G01J3/40

Spectral-spatial imaging device

In general, an imaging system to synchronously record a spatial image and a spectral image of a portion of the spatial image is described. In some examples, a beam splitter of the imaging system splits an optical beam, obtained from a viewing device, into a first split beam directed by the imaging system to a spatial camera and a second split beam directed by the imaging system to the entrance slit of an imaging spectrograph that is coupled to a spectral camera. An electronic apparatus synchronously triggers the spatial camera and the spectral camera to synchronously record a spatial image and a spectral image, respectively.

Distortion measurement and correction for spectrally encoded endoscopy
10825152 · 2020-11-03 · ·

Methods, apparatuses, systems, and storage mediums for correcting distortion of a spectrally encoded endoscopy (SEE) image are provided. A first reference pattern comprising a plurality of radial lines is scanned with an SEE spectral line to obtain a first image. Signs of a tangential shift and/or of a radial shift of the spectral line may be determined, and magnitudes of the tangential shift and of the radial shift may be computed. A second reference pattern comprising at least a circle with the SEE spectral line may be scanned to obtain a second image in a case where the radial shift is positive. The magnitude of the radial shift may be computed based on the magnitude of the tangential shift and a radius of the circle. The tangential shift and the radial shift may then be applied for correcting distortion.

Distortion measurement and correction for spectrally encoded endoscopy
10825152 · 2020-11-03 · ·

Methods, apparatuses, systems, and storage mediums for correcting distortion of a spectrally encoded endoscopy (SEE) image are provided. A first reference pattern comprising a plurality of radial lines is scanned with an SEE spectral line to obtain a first image. Signs of a tangential shift and/or of a radial shift of the spectral line may be determined, and magnitudes of the tangential shift and of the radial shift may be computed. A second reference pattern comprising at least a circle with the SEE spectral line may be scanned to obtain a second image in a case where the radial shift is positive. The magnitude of the radial shift may be computed based on the magnitude of the tangential shift and a radius of the circle. The tangential shift and the radial shift may then be applied for correcting distortion.

XPS and Raman sample analysis system and method

A process of analyzing a sample by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) includes providing a sample having a sample surface within a vacuum chamber, performing a Raman spectroscopic analysis on a plurality of selected areas of the sample surface within the vacuum chamber to map an area of the sample surface comprising the selected areas, the Raman spectroscopic analysis including identifying one or more face in one or more of the selected areas of the sample surface, and performing an X-ray photoelectron spectroscopy (XPS) analysis of one or more selected areas of the sample surface containing at least one chemical and/or structural feature identified by the Raman spectroscopic analysis, wherein the duration of the XPS analysis of a given selected area of the sample surface is longer than the duration of the Raman spectroscopic analysis of that given selected area.

XPS and Raman sample analysis system and method

A process of analyzing a sample by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) includes providing a sample having a sample surface within a vacuum chamber, performing a Raman spectroscopic analysis on a plurality of selected areas of the sample surface within the vacuum chamber to map an area of the sample surface comprising the selected areas, the Raman spectroscopic analysis including identifying one or more face in one or more of the selected areas of the sample surface, and performing an X-ray photoelectron spectroscopy (XPS) analysis of one or more selected areas of the sample surface containing at least one chemical and/or structural feature identified by the Raman spectroscopic analysis, wherein the duration of the XPS analysis of a given selected area of the sample surface is longer than the duration of the Raman spectroscopic analysis of that given selected area.

System, Method and Apparatus for Wide Wavelength Range Imaging with Focus and Image Correction
20200333187 · 2020-10-22 ·

A variable focus imaging lens assembly has different, calibrated settings for each of multiple different wavelength ranges. Images are captured for each wavelength range using the different settings, corrected and stacked to form an image data cube. Using multiple wavelength ranges allows a scene or object to be imaged by multispectral imagers, hyperspectral imagers and imaging spectrometers using an overall wide wavelength range.

System, Method and Apparatus for Wide Wavelength Range Imaging with Focus and Image Correction
20200333187 · 2020-10-22 ·

A variable focus imaging lens assembly has different, calibrated settings for each of multiple different wavelength ranges. Images are captured for each wavelength range using the different settings, corrected and stacked to form an image data cube. Using multiple wavelength ranges allows a scene or object to be imaged by multispectral imagers, hyperspectral imagers and imaging spectrometers using an overall wide wavelength range.

Spectrometric measuring device

The present disclosure includes a spectrometric measuring device for a measurement point of the process automation system, including a broadband light source for radiating light through an entrance aperture onto a sample to be measured, wherein the beam bundles of the light form an irradiation plane, a light limiter that limits the light at an angle to the irradiation plane, whereby a different amount of light results at this angle. The device further includes a dispersive element for separating the light according to its wavelength and a detector for receiving light separated according to its wavelength, wherein the light source beams the light through the sample to the entrance aperture, the light limiter and the dispersive element, and the light strikes the detector.

Method and apparatus for measuring inflorescence, seed and/or seed yield phenotype

The invention relates to a method and apparatus for measuring inflorescence, seed and/or seed yield pheno-type of a plant. More particularly, the invention relates to a method and apparatus for high throughput analysis of inflorescence, seed and/or seed yield phenotype of a panicle-like bearing plant.

Systems, methods, and computer programs for imaging an object and generating a measure of authenticity of the object

An imaging system (200) for imaging and generating a measure of authenticity of an object (10) comprises a dispersive imaging arrangement (30) and an image sensor arrangement (60). They are positioned so that, when electromagnetic radiation (20) from the object (10) illuminates the dispersive imaging arrangement (30), the radiation splits out in different directions into at least a non-dispersed part (40) and a dispersed part (50), and those are imaged by the image sensor arrangement (60). The imaging system (200) is configured to then generate a measure of authenticity of the object (10) depending at least on a relation between the imaged dispersed part, the imaged non-dispersed part, and reference spectral information. The invention also relates to imaging methods, computer programs, computer program products, and storage mediums.