A system for measuring light in a tube is provided. The system includes a tube, a light collecting probe configured to absorb light within the tube, a data acquisition system for determining a level of light associated with light absorbed by the light collecting probe, and a motion system for moving the light collecting probe within the tube.

To acquire both excellent spectrum and sample image reflecting actual conditions of a sample, and to increase convenience of measurement, provided is a display device for a photometric analyzer, which is configured to irradiate a sample with light to analyze the sample, the display device being configured to display a measurement result of the photometric analyzer, and including: a controller; and a display, which is configured to display an image based on measurement data processed by the controller. The measurement data at least contains a spectrum indicating an intensity of emitted light, which is emitted by the sample irradiated with the light, and a sample image of the sample, which is taken by an imaging device. The display is configured to display the spectrum and the sample image in an arrangement in the same screen.

Described are various embodiments of a system, method and device for laser induced breakdown spectroscopy (LIBS). In some embodiments, the LIBS system comprises a silicon photomultiplier (Si PM) operated in a time-gated photon counting mode. Some such embodiments allow for the provision of a portable LIBS device. Also provided are embodiments for the measurement of constituent carbon, gold and/or other precious metal group elements in a target sample.

Specialized linkage assemblies for Laser-Induced Breakdown Spectroscopy (LIBS) systems are provided. The linkage assemblies may facilitate the attachment of the laser housing of the LIBS system onto an existing sample supply chamber, such as a volumetric or gravimetric feeder. Generally, the linkage assemblies may comprise a specialized purge head and inert gas assembly that facilitate the attachment of the laser housing and may enhance the functionality of the LIBS system.

In one implementation, a spectral microscope may comprise a substrate with a planar lens, the planar lens including a phase profile including an axial focus and an oblique focus, a light source to excite a signal of a particle among a plurality of particles, and a detector to receive light generated from the light source from the axial focus of the planar lens and a spectral color component of the excited signal of the particle from the oblique focus of the planar lens.

In one implementation, a spectral microscope may comprise a substrate with a planar lens, the planar lens including a phase profile including an axial focus and an oblique focus, a light source to excite a signal of a particle among a plurality of particles, and a detector to receive light generated from the light source from the axial focus of the planar lens and a spectral color component of the excited signal of the particle from the oblique focus of the planar lens.

A spectrometry device includes: an integrating sphere which includes an inner wall surface and an attachment hole; an adapter which includes a guide hole guiding the measurement target light and is disposed in the integrating sphere; a plate which includes a first surface covering the guide hole from the outside of the integrating sphere and allowing a sample to be mounted thereon and a second surface and through which the measurement target light is transmitted; a holder which includes a concave portion mounting the plate thereon and is attached to the attachment hole; and a spectral detector configured to detect the measurement target light. The concave portion includes a bottom surface facing the second surface and a side surface surrounding the periphery of the plate. The bottom surface and the side surface are coated with a reflective material reflecting the measurement target light.

There is provided a calibration apparatus including one or a plurality of first processors programmed to: obtain spectrum images from a spectral camera that images light from alight source portion; obtain a spectral reference value from a measurement result of a calibration reference device that measures the light; extract a gradation value at a correction point that is a pixel which generates a correction matrix among the spectrum images as a measurement value; divide the measurement value at the correction point and the spectral reference value by a luminance value of the light emitted from the light source portion to obtain a normalized measurement value and a normalized reference value; and calculate the correction matrix based on the normalized measurement value and the normalized reference value.

There is provided a calibration apparatus including one or a plurality of first processors programmed to: obtain spectrum images from a spectral camera that images light from alight source portion; obtain a spectral reference value from a measurement result of a calibration reference device that measures the light; extract a gradation value at a correction point that is a pixel which generates a correction matrix among the spectrum images as a measurement value; divide the measurement value at the correction point and the spectral reference value by a luminance value of the light emitted from the light source portion to obtain a normalized measurement value and a normalized reference value; and calculate the correction matrix based on the normalized measurement value and the normalized reference value.

An apparatus for individually trapping atoms, individually imaging the atoms, and individually cooling the atoms to prevent loss of the atoms from the trap caused by the imaging. The apparatus can be implemented in various quantum computing, sensing, and metrology applications (e.g., in an atomic clock).