processes. The prepared extracted material is placed in a laser dispersion spectroscopy device (LDS) where measurements can be taken. A LDS analyzer can generate results utilizing the measurements, where the results of the extracted material can include one or more of composition parameters, alkene parameters, and signature change parameters. The results can be communicated to other systems and processes to be used as inputs into well site operation plans and decisions.

In order to provide a single-unit sensor which serves as both an illuminance sensor and a proximity sensor, the sensor (1) includes a light receiving element section (E1), an infrared cut-off filter (IRcutF), and a switching section (SWS) for switching spectral characteristics of the light receiving element section (E1). The infrared cut-off filter (IRcutF) has an opening, and an infrared light receiving P-N junction (PDir) is provided at a location deeper in a substrate than a visible light receiving P-N junction (PDvis).

In order to provide a single-unit sensor which serves as both an illuminance sensor and a proximity sensor, the sensor (1) includes a light receiving element section (E1), an infrared cut-off filter (IRcutF), and a switching section (SWS) for switching spectral characteristics of the light receiving element section (E1). The infrared cut-off filter (IRcutF) has an opening, and an infrared light receiving P-N junction (PDir) is provided at a location deeper in a substrate than a visible light receiving P-N junction (PDvis).

To improve the detection sensitivity, detection accuracy, and reproducibility when electrostatic discharge is generated in a sample solution and analysis is performed using light emission in the generated plasma. A flow channel 100, which has cylindrical main portions each expanding conically from a narrow portion, is filled with a conductive sample solution, and an electric field is applied to the flow channel 100 to generate plasma in the generated air bubbles, so that the resulting light emission is measured.

This spectral-image-obtaining device includes: a line-spectral-image acquiring unit that acquires a plurality of line spectral images; a frame-image acquiring unit that has an image-capturing range that encompasses that over which image capturing is performed by the line-spectral-image acquiring unit and that acquires a two-dimensional frame image that contains fewer color signals than the line spectral images; a comparison-image estimating unit that estimates comparison images for all lines based on the line spectral images acquired by the line-spectral-image acquiring unit and a wavelength characteristic of the frame-image acquiring unit; a line-spectral-image positional-deviation detecting unit that detects amounts of positional deviation between the comparison images estimated by the comparison-image estimating unit and corresponding positions within the frame image; and a positional-deviation correcting unit that fits the line spectral images to corresponding positions within the frame image based on the amounts of positional deviation detected by the line-spectral-image positional-deviation detecting unit.

This spectral-image-obtaining device includes: a line-spectral-image acquiring unit that acquires a plurality of line spectral images; a frame-image acquiring unit that has an image-capturing range that encompasses that over which image capturing is performed by the line-spectral-image acquiring unit and that acquires a two-dimensional frame image that contains fewer color signals than the line spectral images; a comparison-image estimating unit that estimates comparison images for all lines based on the line spectral images acquired by the line-spectral-image acquiring unit and a wavelength characteristic of the frame-image acquiring unit; a line-spectral-image positional-deviation detecting unit that detects amounts of positional deviation between the comparison images estimated by the comparison-image estimating unit and corresponding positions within the frame image; and a positional-deviation correcting unit that fits the line spectral images to corresponding positions within the frame image based on the amounts of positional deviation detected by the line-spectral-image positional-deviation detecting unit.

A method of spatially measuring a plurality of nano-scale structures in a sample comprises the steps of: marking the individual structures at different locations with fluorescent markers, coupling the individual structures to individual positioning aids whose positions in the sample are known, exciting the fluorescent markers with excitation light for emission of fluorescence light, wherein an intensity distribution of the excitation light has a local minimum, arranging the local minimum at different positions in a close-up range around the position of respective positioning aid whose dimensions are not larger than the diffraction limit at the wavelength of the excitation light, registering the fluorescence light emitted out of the sample separately for the individual fluorescent markers and for the different positions of the minimum, and determining positions of the individual fluorescent markers in the sample from the intensities of the fluorescence light registered.

A system for providing optical measurements and detection in optical spectrum analyzers (OSAs) with high dynamic range and high speed is disclosed. The system may include a slit to allow inward passage of an optical beam. The system may also include an optical portion to receive the optical beam. In some examples, the optical portion may include at least one optical splitter to split the optical beam into at least two optical paths. The system may also include an electrical portion to receive the optical beams split into the at least two optical paths. In some examples, the electrical portion may include at least one photodetector to receive each of the split optical beam. The electrical portion may also include at least one amplifier communicatively coupled to each of the at least one photodetector to amplify the split optical beam. The electrical portion may further include at least one analog-to-digital converter (ADC) communicatively coupled to each of the at least one amplifier to convert the split optical beams into digital signals.

A cable identification system is provided. The cable identification system includes a cable sleeve with some predetermined unique properties. The cable sleeve is adapted to receive a cable therein. The cable includes one or more electrical conductors therein. The cable identification system further includes a portable measuring device configured to detect the predetermined unique properties of the cable sleeve when positioned adjacent the cable at any point along the cable.