A hyperspectral sensing device may include an optical collector configured to collect light and to transfer the collected light to a sensor having spectral resolution sufficient for sensing hyperspectral data. In some examples, the sensor comprises a compact spectrometer. The device further comprises a power supply, an electronics module, and an input/output hub enabling the device to transmit acquired data (e.g., to a remote server). In some examples, a plurality of hyperspectral sensing devices are deployed as a network to acquire data over a relatively large area. Methods are disclosed for performing dark-current calibration and/or radiometric calibration on data obtained by the hyperspectral sensing device, and/or another suitable device. Data obtained by the device may be represented in a functional basis space, enabling computations that utilize all of the hyperspectral data without loss of information.

A hyperspectral sensing device may include an optical collector configured to collect light and to transfer the collected light to a sensor having spectral resolution sufficient for sensing hyperspectral data. In some examples, the sensor comprises a compact spectrometer. The device further comprises a power supply, an electronics module, and an input/output hub enabling the device to transmit acquired data (e.g., to a remote server). In some examples, a plurality of hyperspectral sensing devices are deployed as a network to acquire data over a relatively large area. Methods are disclosed for performing dark-current calibration and/or radiometric calibration on data obtained by the hyperspectral sensing device, and/or another suitable device. Data obtained by the device may be represented in a functional basis space, enabling computations that utilize all of the hyperspectral data without loss of information.

The present disclosure relates to a method and related system for spectrum optimization of an illumination light source. Spectrum optimization according to the present disclosure can be based on various optimization parameters, including but not limited to luminous efficacy, color rendering effect, luminous efficacy of radiation, mesopic efficacy of radiation, cirtopic efficacy of radiation, etc. The present method and system are capable of optimizing illumination performance of a light source in various aspects in an individual or integrated manner. Further, the present method and system are capable of accommodating different illumination purposes and conditions by combining and prioritizing different optimization parameters.

The present disclosure relates to a method and related system for spectrum optimization of an illumination light source. Spectrum optimization according to the present disclosure can be based on various optimization parameters, including but not limited to luminous efficacy, color rendering effect, luminous efficacy of radiation, mesopic efficacy of radiation, cirtopic efficacy of radiation, etc. The present method and system are capable of optimizing illumination performance of a light source in various aspects in an individual or integrated manner. Further, the present method and system are capable of accommodating different illumination purposes and conditions by combining and prioritizing different optimization parameters.

The present disclosure relates to an image processing apparatus for enabling speed-up of spectroscopic correction processing on a multispectral image and a reduction in the amount of stored data to be achieved, an image processing method, a program, and an electronic apparatus.

An image processing apparatus includes an image reduction part configured to reduce a multispectral image in which an object is shot by a light dispersed in many wavelength bands, and to generate reduced images for each of the wavelength bands, and a spectroscopic correction processing part configured to perform spectroscopic correction processing of correcting a spectroscopic distribution of the reduced images for each of the wavelength bands generated by the image reduction part. Then, the processing is performed on the multispectral image shot by an imaging device including a metallic thin film filter which is provided closer to a light incident side than a photoelectric conversion device in at least some pixels and which is different in film thickness of a conductive thin film per pixel. The present technology can be applied to a shooting apparatus mounting an image sensor including a metallic thin film filter such as a plasmon filter in a hole array structure or a dot array structure, for example.

The present disclosure relates to an image processing apparatus for enabling speed-up of spectroscopic correction processing on a multispectral image and a reduction in the amount of stored data to be achieved, an image processing method, a program, and an electronic apparatus.

An image processing apparatus includes an image reduction part configured to reduce a multispectral image in which an object is shot by a light dispersed in many wavelength bands, and to generate reduced images for each of the wavelength bands, and a spectroscopic correction processing part configured to perform spectroscopic correction processing of correcting a spectroscopic distribution of the reduced images for each of the wavelength bands generated by the image reduction part. Then, the processing is performed on the multispectral image shot by an imaging device including a metallic thin film filter which is provided closer to a light incident side than a photoelectric conversion device in at least some pixels and which is different in film thickness of a conductive thin film per pixel. The present technology can be applied to a shooting apparatus mounting an image sensor including a metallic thin film filter such as a plasmon filter in a hole array structure or a dot array structure, for example.

A user device including a camera, a spectrometer module, and a processing unit is disclosed. In one aspect, the camera is adapted to acquire at least one image of a scenery which falls within a field of view of the camera. The spectrometer module is adapted to acquire spectral information from a region within the scenery which region falls within a field of view of the spectrometer module. The processing unit is adapted to determine, based on information relating the field of view of the spectrometer module to the field of view of the camera, a spectrometer module target area, within the at least one image, corresponding to the region. The processing unit is adapted to output display data to a screen of the user device for providing an indication of the target area on the display.

A user device including a camera, a spectrometer module, and a processing unit is disclosed. In one aspect, the camera is adapted to acquire at least one image of a scenery which falls within a field of view of the camera. The spectrometer module is adapted to acquire spectral information from a region within the scenery which region falls within a field of view of the spectrometer module. The processing unit is adapted to determine, based on information relating the field of view of the spectrometer module to the field of view of the camera, a spectrometer module target area, within the at least one image, corresponding to the region. The processing unit is adapted to output display data to a screen of the user device for providing an indication of the target area on the display.

A process of analyzing a sample by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) includes providing a sample having a sample surface within a vacuum chamber, performing a Raman spectroscopic analysis on a plurality of selected areas of the sample surface within the vacuum chamber to map an area of the sample surface comprising the selected areas, the Raman spectroscopic analysis including identifying one or more face in one or more of the selected areas of the sample surface, and performing an X-ray photoelectron spectroscopy (XPS) analysis of one or more selected areas of the sample surface containing at least one chemical and/or structural feature identified by the Raman spectroscopic analysis, wherein the duration of the XPS analysis of a given selected area of the sample surface is longer than the duration of the Raman spectroscopic analysis of that given selected area.

A process of analyzing a sample by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) includes providing a sample having a sample surface within a vacuum chamber, performing a Raman spectroscopic analysis on a plurality of selected areas of the sample surface within the vacuum chamber to map an area of the sample surface comprising the selected areas, the Raman spectroscopic analysis including identifying one or more face in one or more of the selected areas of the sample surface, and performing an X-ray photoelectron spectroscopy (XPS) analysis of one or more selected areas of the sample surface containing at least one chemical and/or structural feature identified by the Raman spectroscopic analysis, wherein the duration of the XPS analysis of a given selected area of the sample surface is longer than the duration of the Raman spectroscopic analysis of that given selected area.